• 제목/요약/키워드: Plasma uniformity

검색결과 214건 처리시간 0.031초

Characteristics of Line-type Internal Inductively Coupled Plasma Source for Flexible Display Processing

  • Lim, Jong-Hyeuk;Kim, Kyong-Nam;Gweon, Gwang-Ho;Hong, Seung-Pyo;Yeom, Geun-Young
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.1490-1493
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    • 2009
  • In this work we present a new type of line plasma source using an internal-type ICP operated at 2MHz with a ferrite module, describe the effect of ferrite module on the enhancement of the plasma properties and the uniformity, and compare to those obtained with 13.56MHz discharge. Also the electrical characteristics of the antenna line and the characteristics of the plasma uniformity were studied.

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Development of Large-area Plasma Sources for Solar Cell and Display Panel Device Manufacturing

  • 서상훈;이윤성;장홍영
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제41회 하계 정기 학술대회 초록집
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    • pp.148-148
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    • 2011
  • Recently, there have been many research activities to develop the large-area plasma source, which is able to generate the high-density plasma with relatively good uniformity, for the plasma processing in the thin-film solar cell and display panel industries. The large-area CCP sources have been applied to the PECVD process as well as the etching. Especially, the PECVD processes for the depositions of various films such as a-Si:H, ${\mu}c$-Si:H, Si3N4, and SiO2 take a significant portion of processes. In order to achieve higher deposition rate (DR), good uniformity in large-area reactor, and good film quality (low defect density, high film strength, etc.), the application of VHF (>40 MHz) CCP is indispensible. However, the electromagnetic wave effect in the VHF CCP becomes an issue to resolve for the achievement of good uniformity of plasma and film. Here, we propose a new electrode as part of a method to resolve the standing wave effect in the large-area VHF CCP. The electrode is split up a series of strip-type electrodes and the strip-type electrodes and the ground ones are arranged by turns. The standing wave effect in the longitudinal direction of the strip-type electrode is reduced by using the multi-feeding method of VHF power and the uniformity in the transverse direction of the electrodes is achieved by controlling the gas flow and the gap length between the powered electrodes and the substrate. Also, we provide the process results for the growths of the a-Si:H and the ${\mu}c$-Si:H films. The high DR (2.4 nm/s for a-Si:H film and 1.5 nm/s for the ${\mu}c$-Si:H film), the controllable crystallinity (~70%) for the ${\mu}c$-Si:H film, and the relatively good uniformity (1% for a-Si:H film and 7% for the ${\mu}c$-Si:H film) can be obtained at the high frequency of 40 MHz in the large-area discharge (280 mm${\times}$540 mm). Finally, we will discuss the issues in expanding the multi-electrode to the 8G class large-area plasma processing (2.2 m${\times}$2.4 m) and in improving the process efficiency.

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Wavelet Characterization of Profile Uniformity Using Neural Network

  • Park, Won-Sun;Lim, Myo-Teak;Kim, Byungwhan
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2002년도 ICCAS
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    • pp.46.5-46
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    • 2002
  • As device dimension shrinks down to sub 100nm, it is increasingly important to monitor plasma states. Plasma etching is a key means to fine patterning of thin films. Many parameters are involved in etching and each parameter has different impact on process performances, including etch rate and profile. The uniformity of etch responses should be maintained high to improve device yield and throughput. The uniformity can be measured on any etch response. The most difficulty arises when attempting to characterize etched profile. Conventionally, the profile has been estimated by measuring the slope or angle of etched pattern. One critical drawback in this measurement is that this is unable to cap...

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대면적 LCD용 ICP소스에 대한 수치 해석적 분석 (A Numerical Analysis on the Development of ICP Source for Large Area LCD)

  • 이주율;이영직
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 추계종합학술대회 논문집
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    • pp.573-576
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    • 1998
  • In this paper, we analyzed electric field density and plasma condition to ICP reactor geometry structure, to generate plasma, to maintain plasma uniformity of large area LCD panel in ICP reactor also, we simulated electric field density for all kind existence current (antena and plasma current) in ICP reactor to analyze plasma antena structure

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주기적인 축방향 자기장을 추가한 유도결합형 플라즈마 장치에서의 감광제 제거공정 개발 (Development of photoresist ashing process in an ICP with periodic axial magnetic field)

  • 송호영;라상호;박세근;오범환
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2000년도 하계종합학술대회 논문집(2)
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    • pp.290-293
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    • 2000
  • Low frequency(<100Hz) weak magnetic field(<20gauss) is applied axially to an inductively coupled oxygen plasma(ICP), and its plasma characteristics are monitored by OES(Optical Emission Spectroscopy) and Langmuir probe. It is found that periodic magnetic field enhances ashing rate by 25% and improves its uniformity upto 4.5% over 8" wafer. From electron energy distribution function, both low and high energy electrons are identified and relative abundancy is found to be controlled by the applied frequency. Moreover, it is observed that ionization and dissociation species are varied with applied frequency. We insert an aluminium baffle in the chamber to get better uniformity and less plasma damage.

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Numerical Simulation: Effects of Gas Flow and Rf Current Direction on Plasma Uniformity in an ICP Dry Etcher

  • Joo, Junghoon
    • Applied Science and Convergence Technology
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    • 제26권6호
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    • pp.189-194
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    • 2017
  • Effects of gas injection scheme and rf driving current configuration in a dual turn inductively coupled plasma (ICP) system were analyzed by 3D numerical simulation using CFD-ACE+. Injected gases from a tunable gas nozzle system (TGN) having 12 horizontal and 12 vertical nozzles showed different paths to the pumping surface. The maximum velocity from the nozzle reached Mach 2.2 with 2.2 Pa of Ar. More than half of the injected gases from the right side of the TGN were found to go to the pump without touching the wafer surface by massless particle tracing method. Gases from the vertical nozzle with 45 degree slanted angle soared up to the hottest region beneath the ceramic lid between the inner and the outer rf turn of the antenna. Under reversed driving current configuration, the highest rf power absorption region were separated into the two inner islands and the four peaked donut region.

플라즈마 표면 처리에 따른 AZO 박막의 특성 변화 (Characterization of AZO Thin Film by Plasma Surface Treatment)

  • 우종창;김관하
    • 한국전기전자재료학회논문지
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    • 제32권2호
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    • pp.147-150
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    • 2019
  • There is a need for the development of transparent conductive materials that are economical and environmentally friendly with exhibit low resistivity and high transmittance in the visible spectrum. In this study, the deposition rate and uniformity of Al-doped ZnO-thin films were improved by changing the Z-motion of the sputtering system. The deposition rate and the uniformity were determined to be 3.44 nm/min and 1.23%, respectively, under the 10 mm Z-motion condition. During $O_2$ plasma treatment, the intrusion-type metal elements in the thin film were reduced, which contributed to an oxygen vacancy reduction in addition to structural stabilization. Moreover, the sheet resistance was more easily saturated.

전기적 특성을 고려한 ICP Source 설계 (Design of an Inductively Coupled Plasma Source with Consideration of Electrical Properties and its Practical Issues)

  • 이상원
    • 한국진공학회지
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    • 제18권3호
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    • pp.176-185
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    • 2009
  • ICP source의 성능과 구현 가능성은 impedance와 전기장, 자기장의 공간 분포에 큰 영향을 받는다. ICP source의 impedance는 ICP 안테나와 플라즈마의 impedance에 의해 결정된다. 안테나 설계에 있어서 안테나에 형성되는 고전압을 방지하고 공정 중 급격한 impedance 변화를 방지하기 위해서는 ICP source의 허수 impedance가 $-100\;ohm{\sim}+100\;ohm$의 영역에 존재하는 것이 유리하다. 플라즈마 균일도는 안테나에 흐르는 전류와 전압에 의해 형성되는 전기장 세기와 자기장 세기에 영향을 받는다. 원형 안테나와 대칭성이 개선된 안테나에 대해 전자기 simulation과 플라즈마 밀도의 공간분포를 측정하였으며 안테나 형태에 따른 전자기장과 플라즈마 밀도 분포의 개선을 확인하였다. 반경 방향 균일도를 조절하기 위해서는 일반적으로 지름이 다른 복수개의 안테나를 동심원 상에 배치하는 방법을 사용한다. 각 안테나들을 병렬로 연결한 경우 각각의 안테나의 임피던스에 따른 전류 분배 비율이 상이하며, 분배 비율을 조절하기 위해 코일 또는 capacitor를 연결할 경우 나타나는 현상을 계산하였다.

IGZO박막 증착 공정에서 플라즈마 방출광 모니터링 및 플라즈마 균일도 제어 (Monitoring and Controlling Uniformity of Plasma Emission Intensity for IGZO Sputtering Process)

  • 최진우;황상혁;김우재;신기원;권희태;조태훈;우원균;차성덕;안병철;박완우;도재철;권기청
    • 반도체디스플레이기술학회지
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    • 제15권4호
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    • pp.27-32
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    • 2016
  • In recent years, various researches have been conducted to improve process yields in accordance with miniaturization of semiconductor. APC(Advanced Process Control) is considered one of the methods to increase in process yields. APC is a process control technology that maintains optimal process conditions and improves the reliability of results by controlling and formulating the relationship among the various process parameters and results. We built up an optical diagnostic system with a three-channel spectrometer. The system detects signals those represent the changes of specific emission peaks intensity versus each reference and converts it into MFC control signals to get back the changes to the reference state. Controlling the MFC continues until the specific peak intensity changes into the normal state. Through this device, we tested a APC automatically responding to process changes during the plasma process. We could control gas flow while sputtering process on going and improve uniformity of plasma intensity with this system. Finally, we have got results those enhance the plasma intensity non-uniformity to 7.7% from 15.5%. Also, found unexpected oxygen flow what is estimated to be come out from IGZO target.