• Journal of the Institute of Electronics and Information Engineers
• /
• v.49 no.9
• /
• pp.251-258
• /
• 2012

Recently, NAND Flash memory structure is evolving from SDR (Single Data Rate) to high speed DDR(Double Data Rate) to fulfill the high performance requirement of SSD and SSS. Accordingly, the proper ways of transferring data that latches valid data stably and minimizing data skew between pins by using PHY(Physical layer) circuit techniques have became new issues. Also, rapid growth of speed in NAND flash increases the operating frequency and power consumption of NAND flash controller. Internal voltage variation margin of NAND flash controller will be narrowed through the smaller geometry and lower internal operating voltage below 1.5V. Therefore, the increase of power budge deviation limits the normal operation range of internal circuit. Affection of OCV(On Chip Variation) deteriorates the voltage variation problem and thus causes internal logic errors. In this case, it is too hard to debug, because it is not functional faults. In this paper, we propose new architecture that maintains the valid timing window in cost effective way under sudden power fluctuation cases. Simulation results show that the proposed technique minimizes the data skew by 379% with reduced area by 20% compared to using PHY circuits.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.10 no.1
• /
• pp.75-80
• /
• 2009

Bum-in test is one for eliminating semiconductor devices that are subject to early failures and other operational problems; it is usually carried out on the devices by imposing severe test conditions such as elevated voltages, temperatures, and time. In order for such a test to be performed, each burn-in board having devices to be tested, needs to be inserted into a corresponding slot. A set of such slots is called a zone. The slots comprising a zone can only have the burn-in boards with the devices of the same type. In order to test many different types of semiconductor devices, it is desirable to build a burn-in test system to have as many zones as possible. A zone controller controlling a zone, is a device that performs a burn-in test and collects test results. In case of existing systems, each zone controller takes care of a zone that consists of a fixed number of slots. Since a zone controller is, in most cases, embedded into a workstation that controls the overall testing process, adding new zone controllers is restricted by the spaces for them. As a way to solve or alleviate these problems, a dynamic zone system in which the number of slots in a zone can be dynamically allocated, is presented. This system maximizes the efficiency of system utilization, by altering the number of slots and hence minimizing the idle slots of a zone. In addition, all the test operations being performed must be aborted for maintenance in existing systems. In dynamic zone systems, however, a separate and independent maintenance is allowed for each slot, as long as the main power supply system has no problem.

• Journal of Advanced Marine Engineering and Technology
• /
• v.38 no.6
• /
• pp.716-722
• /
• 2014

In order to design the speed controller of the DC motor system, firstly, parameters estimation of the system must be preceded. In this paper, we proposed the application of genetic algorithm(GA) optimization in estimating the parameters of DC motor. Estimated models are considered both first and second order models, and each estimated model is optimized by minimizing three different types of the evaluation function of GA. Also, GA is imported in comparison with estimation result of numerical analysis method because of its power in searching entire solution space with more probability of finding the global optimum. Data for parameter estimation is acquired from input and output signals of the actual experiment device and the butterworth filter also designs for removing noise in the signals. Finally comparison between real data of the actual device and estimated models is presented to indicate effectiveness and resolution of proposed identification method.

• Journal of IKEEE
• /
• v.18 no.4
• /
• pp.552-558
• /
• 2014

This paper suggests how to design a ZigBee-chip-based communication module to remotely measure radiation level. The suggested communication module consists of two control processors for the chip as generally required to configure a ZigBee system, and one chip module to configure a ZigBee RF device. The ZigBee-chip-based communication module for remote radiation measurement consists of a wireless communication controller; sensor and high-voltage generator; charger and power supply circuit; wired communication part; and RF circuit and antenna. The wireless communication controller is to control wireless communication for ZigBee and to measure radiation level remotely. The sensor and high-voltage generator generates 500 V in two consecutive series to amplify and filter pulses of radiation detected by G-M Tube. The charger and power supply circuit part is to charge lithium-ion battery and supply power to one-chip processors. The wired communication part serves as a RS-485/422 interface to enable USB interface and wired remote communication for interfacing with PC and debugging. RF circuit and antenna applies an RLC passive component for chip antenna to configure BALUN and antenna impedance matching circuit, allowing wireless communication. After configuring the ZigBee-chip-based communication module, tests were conducted to measure radiation level remotely: data were successfully transmitted in 10-meter and 100-meter distances, measuring radiation level in a remote condition. The communication module allows an environment where radiation level can be remotely measured in an economically beneficial way as it not only consumes less electricity but also costs less. By securing linearity of a radiation measuring device and by minimizing the device itself, it is possible to set up an environment where radiation can be measured in a reliable manner, and radiation level is monitored real-time.