• 제목/요약/키워드: Primitive Cell Volume Calculation

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Phase Identification of Nano-Phase Materials using Convergent Beam Electron Diffraction (CBED) Technique

  • Kim, Gyeung-Ho;Ahn, Jae-Pyoung
    • Applied Microscopy
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    • 제36권spc1호
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    • pp.47-56
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    • 2006
  • Improvements are made to existing primitive cell volume measurement method to provide a real-time analysis capability for the phase analysis of nanocrystalline materials. Simplification is introduced in the primitive cell volume calculation leading to fast and reliable method for nano-phase identification and is applied to the phase analysis of Mo-Si-N nanocoating layer. In addition, comparison is made between real-time and film measurements for their accuracy of calculated primitive cell volume values and factors governing the accuracy of the method are determined. About 5% accuracy in primitive cell determination is obtained from camera length calibration and this technique is used to investigate the cell volume variation in WC-TiC core-shell microstructure. In addition to chemical compositional variation in core-shell type structure, primitive cell volume variation reveals additional information on lattice coherency strain across the interface.

수렴성 빔 전자회절 도형을 이용한 Al-Ti 합금의 상 분석 (Phase Identification of Al-Ti Alloys Using Convergent Beam Electron Diffraction Pattern)

  • 김혜성
    • 한국산업융합학회 논문집
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    • 제4권2호
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    • pp.149-155
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    • 2001
  • The use of primitive cell volume and zero order Laue (ZOLZ) pattern is proposed to identify phase in a complex microstructure. Single convergent beam electron pattern containing higher order Laue zone ring from a nanosized region is sufficient to calculate the primitive cell volume of the phase, while ZOLZ pattern is used to determine the zone axis of the crystal. A computer program is used to screen out possible phases from the value of measured cell volume from convergent beam electron diffraction (CBED) pattern. Indexing of ZOLZ pattern follows in the program to find the zone axis of the identification from a single CBED pattern. An example of the analysis is given from the rapidly solidified $Al-Al_3Ti$ system.

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금속기 복합재료의 틱소포밍 특성 ($SiC_p/AZ91HP$ Mg 복합재료의 상분석을 중심으로) (Thixoforming Characteristics of Metal Matrix Composites (Phase identification of $SiC_p/AZ91HP$ Mg composite))

  • 이정일;김영직
    • Applied Microscopy
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    • 제29권3호
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    • pp.281-289
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    • 1999
  • 교반관법으로 제조한 $AZ91HP/SiC_p$ Mg 복합재료를 틱소포팅하여 미세조직과 존재상들을 조사하였다. $AZ91HP/SiC_p$ Mg 복합재료를 반응고 가공시 액상율 50% 이상에서 완전 충전이 이루어겼으며 전형적인 반응고 조직을 보였다. 복합재료내의 강화상이 초정 $\alpha$상의 합체, 조대화를 억제하여 보다 용이하게 thixotropic 조직을 가질 수 있었다. TEM 관찰결과, 복합재료내의 계면반응 생성물은 MgO, $Mg_2Si$$Al_{12}Mg_{17}$등이며, 직접 가압시 정출상으로 나타나는 비평형상인 decagonal T상이 관찰되었으며, 이 상은 간접가압시 안정상인 $Al_6Mn$의 형태로 관찰되었다. 이는 간접가압시 승온시간이 직접가압보다 상대적으로 길어, 비평형의 decagonal T상이 안정한 $Al_6Mn$상으로 생성된 것으로 판단된다. 아직까지 생성과정이 명확하진 않으나 교반관법으로 제조 후, 2차가압 성형시 비평형상의 존재는 재료의 강화에 기여할 것으로 판단된다.

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수렴성 빔 전자회절법을 이용한 $SiC_p/Al$ 복합재에서의 계면 생성물의 상분석 (Phase Identification of the Interfacial Reaction Product of $SiC_p/Al$ Composite Using Convergent Beam Electron Diffraction Technique)

  • 이정일;이재철;석현광;이호인
    • Applied Microscopy
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    • 제26권1호
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    • pp.95-104
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    • 1996
  • A comprehensive methodology to characterize the interfacial reaction products of $SiC_p/2024$ Al composites is introduced on the basis of the experimental results obtained using XRD, SEM and TEM. XRD performed on the electrochemically extracted $SiC_p$ and bulk $SiC_p/2024$ Al composite have shown that the interfacial reaction products consist of $Al_{4}C_3$ having hexagonal crystallographic structure, pure eutectic Si having diamond cubic crystallographic structure, and $CuAl_2$, having tetragonal crystalloraphic structure, respectively. According to the images observed by SEM, $Al_{4}C_3$, which has been reported to have needle shape, has a hexagonal platelet-shape and eutectic Si is found to have a dendritic shape. In addition eutectic $CuAl_2$, was observed to form near interface and/or along the grain boundaries. In order to confirm the results obtained by XRD, the primitive cell volume and reciprocal lattice height of such interfacial reaction products were calculated using the data obtained from convergent beam electron diffraction (CBED) patterns, and then compared with theoretical values.

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