• Journal of the Optical Society of Korea
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• 제7권3호
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• pp.166-173
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• 2003

This paper presents micromachining results on planar-lightwave-circuit (PLC) chips with Si substrate and the quartz substrate by using Ti:Sapphire femtosecond-pulsed laser. The ablation process with femtosecond laser pulses generates nothing of contamination, molten zone, microcracks, shock wave, delamination and recast layer. We also showed that the micromachine for PLC using femtosecond pulsed lasers is superior to that using nanosecond pulsed lasers. The insertion loss and the optical return loss of the 1 ${\times}$ 8 optical power splitters packaged with micromachined input- and output-port U-grooves were less than 11.0 ㏈ and more than 55 ㏈, respectively. The wavelength dependent loss (WDL) was distributed within $\pm$0.6 ㏈ and the polarization dependent loss (PDL) was less than 0.2 ㏈.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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• pp.484-485
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• 2003

We report on the optimization of the fabrication process of hybrid sol-gel thin film deposition to produce low cost $1 {\times} 16$ splitters for optical communications. We learn that sol-gel film thickness is dependent upon the spinning speeds and viscosity of the sol-gel solutions and refractive index upon the dopant concentrations of Al and Zr in the sol solutions. We could find the optimized physical conditions to achieve the desired thickness of core and cladding layers. We will further carry out the fabrication and measurements of insertion loss, polarization dependent loss (PDL), etc. for the performance of fabricated splitter devices.

• 한국광학회지
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• 제23권6호
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• pp.274-280
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• 2012

기존의 반사형 타원계에 광분할기와 프리즘 등의 광학소자를 추가하여 $8.0{\mu}m$ 보다 작은 면적에서 시료의 광학이방성을 측정할 수 있는 수직반사형 타원계를 제작하였다. 수직반사 구조를 구현하기 위해 사용된 광학소자들의 편광작용을 보정하여 광학이방성 측정의 정확도를 향상시켰다. 비편광 광분할기를 사용하고 사분파장 위상지연자를 장착하며 광섬유를 제거하고 파장영역을 최적화하여 광학이방성인자 측정값의 표준편차를 0.00083 으로 줄이고 방위각 변화에 따른 rutile 시료의 광학이방성인자의 변동폭을 0.015 이하로 줄일 수 있었다.

• Journal of the Optical Society of Korea
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• 제13권2호
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• pp.245-250
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• 2009

We propose a digital holographic interference analysis method based on a 2-frame phase-shifting technique for measuring an optical mirror surface. The technique using 2-frame phase-shifting digital interferometry is more efficient than multi-frame phase-shifting techniques because the 2-frame method has the advantage of a reduced number of interferograms, and then takes less time to acquire the wanted topography information from interferograms. In this measurement system, 2-frame phase-shifting digital interferograms are acquired by moving the reference flat mirror surface, which is attached to a piezoelectric transducer, with phase step of 0 or $\pi$/2 in the reference beam path. The measurements are recorded on a CCD detector. The optical interferometry is designed on the basis of polarization characteristics of a polarizing beam splitter. Therefore the noise from outside turbulence can be decreased. The proposed 2-frame algorithm uses the relative phase difference of the neighbor pixels. The experiment has been carried out on an optical mirror which flatness is less than $\lambda$/4. The measurement of the optical mirror surface topography using 2-frame phase-shifting interferometry shows that the peak-to-peak value is calculated to be about $0.1779{\mu}m$, the root-mean-square value is about $0.034{\mu}m$. Thus, the proposed method is expected to be used in nondestructive testing of optical components.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.223-223
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• 2009

In this paper, designed and simulated Power Splitter (PS) integrated Mach-Zehnder interferometer (MZI) based planar type optical waveguide devices (which is called here a PS-MZI). The PS-MZI optical waveguide sensor was preceded by a Y-junction, which splits the input power between the sensor, and a reference branch, to minimize the effect of optical power variations. The PS-MZI optical waveguide sensor induced changing phases of the incident beam, which had fallen upon the waveguide through computer simulation, according to the small changes in the index of refraction, thus beam intensity was changed. The waveguide were optimized at a wavelength of 1550 nm and fabricated according to the design rule of 0.45 delta%, which is the difference of refractive index between the core and clad. The fabrication of PS-MZI optical waveguide sensor was performed by a conventional planar lightwave circuit (PLC) fabrication process. The PS-MZI optical waveguide that was fabricated to be applied as a biosensor revealed a low insertion loss and a low polarization-dependent loss. After having etched the over-clad at the sensor part in the MZI optical waveguide that was fabricated, Ti deposition was made on the adhesion layer, and then Au thin-film deposition was carried out thereon. In addition, its optical properties were measured by having changed the index of refraction oil at the sensing part of the MZI. To apply the planar type PS-MZI optical waveguide as a biosensor, a detection test for Staphylococcus aureus was conducted according to changes in concentration, having adopted Ti-alkoxide as ligand. The detection result of the S. aureus by the PS-MZI optical waveguide sensor was possible to the level of $10^1$ CFU/ml.

• 전자공학회논문지
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• 제50권8호
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• pp.253-263
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• 2013

광학측정기법 중 주파수 스캐닝 간섭계는 기존 3차원 측정기법과 비교하여 광학 하드웨어 구조가 측정과정동안 고정되어 있어, 대물렌즈나 대상물체의 수직 스캐닝 없이 단지 광원의 주파수만 특정한 주파수 밴드내에서 스캐닝 하여 대상물체에 주사되므로, 우수한 광학 측정 성능을 보인다. 광원의 주파수를 변경하여 간섭계를 통해 간섭 영상을 획득한 후, 밝기 영상 데이터를 주파수 영역 데이터로 변환하고, 고속 푸리에 변환을 통한 주파수 분석을 이용하여 대상 물체의 높이 정보를 계측한다. 하지만, 대상물체의 광학적 특성에 기인한 광학노이즈와 주파수 스캐닝동안 획득되는 영상의 수에 따라 증가하는 영상처리시간은 여전히 주파수 스캐닝 간섭계의 문제이다. 이를 위해, 1) 편광기반 주파수 스캐닝 간섭계가 광학 노이즈에 대한 강인성을 확보하기 위해 제안되어진다. 시스템은 주파수 변조 레이저, 참조 거울 앞단의 ${\lambda}/4$ 판, 대상 물체 앞단의 ${\lambda}/4$ 판, 편광 광분배기, 이미지 센서 앞단의 편광기, 광섬유 광원 앞단의 편광기, 편광 광분배기와 광원의 편광기 사이에 위치하는 ${\lambda}/2$ 판으로 구성된다. 제안된 시스템을 이용하여, 편광을 기반으로한 간섭이미지의 대조대비를 조절할 수 있다. 2) 신호처리 고속화 방법이 간섭계 시스템을 위해 제안되며, 이는 그래픽 처리 유닛(GPU)과 같은 병렬처리 하드웨어와 계산 통합 기기 구조(CUDA)와 같은 프로그래밍 언어로 구현된다. 제안된 방법을 통해 신호처리 시간은 실시간 처리가 가능한 작업시간을 얻을 수 있었다. 최종적으로 다양한 실험을 통해 제안된 시스템을 정확도와 신호처리 시간의 관점으로 평가하였고, 실험결과를 통해 제안한 시스템이 광학측정기법의 실적용을 위해 효율적임을 보였다.