A Study on Precision Improvement of Contact Ability according to Deformation of Probe Card Holder during Wafer Test (Wafer Test 시 Probe Card Holder 의 변형에 의한 Contact 정밀도 향상 방안 연구)
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- Proceedings of the Korean Society of Precision Engineering Conference
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- 2013.05a
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- pp.1265-1266
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- 2013