• Title/Summary/Keyword: Profile measurement

Search Result 904, Processing Time 0.027 seconds

Development of a New Probe to Realize Nano/Micro Mechanical Machining and In-Process Profile Measurement (나노인프로세스 형상계측 및 미세가공용 프로브의 개발)

  • Kweon, Hyun-Kyu;Choi, Seong-Dae
    • Journal of the Korean Society of Manufacturing Process Engineers
    • /
    • v.2 no.1
    • /
    • pp.75-84
    • /
    • 2003
  • In this paper, a new nano/micro-mechanical processing test machine was developed. This new test machine, which is based on the principle of the scanning force controlled probe microscope, can realize nano/micro-mechanical machining and in-process profile measurement. Experimental results of nano/micro indentation and scratching show that the controllable cutting depth of the test machine can be controlled by PZT actuator. Profile measurement of the machined surface has also been performed by using the test machine and a conventional AFM(Atomic Force Microscopy). A good agreement of the two measurement results have been achieved.

  • PDF

In-process Measurement of Surface Profile using CCD (CCD를 이용한 인프로세스 표면형상의 계측)

  • 이기용;강명창;김정석;조인순
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 1995.10a
    • /
    • pp.255-258
    • /
    • 1995
  • Surface profile is an important paramerer to evaluate accuracy of machined worpiece. It is necessary to acquire this data by in-process measurement. Recent researchers have introduced Machine Vision technique to achieve it. But it is difficult to apply it to industry field yet. In this study, in-process measuring system of surface profile is developed using CCD camera. The effect of illuminance according to incident angle is investigated and surface profile from surface tester and illuminance graph are compared experimentally.

  • PDF

Development of SFM System for Nano In-Process Profile Measurement (나노인프로세스 표면형상계측을 위한 SFM시스템의 개발)

  • Kweon, Hyun-Kyu;Choi, Seong-Dae;Hong, Sung-Wook
    • Journal of the Korean Society of Manufacturing Process Engineers
    • /
    • v.3 no.2
    • /
    • pp.53-59
    • /
    • 2004
  • In this paper, we propose a new multi-purpose Scanning Force Microscope (SFM) system. The system can be used for nano/micro-scratching, in-process profile measurement, and observation of potential surface defects which occur during the scratching in air or liquid. Experimental results of nano/micro-scratching show that the smallest scratching depth can be controlled to be 10nm, which corresponds to the stability of the SFM system. Profile measurements of nano/micro-scratching surfaces have also been performed by the method of on-machine measurement and in-process measurement. Two measurement results were in good agreement with each other. The maximum difference was approximately 10 nm, which was mainly caused by the sampling repeatability error that influences the measurement accuracy Also, micro-defects on the micro-scratching surface were successfully detected by the SFM system. It was confirmed that the number of micro-defects increases when the surface is subjected to a cyclic bending load. The maximum depth was less than 100nm.

  • PDF

Precision Profile Measurement of Mirror Surfaces by Phase Shifting Interferometry (광위상간섭에 의한 경면의 정밀 형상측정)

  • 김승우;공인복;민선규
    • Transactions of the Korean Society of Mechanical Engineers
    • /
    • v.16 no.8
    • /
    • pp.1530-1535
    • /
    • 1992
  • An optical method of phase shifting interferometry is presented for the 3-dimensional profile measurement of mirror surfaces with nanometer resolution. A series of optical interferometric fringes are generated by comparing the surface to be measured with a reference flat. The fringes are captured by a CCD camera and then analyzed to obtain actual surface profile. Detailed principles are described along with necessary image processing algorithms. finally, several measurement examples are discussed which were performed on lapped surfaces, hard discs, and semiconductor wafers.

Development of Precise Measuring System for Hot Strip Mill's Rolls (열간압연용 롤 정밀 측정시스템 개발)

  • 이성진;이영진
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
    • /
    • 2002.04a
    • /
    • pp.614-618
    • /
    • 2002
  • In hot strip mills, Portable Roll Scanner (the portable roll surface temperature and profile measuring device) can be used to calibrate on-line Process models for strip crown and flatness by measuring the thermal expansion and wear profile of the rolls. And the surface temperature measurement can be used to optimize the roll cooling system. Portable Roll Scanner consists of the measuring device, which has two contact inductive distance transducers for roll profile measurement and one infrared Pyrometer for surface temperature measurement, and computer-based controller that is equipped with the measuring device. By the wireless data communication, the data is transferred to the memory of notebook for further analysis. After roll extraction from mills, Portable Roll Scanner measure the roll profile and surface temperature simultaneously along the work roll face and display the results in the TFT color monitor of notebook. Portable Roll Scanner is useful at mill-side and roll grinding shop.

  • PDF

Dispersive white-light interferometry using polarization of light for thin-film thickness profile measurement (편광분리 분산 분산형 백색광 간섭계를 이용한 박막두께형상측정법)

  • Ghim Y.S.;Kim S.W.
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 2005.06a
    • /
    • pp.565-568
    • /
    • 2005
  • We describe a new scheme of dispersive white-light interferometer that is capable of measuring the thickness profile of thin-film layers, for which not only the top surface height profile but also the film thickness of the target surface should be measured at the same time. The interferometer is found useful particularly for in-situ inspection of micro-engineered surfaces such as liquid crystal displays, which requires for high-speed implementation of 3-D surface metrology.

  • PDF

Development of Straightness, Roundness Measurement System for Standard Electrode of Loss Angle (손실각 표준기 전극의 진직, 진원도 측정시스템 개발)

  • 장종훈
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
    • /
    • 1998.10a
    • /
    • pp.198-203
    • /
    • 1998
  • To acquire the high precision of profile for standard electrode of loss angle, it is needed ultraprecision machining technology like MEAP(Magnetic Electronic Abrasive Polishing) and the very high profile measurement technology which can measure a micro unit about the workpiece. So, in this paper, it was developed the measurement system of precision of profile using non-contactable sensor that was approximate sensor of capacitance type, because that is better than others in the electrical characteristics. And standard electrode of loss angle was machined by the MEAP machining technology. In this study, it was development of precision measurement system. This system could be used measure the workpiece of roundness and straightness much more precise and faster than general mechanical measurement system done before. And it could be helped to minimize machining time and planning by very fast and precise measurement about the workpiece.

  • PDF

Rail Profile Matching Method using ICP Algorithm (ICP 알고리즘을 이용한 레일 프로파일 매칭 기법)

  • Yu, Young-Ki;Koo, Ja-Myung;Oh, Min-Soo;Yang, Il-Dong
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.65 no.5
    • /
    • pp.888-894
    • /
    • 2016
  • In this paper, we describe a method for precisely measuring the abrasion of the railway using an image processing technique. To calculate the wear of the rails, we provided a method for accurately matching the standard rail profile data and the profile data acquired by the rail inspection vehicle. After the lens distortion correction and the perspective transformation of the measured profile data, we used ICP Algorithm for accurate profile data matching with the reference profile extracted from the standard rail drawing. We constructed the prototype of the Rail Profile Measurement System for High-speed Railway and the experimental result on the three type of the standard rail used in Korea showed the excellent profile matching accuracy within 0.1mm.

A Study on the Measurement of Roundness Profile for Rotating Object Using Two Points in Succession Measuring Method (축차 2점법을 이용한 회전체의 진원도 프로파일 측정에 관한 연구)

  • Lee, Min-Ki;Lee, Eung-Suk
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.34 no.8
    • /
    • pp.1029-1034
    • /
    • 2010
  • In this paper, we present the roundness profile and run-out error measurement for a rotating shaft. The devices for measuring the roundness require a precision rotation table which is used as a reference to obtain the circular profile. Therefore, the roundness measuring system is expensive and requires precision manufacturing. The two-point method for succession measurement has been used to obtain a linear profile or used in straightness measurement using two displacement measuring devices. In this paper, the method is used for measuring the circular profile of a rotating shaft. A method to remove the vibration of the shaft, i.e., the run-out, is used, and the original circular profile is obtained from the measured raw data that excludes the run-out error of the rotating shaft. This method will be useful for obtaining the precise circular profile without using a precision reference circular artifact.

DISTORTION OF FLOW MEASUREMENT BY VARIOUS INLET VELOCITY PROFILE OF ORIFICE FLOWMETER (오리피스 유량계의 입구 속도 분포에 따른 유량 계측 왜곡 특성)

  • Shin, B.S.;Kim, N.S.;Lee, S.K.;Bae, Yong-Beom;Keum, O.H.
    • 한국전산유체공학회:학술대회논문집
    • /
    • 2011.05a
    • /
    • pp.596-600
    • /
    • 2011
  • In this numerical analysis, the distortion of flow measurement by inlet velocity profile of orifice flowmeter was investigated. To validate the numerical method, the convergence was monitored and the grid dependency was also checked. realizable k-e model was selected and y+ was about 50 in this calculation. the results shows that the pressure at the pressure tab near pipe wall was changed by inclined inlet velocity profile and it leads to distorted a measurement values of flow through the orifice plate from -3.8% to 9%. Therefore, the fully developed inlet flow was required for accurate flow measurement by orifice flowmeter. If not, the orifice plate installed at wrong location should be re-installed or additional actions should be taken.

  • PDF