• Journal of Mechanical Science and Technology
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• v.15 no.2
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• pp.160-171
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• 2001

Depending upon the method of the surface generation and the quality of the designed boundary curves, the resulting surfaces may have global or local irregularities in many cases. Thus, it would be necessary for the designer to evaluate the surface quality and to modify the surface. This is very important because the defect of the surface causes the rework of the dies, increasing cost and delivery time significantly. To simulate the reflection line test in the actual production line, a faster algorithm for generating reflection lines is presented. In this paper, among various surface interrogation methods using reflection lines, Blinn-Newell type of reflection mapping is applied to generate the reflection lines on the trimmed NURBS surfaces. The derivation of reflection lines is formulated as a surface-plane intersection problem (Jung 1994) and is solved by surface-contouring techniques. Also, for eliminating the discontinuity of reflection lines due to the configuration of reflection map, a modified reflection map is proposed. An efficient traced contouring technique is utilized for the computational efficiency and proves to be well suited for the real-time quality-assessment task.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.24 no.1 s.173
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• pp.173-181
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• 2000

Depending upon the method of the surface generation and the quality of the boundary curves provided, the resulting surfaces may have global or local irregularities in many cases. Thus it would be necessary for the designer to evaluate the surface quality and to modify the surface. This capability is very important because the defect of the surface requires the rework of the dies that causes a big loss in cost and delivery time. To simulate the reflection line test in the actual production line, a faster generation algorithm is presented. Among., various surface interrogation methods using reflection lines, Blinn-Newell type of reflection mapping is applied to generate reflection lines on the trimmed NURBS surface. The generation of reflection lines is formulated as a surface-plane intersection problem, and solved by surface-contouring techniques. In addition, a modified reflection map is proposed to eliminate the discontinuity of reflection lines due to the configuration of the reflection map. A fast reflection line algorithm is developed utilizing an efficient traced contouring technique, and proved to be well suited for real-time quality-assessment task.

• Korean Journal of Computational Design and Engineering
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• v.2 no.3
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• pp.133-141
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• 1997

In the process of car body design, various surfaces are generated from the given boundary curves. Depending upon the method of the surface generation and the quality of the boundary curves provided, the resulting surfaces may have global or local irregularities in many cases. Thus it would be necessary for the designer to evaluate the surface quality and to modify the surface or to use the different generation method based on the evaluation results. This capability is very important because the defect of the surface quality detected in the production stage will require the rework of the dies and will cause a big loss in cost and time. A method of surface interrogation using reflection line is introduced. In this paper, We applied reflection mapping to generate reflection lines on the trimmed NURBS surface. Since reflection lines are obtained from reflection mapping that uses simple and physically acceptable mapping algorithm, they can be efficiently used to simulate the reflection test on the real part in the production line.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.2 no.2
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• pp.63-68
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• 2009

We study on the transient response in non-uniform microstrip lines with optically controlled microwave pulses. The transient response of the microwave pulses in plasma layer has been evaluated by reflection function of dielectric microstrip lines. The variation of characteristic response in plasma layer with localized pulses has been evaluated analytically. Reflection the change of the reflection amplitude has been observed.

• Proceedings of the IEEK Conference
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• 2000.06a
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• pp.271-274
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• 2000

In this paper, the distortion of an electrical pulse with rise/fall time resulting from dispersion and reflection as it propagates along a tapered microstrip line is investigated, and the delay time and distortion rate with respect to input and load impedances are analyzed on triangular and exponential tapered lines and analyzed the influence of the reflection and frequency dispersion on the distorted voltage wave in the tapered lines. The observed overshoot in front of the distorted wave is caused due to the frequency dispersion and the sustained tail of that comes from the reflection in the tapered line.

• Transactions on Electrical and Electronic Materials
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• v.10 no.2
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• pp.53-57
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• 2009

In this paper we develop a method to observe faults in semiconductor devices and transmission lines by calculating the variation of the reflection function in a dielectric microstrip line that has an open-ended termination containing an optically induced plasma region. It is analyzed with the assumption that the plasma is distributed homogeneously in laser illumination. With the non linear material of degradation, the concentration of the carrier in the part of the material has changed. Since the input wave has produced the phenomenon of reflection, the input signal to the open-ended microstrip lines can be observed on reflection to identify the location of the fault. The characteristic impedances resulting from the presence of plasma are evaluated by the transmission line model. The variation of the reflection wave in the microwave system has been calculated by using an equivalent circuit model. The transient response has been also evaluated theoretically for changing the phase of the variation in the reflection. The variation of characteristic response in differentially localized has been also evaluated analytically.

• Transactions on Electrical and Electronic Materials
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• v.10 no.4
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• pp.111-115
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• 2009

We present a study on the reflection of optically controlled microwave pulses from non uniform plasma layers in semiconductors. The transient response of the microwave pulses in different plasma layers has been evaluated by means of the reflection function of dielectric microstrip lines. The lines were used with an open-ended termination containing an optically induced plasma region, which was illuminated by a light source. The reflection characteristics impedance resulting from the presence of plasma is evaluated by means of the equivalent transmission line model. We have analyzed the variation of the transient response in a 0.01 cm layer with a surface frequency in the region of 128 GHz. In the reflection the variation of the diffusion length $L_D$ is large compared with the absorption depth $1/{\alpha}_l$. The variation of the characteristic response of the plasma layer with differentially localized pulses has been evaluated analytically. The change of the reflection amplitude has been observed at depths of 0.1 cm, 0.01 cm and $0.1{\times}10^{-5}$ cm respectively.

• Journal of the Institute of Electronics Engineers of Korea TC
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• v.37 no.8
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• pp.45-51
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• 2000

The distortion of an electrical pulse, which has a rise/fall time due to the dispersion and the reflection, on tapered microstrip lines has investigated In time domain. The voltage and current transfer functions are shown for the tapered line. The dispersion distortion obtained by using these trans(or functions are represented for the nonideal square pulse along the triangular, Tchebycheff and exponential tapered lines, and analyzed the influence of the reflection and the frequency dispersion on the distorted voltage wave in the tapered lines. The observed overshoot in front of the distorted wane is caused due to the frequency dispersion and the sustained tail of that comes from the reflection in the tapered line.

• The Journal of Engineering Geology
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• v.24 no.2
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• pp.171-178
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• 2014

In seismic reflection data processing, the crossdip correction effectively focuses the stacking energy near the sharp bends of a crooked survey line. Additionally, approximate 3-D information on the reflector (e.g., true crossdip angle and lateral continuity) are locally investigated as a by-product of the crossdip correction procedure. Improvement of the signal-to-noise ratio and estimation of reflector crossdip attitude are tested, in terms of both common midpoint bin direction and processing-line type, using synthetic seismic reflection data. To effectively image the reflection energy near bends in seismic survey lines, straight-line binning is preferred to slalom-line binning.

• KIEE International Transactions on Electrophysics and Applications
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• v.4C no.5
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• pp.236-240
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• 2004

In this paper we examine the reflection characteristics of dielectric microstrip lines with open-ended termination containing an optically induced plasma region, which are analyzed by the assumption that the plasma is distributed homogeneously in laser illumination. The characteristics impedances resulting from the presence of plasma are evaluated by the transmission line model. To estimate theoretically the characteristic response of identical systems in the time domain, the Fourier transformation method is evaluated. The reflection characteristics of time and frequency response in microwave systems have been calculated using an equivalent circuit model.