• Title/Summary/Keyword: Precision nano measurement

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High-Precision Surface Servo Methodology (고정밀 서피스 서보 방법론)

  • Jung, Kwangsuk;Park, Junkyu;Shim, Kibon
    • Journal of Institute of Convergence Technology
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    • v.3 no.1
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    • pp.1-8
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    • 2013
  • High-precision surface actuator, in which in-plane motion is realized by not two-dimensional actuator superposing linear actuators but integrated planar actuator, has been developed to cope with the severe target performance like precise motion with large envelope. It is very difficult to accomplish the performance with the traditional actuating principle. So, various methods have been tried to break through the problem. This paper discusses some meaningful trials performed in the Nano Measurement and Precision Motion Control Lab. of Korea National University of Transportation.

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Certification of magnification standards for the establishment of meter-traceability in microscopy (현미경의 길이표준 소급성 확립을 위한 배율 교정 시편 인증)

  • Kim J.A.;Kim J.W.;Park B.C.;Eom T.B.;Kang C.S.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.645-648
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    • 2005
  • Microscopy has enabled the development of many advanced technologies, and higher level microscopic techniques are required according to the increase of research in nano-technology and bio-technology fields. Therefore, in many applications, we need to measure the dimension of micro-scale parts accurately, not just to observe their shapes. To establish the meter-traceability in microscopy, gratings have been widely used as a magnification standard. KRISS provides the certification service of magnification standards using an optical diffractometer and a metrological AFM (MAFM). They are based on different measurement principles, and so can give complementary information for each other. In this paper, we describe the configuration of each system and measurement procedures to certificate grating pitch values of magnification standards. Several measurement results are presented, and the discussion about them are also given. Using the optical diffractometer, we can calibrate a grating specimen with uncertainty of less than 50 pm. The MAFM can measure a grating specimen of down to 100 nm pitch value, and the calibrated values usually have uncertainty less than 500 pm.

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Development of microscopic surface profile estimation algorithm through reflected laser beam analysis (레이저 반사광 분석을 통한 미세 표면 프로파일 추정 알고리즘의 개발)

  • Seo Young-Ho;Ahn Jung-Hwan;Kim Hwa-Young;Kim Sun-Ho
    • Journal of the Korean Society for Precision Engineering
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    • v.22 no.11 s.176
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    • pp.64-71
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    • 2005
  • In order to measure surface roughness profile, stylus type equipments are commonly used, but the stylus keeps contact with surface and damages specimens by its tip pressure. Therefore, optics based measurement systems are developed, and light phase interferometer, which is based on light interference phenomenon, is the most noticeable research. However, light interference based measurements require translation mechanisms of nano-meter order in order to generate phase differences or multiple focusing, thus the systems cannot satisfy the industrial need of on-the-machine and in-process measurement to achieve factory automation and productive enhancement. In this research, we focused light reflectance phenomenon rather than the light interference, because reflectance based method do not need translation mechanisms. However, the method cannot direct]y measure surface roughness profile, because reflected light consists of several components and thus it cannot supply surface height information with its original form. In order to overcome the demerit, we newly proposed an image processing based algorithm, which can separate reflected light components and conduct parameterization and reconstruction process with respect to surface height information, and then confirmed the reliability of proposed algorithm by experiment.

나노위치제어용 선형 모터의 거동 분석

  • Seol Jin-Su;Lee U-Yeong;Im Gyeong-Hwa
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
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    • 2005.05a
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    • pp.125-128
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    • 2005
  • The equipments in semi-conductor, display and measurement fields require high precision and resolution positioning technology. High positioning control can be carried out by using linear motors with little vibration, backlash and friction. In this paper, the acceleration patterns of the moving Part are analyzed to obtain the optimum pattern which leads to the less vibration reduction of equipment. In addition, the effect of friction force in guide rail on position control accuracy is investigated to identify possibility of using current bearing system for nano-positioning control.

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The measurement of nano properties using nanoindentation (나노인덴테이션을 이용한 나노물성 측정)

  • Kwon Dong-Il;Lee Kyung-Woo;Kim Sung-Hoon;Kim Ju-Young;Lee Yun-Hee
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.10a
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    • pp.63-68
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    • 2005
  • The nanoindentation technique is widely used to investigate the mechanical properties of nano-microscale materials. The nanoindentation method for assessing mechanical properties at low loads and shallow depths is already well established fur the characterization of thin films as well as bulk materials. In this study, we evaluated residual stress in DLC and Au thin films usign nanoindentation technique with a new stress-relaxation model. Moreover, We suggest a composite hardness equation and quantify the magnitude of hardness increase by using an equation based on the interface hardness and the interface thickness, derived by comparing results derived from this equation and those determined in nanoindentation tests. Finally, We present an indentation size effect (ISE) model that extends the available contact depth for ISE application down to several tens of nanometers by considering the tip bluntness effect.

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Basic Study of the Improvement of PSD Output by Inclined Light Input (PSD의 출력특성향상을 위한 경사 입력광의 특성해석에 대한 기본연구)

  • Kweon, Hyun-Kyu;Park, Chang-Yong
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.9 no.4
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    • pp.53-58
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    • 2010
  • In this paper, the output characteristics of PSD(Position Sensetive Detector) used in measurement system are described. Most of the precision measurment systems are accomplished by a laser diode(LD), a photo diode(PD) and PSD(Position Sensetive Detector), which are used in reflection of mirror or projection of infrared spectrometer. But it is especially restricted by resolution of PD and PSD in nano-measurement. A new inclined light methods into the PSD are employed in the surface measurement system for increasing the resolution. As the results, we can know that the output characteristics of detective senser (PSD) become more than 2 or 3 times by changing inclined angle(range: 5 degree) compared with common angle. In addition, the experiment results are confirmed that the change of inclined angle is not affecting to the linearity and repeating.

Laser Ablation of Polypropylene Films using Nanosecond, Picosecond, and Femtosecond Laser

  • Sohn, Ik-Bu;Noh, Young-Chul;Kim, Young-Seop;Ko, Do-Kyeong;Lee, Jong-Min;Choi, Young-Jin
    • Journal of the Optical Society of Korea
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    • v.12 no.1
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    • pp.38-41
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    • 2008
  • Precise micropatterning of polypropylene film, which is highly transparent in the wavelength range over 250 nm has been demonstrated by 355 nm nano/picosecond laser and 785 nm femtosecond laser. Increments of both the pulse energy and the shot number of pulses lead to cooccurrence of photochemical and thermal effects, demonstrated by the spatial expansion of rim on the surface of PP. The shapes of the laser-ablated polypropylene films were imaged by optical microscope and measured by a 3D optical measurement system. And, the ablation depth and width of polypropylene film ablated by femtosecond laser at various pulse energy and pulse number were characterized. Our results demonstrate that a femtosecond pulsed laser is an efficient tool for fabricating micropatterns of polypropylene films, where the micropatterns are specifically tailored in size, location and number easily controlled by laser processing conditions.

Ablation of Polypropylene for Breathable Packaging Films

  • Sohn, Ik-Bu;Noh, Young-Chul;Choi, Sung-Chul;Ko, Do-Kyeong;Lee, Jong-Min;Choi, Young-Jin
    • Laser Solutions
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    • v.9 no.3
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    • pp.15-21
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    • 2006
  • A Polypropylene (PP) film was ablated using a femtosecond laser with a center wavelength of 785 nm, a pulse width of 184 fs and a repetition rate of 1 kHz. Increments of both pulse energy and the shot number of pulses lead to co-occurrence of photochemical and thermal effect, demonstrated by the spatial expansion of rim on the surface of PP. The shapes of the laser-ablated PP films were imaged by a scanning electron microscope (SEM) and measured a 3D optical measurement system (NanoFocus). And, the oxygen transmission rate (ORT) of periodically laser-ablated PP film were characterized by oxygen permeability tester for modified atmosphere packaging (MAP) of fresh fruit and vegetable. Our results demonstrate that femtosecond pulsed laser is efficient tools for breathable packaging films in modifying the flow of air and gas into and out of a fresh produce container, where the micropatterns are specifically tailored in size, location and number which are easily controlled by laser pulse energy and pulse patterning system.

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What Is Nano-Force Metrology? (나노 힘이란 무엇인가?)

  • 김민석;최인묵;박연규;김종호;강대임
    • Journal of the Korean Society for Precision Engineering
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    • v.21 no.9
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    • pp.12-19
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    • 2004
  • 수십 MN(10/sup 6/ N) 이상의 하중을 다루는 건설산업 및 중공업으로부터 수십 kN- 수 MN의 힘을 사용하는 재료시험기, 프레스, 및 공장 자동화설비 그리고 수십 N-수 kN 용량의 상업용 저울까지 힘 측정은 산업의 근간이 되는 기술이며 우리 실생활에 폭 넓게 이용되고 있다. 제품을 생산하고 대형 구조물을 건설하는 공장이나 건축현장에서 힘을 정확히 측정한다는 것은 공정을 일정하게 유지 관리하고 있다는 표시이므로 제품의 품질관리나 건축물의 안전관리의 척도가 된다. (중략)

Precision-structural Design for Scanning Probe Microscopes (주사탐침현미경을 위한 정밀 구조 설계)

  • Lee, Moo-Yeon;Shim, Jae-Sool;Lee, Dong-Yeon
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.11 no.11
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    • pp.4095-4099
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    • 2010
  • Nano-measurement systems such as scanning probe microscopes should be protected against external disturbances. For the design of a scanning probe microscope, the external vibrations need to be characterized and the vibrational properties of the structural frame itself should be modeled. Also, the influences of the external vibration on the apparatus need to be known for its utmost precision. In this paper, the combined vibrational-characteristics of the floor and the structural frame are analyzed and experimentally investigated.