• Title/Summary/Keyword: Plasma sheath

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Uncinaria infection in a Badger, A case report (오소리에서 Uncinaria의 감염 증례)

  • 서이원;양홍지;임채웅
    • Korean Journal of Veterinary Service
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    • v.21 no.4
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    • pp.401-405
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    • 1998
  • A male badger which showed depression and bloody diarrhea was submitted to Iksan Branch of Chonbuk Veterinary Service Laboratory for necropsy on May 1998. Grossly, paleness of the mucous membranes was observed and the small intestinal contents were hamorrhagic. The numerous tiny hookworms, sized in 5-10 mm and greyish-white in color, attached to the intestinal mucosa. Male bursa was well developed. Histologically, intestinal lumen was filled with hemorrhagic contents, which contained worms. The epithelial cells of the villi were underwent degeneration and lamina propria was infiltrated by lymphocytes and plasma cells, and goblet cells were hyperplastic. There were rounded cutting plates in the funnel-shaped buccal capsule and transverse striation on sheath in hookworm, ultrastructurally, which were consistent with Uncinaria sp. The shape of eggs were ellipsoidal and morula, and some eggs contained a mobile larva. It was concluded that this badger was infected with Uncinaria.

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Noninvasive Monitoring of ion Energy Distribution in Plasma Etching (플라즈마 식각 공정 시 비 침투적 방법으로 이온에너지 분포 측정 연구)

  • Oh, Se-Jin;Chung, Chin-Wook
    • Proceedings of the KIEE Conference
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    • 2005.07c
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    • pp.2069-2071
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    • 2005
  • 본 연구에서는 플라즈마 식각 공정 시 식자률, 선택비, wafer 손상등과 중요한 관련이 있는 이온 에너지 분포(IED)를 측정하기 위해서 챔버 내에 직접적으로 분석기를 설치하지 않고 챔버 외부에서 비 침투적(noninvasive)인 방법을 사용하여 측정하였다. 이 방범은 신호선 중 한 곳에 측정 점을 잡기 위한 연결 장치만 필요하며 그곳에서의 전안 신호와 전류 신호를 오실로스코프에서 측정한 후 미리 얻어진 챔버 구조 모델링 계수 등을 통해 실제 바이어스 전극에 걸리는 전압 및 전극에서 플라즈마로 흐르는 전류를 유추한다. 전압 및 전류측정값과 power balance와 particle balance를 적용하여 얻은 플라즈마 특성 상태 변수들을 사용하여 oscillating step sheath model을 기반으로 한 분석 프로그램을 통해 실시간 이온에너지 분포 결과를 얻었다. 실제 공정 시 바이어스 주파수 변화, 바이어스 파워 변화, 소스 파워변화 조건 등에 따른 이온 에너지 분포 측정 및 분석을 통해 비 침투적측정방법 적용의 가능성과 장점을 확인하였다.

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High Quality Nano Structured Single Gas Barrier Layer by Neutral Beam Assisted Sputtering (NBAS) Process

  • Jang, Yun-Sung;Lee, You-Jong;Hong, Mun-Pyo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.251-252
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    • 2012
  • Recently, the growing interest in organic microelectronic devices including OLEDs has led to an increasing amount of research into their many potential applications in the area of flexible electronic devices based on plastic substrates. However, these organic devices require a gas barrier coating to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency OLEDs require an extremely low Water Vapor Transition Rate (WVTR) of $1{\times}10^{-6}g/m^2$/day. The Key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required ($1{\times}10^{-6}g/m^2$/day) is the suppression of defect sites and gas diffusion pathways between grain boundaries. In this study, we developed an $Al_2O_3$ nano-crystal structure single gas barrier layer using a Neutral Beam Assisted Sputtering (NBAS) process. The NBAS system is based on the conventional RF magnetron sputtering and neutral beam source. The neutral beam source consists of an electron cyclotron Resonance (ECR) plasma source and metal reflector. The Ar+ ions in the ECR plasma are accelerated in the plasma sheath between the plasma and reflector, which are then neutralized by Auger neutralization. The neutral beam energies were possible to estimate indirectly through previous experiments and binary collision model. The accelerating potential is the sum of the plasma potential and reflector bias. In previous experiments, while adjusting the reflector bias, changes in the plasma density and the plasma potential were not observed. The neutral beam energy is controlled by the metal reflector bias. The NBAS process can continuously change crystalline structures from an amorphous phase to nano-crystal phase of various grain sizes within a single inorganic thin film. These NBAS process effects can lead to the formation of a nano-crystal structure barrier layer which effectively limits gas diffusion through the pathways between grain boundaries. Our results verify the nano-crystal structure of the NBAS processed $Al_2O_3$ single gas barrier layer through dielectric constant measurement, break down field measurement, and TEM analysis. Finally, the WVTR of $Al_2O_3$ nano-crystal structure single gas barrier layer was measured to be under $5{\times}10^{-6}g/m^2$/day therefore we can confirm that NBAS processed $Al_2O_3$ nano-crystal structure single gas barrier layer is suitable for OLED application.

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2D Fluid Modeling of Ar Plasma in a 450 mm CCP Reactor

  • Yang, Won-Gyun;Kim, Dae-Ung;Yu, Sin-Jae;Ju, Jeong-Hun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.08a
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    • pp.267-267
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    • 2012
  • 최근 국내 반도체 장비 업체들에 의해서 차세대 반도체용 450 mm 웨이퍼 공정용 장비 개발이 진행 중에 있다. 반도체 산업은 계속해서 반도체 칩의 크기를 작게 하고, 웨이퍼 크기를 늘리면서 웨이퍼 당 칩수를 증가시켜 생산성을 향상해오고 있다. 현재 300 mm 웨이퍼에서 450 mm 웨이퍼를 도입하게 되면, 생산성 뿐만 아니라 30%의 비용절감과 50%의 cycle-time 단축이 기대되고 있다. 장비에 대한 이해와 공정에 대한 해석 능력을 위해 비용과 시간이 많이 들기 때문에 최근 컴퓨터를 활용한 수치 모델링이 진행되고 있다. 또한, 수치 모델링은 실험 결과와의 비교가 필수적이다. 본 연구에서는 450 mm 웨이퍼 공정용 장비의 전자밀도를 cut off probe를 통해 100 mTorr에 서 Ar 플라즈마를 파워에 따라 측정했다. 13.56 MHz 200 W, 500 W, 1,000 W로 입력 파워가 증가하면서 웨이퍼 중심에서 $6.0{\times}10^9#/cm^3$, $1.35{\times}10^{10}#/cm^3$, $2.4{\times}10^{10}#/cm^3$로 증가했다. 450 mm 웨이퍼 영역에서 전자 밀도의 불균일도는 각각 10.31%, 3.24%, 4.81% 였다. 또한, 이 450 mm 웨이퍼용 CCP 장비를 축대칭 2차원으로 형상화하고, 전극에 13.56 MHz를 직렬로 연결된 blocking capacitor ($1{\times}10^{-6}$ F/$m^2$)를 통해 인가할 수 있도록 상용 유체 모델 소프트웨어(CFD-ACE+, EXI corp)를 이용하여 계산하였다. 주요 전자-중성 충돌 반응으로 momentum transfer, ionization, excitation, two-step ionization을 고려했고, $Ar^+$$Ar^*$의 표면 재결합 반응은 sticking coefficient를 1로 가정했다. CFD-ACE+의 CCP 모델을 통해 Poisson 방정식을 풀어서 sheath와 wave effect를 고려하였다. Stochastic heating을 고려하지 않았을 때, 플라즈마 흡수 파워가 80 W, 160 W, 240 W에서 실험 투입 전력 200 W, 500 W, 1,000 W일 때와 유사한 반경 방향의 플라즈마 밀도 분포를 보였다. 200 W, 500 W, 1,000 W일 때의 전자밀도 분포는 수치 모델링과 전 범위에서 각각 10%, 3%, 2%의 오차를 보였다. 450 mm의 전극에 13.56 MHz의 전력을 인가할 때, 파워가 증가할수록 전자밀도의 최대값의 위치가 웨이퍼 edge에서 중심으로 이동하고 있음을 실험과 모델링을 통해 확인할 수 있었다.

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Development of High Performance Massively Parallel Processing Simulator for Semiconductor Etching Process (건식 식각 공정을 위한 초고속 병렬 연산 시뮬레이터 개발)

  • Lee, Jae-Hee;Kwon, Oh-Seob;Ban, Yong-Chan;Won, Tae-Young
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.36D no.10
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    • pp.37-44
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    • 1999
  • This paper report the implementation results of Monte Carlo numerical calculation for ion distributions in plasma dry etching chamber and of the surface evolution simulator using cell removal method for topographical evolution of the surface exposed to etching ion. The energy and angular distributions of ion across the plasma sheath were calculated by MC(Monte Carlo) algorithm. High performance MPP(Massively Parallel Processing) algorithm developed in this paper enables efficient parallel and distributed simulation with an efficiency of more than 95% and speedup of 16 with 16 processors. Parallelization of surface evolution simulator based on cell removal method reduces simulation time dramatically to 15 minutes and increases capability of simulation required enormous memory size of 600Mb.

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레이저 유기 형광법을 이용한 자기장이 인가된 유도결합플라즈마의 전기장 특성 연구

  • Song, Jae-Hyeon;Kim, Hyeok;Jeong, Jae-Cheol;Hwang, Gi-Ung
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.474-474
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    • 2010
  • 현재 반도체시장의 확장으로 인해서 기존의 300mm 웨이퍼에서 450mm의 웨이퍼를 사용하는 공정으로 변화하는 추세이다. 450mm 웨이퍼로 대면적 화되면서 기존 300mm 공정 때보다 훨씬 효율적인 플라즈마 소스 즉, 고밀도이고, 고균등화(high uniformity) 플라즈마 소스를 필요로 한다. 본 논문에서는 고밀도 플라즈마 소스인 유도 결합형 플라즈마(Inductively Coupled Plasma ; ICP)에 축 방향의 약한 자기장을 인가시킨 자화된 유도결합형 플라즈마(Magnetized Inductively Coupled Plasma : MICP)[1]를 제안하여 기존 ICP와의 차이점을 살펴보았다. 실험 방법으로 레이저 유기 형광법(Laser Induced Fluorescence : LIF)[2]을 이용하여 플라즈마 쉬스(Sheath) 내의 전기장을 외부 자기장의 변화에 따라 높이별로 측정하고 그 결과로부터 쉬스의 전기적 특성을 살펴보았다. 플라즈마의 특성상 탐침이나 전극에 전압을 인가하면 그 주위로 디바이 차폐(Debye Shielding)현상이 일어나서 플라즈마 왜곡이 일어난다. 그렇기에 플라즈마, 특히 플라즈마 쉬스의 특성을 파악하기 위해서 레이저라는 기술을 사용하였다. 레이저는 고가의 장비이고 그 사용에 많은 경험지식(know-how)를 필요로 하지만 플라즈마를 왜곡시키지 않고, 플라즈마의 밀도, 온도, 전기장 등 많은 상수(parameter)들을 얻어 낼 수 있다. 또한 3차원적으로 높은 분해능을 가지고 있는 장점이 있다. 강한 전기장이 있는 곳에서 입자들의 고에너지 준위가 전기장의 세기에 비례하여 분리되는 Stark effect[3] 이론을 이용하여 플라즈마 쉬스내의 전기장을 측정하였다. 실험은 헬륨가스 700mTorr 압력에서 이루어졌다. 기판의 파워를 50W에서 300W까지 변화시키면서 기판에 생기는 쉬스의 전기장의 변화를 살펴보았고, 자기장을 인가한 후 동일한 실험을 하여 자기장의 유무에 따른 플라즈마 쉬스의 전기장 변화를 살펴보았다. 실험결과 플라즈마 쉬스의 전기장의 변화는 기판의 파워와 플라즈마 밀도에 크게 의존함을 알았다. 기판의 파워가 커질수록 쉬스의 전기장은 커지고, 기판에 생기는 Self Bias Voltage역시 음의 방향으로 커짐을 확인 하였다. 또한 자기장을 걸어주었을 경우 쉬스의 두께가 얇아짐으로써 플라즈마의 밀도가 증가했음을 확인 할 수 있었다.

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Al2O3 High Dense Single Layer Gas Barrier by Neutral Beam Assisted Sputtering (NBAS) Process

  • Jang, Yun-Seong;Hong, Mun-Pyo
    • Proceedings of the Korean Vacuum Society Conference
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    • 2015.08a
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    • pp.157-157
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    • 2015
  • Recently, the growing interest in organic microelectronic devices including OLEDs has led to an increasing amount of research into their many potential applications in the area of flexible electronic devices based on plastic substrates. However, these organic devices require a gas barrier coating to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency OLEDs require an extremely low water vapor transition rate (WVTR) of $1{\times}10^{-6}g/m^2day$. The Key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required ($1{\times}10^{-6}g/m^2day$) is the suppression of defect sites and gas diffusion pathways between grain boundaries. In this study NBAS process was introduced to deposit enhanced film density single gas barrier layer with a low WVTR. Fig. 1. shows a schematic illustration of the NBAS apparatus. The NBAS process was used for the $Al_2O_3$ nano-crystal structure films deposition, as shown in Fig. 1. The NBAS system is based on the conventional RF magnetron sputtering and it has the electron cyclotron resonance (ECR) plasma source and metal reflector. $Ar^+$ ion in the ECR plasma can be accelerated into the plasma sheath between the plasma and metal reflector, which are then neutralized mainly by Auger neutralization. The neutral beam energy is controlled by the metal reflector bias. The controllable neutral beam energy can continuously change crystalline structures from an amorphous phase to nanocrystal phase of various grain sizes. The $Al_2O_3$ films can be high film density by controllable Auger neutral beam energy. we developed $Al_2O_3$ high dense barrier layer using NBAS process. We can verified that NBAS process effect can lead to formation of high density nano-crystal structure barrier layer. As a result, Fig. 2. shows that the NBAS processed $Al_2O_3$ high dense barrier layer shows excellent WVTR property as a under $2{\times}10^{-5}g/m^2day$ in the single barrier layer of 100nm thickness. Therefore, the NBAS processed $Al_2O_3$ high dense barrier layer is very suitable in the high efficiency OLED application.

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Cut-off Probe Frequency Spectrum의 물리적 해석

  • Yu, Sin-Jae;Kim, Dae-Ung;Kim, Jeong-Hyeong;Seong, Dae-Jin;Sin, Yong-Hyeon;Na, Byeong-Geun;Jang, Hong-Yeong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.200-200
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    • 2011
  • Although the cut-off probe, a precise measurement method for the electron density, is widely used in the industry, the physics on the wave spectrum of the cut-off is not understood yet, only cut-off point frequency containing the information of electron density has been analyzed well. This paper analyzes the microwave frequency spectrum of the cut-off probe to see the physics behind using both microwave field simulation (CST Microwave Studio) and simplified circuit simulation. The result shows that the circuit model well reproduces the cut-off wave spectrum especially in the low frequency regime where the wavelength of the driving frequency is larger than the characteristic length and reveals the physics of transmission characteristics with frequency as resonances between vacuum, plasma and sheath. Furthermore, by controlling the time domain in solver of the microwave simulator, the cut-off like transmission peaks above the cut-off frequency which has been believed as cavity effect is verified as chamber geometry effect. The result of this paper can be used as the basis for the improvement of cut-off probe.

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Modeling of the Laser Ablation under the RF Ar Plasmas (RF Ar 플라즈마에서의 레이저 어블레이션 모델링)

  • So, Soon-Youl;Lim, Jang-Seob;Lee, Jin;Jung, Hae-Deok;Park, Gye-Choon;Moon, Chae-Joo
    • Proceedings of the KIEE Conference
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    • 2007.07a
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    • pp.1408-1409
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    • 2007
  • In this paper, we developed a hybrid simulation model of carbon laser ablation under the Ar plasmas consisted of fluid and particle methods. Three kinds of carbon particles, which are carbon atom, ion and electron emitted by laser ablation, are considered in the computation. In the present modeling, we adopt capacitively coupled plasma with ring electrode inserted in the space between the substrate and the target, graphite. This system may take an advantage of ${\mu}m$-sized droplets from the sheath electric field near the substrate. As a result, in Ar plasmas, carbon ion motions were suppressed by a strong electric field and were captured in Ar plasmas. Therefore, a low number density of carbon ions were deposited upon substrate. In addition, the plume motions in Ar gas atmosphere was also discussed.

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Modelling and Analysis of Electrodes Erosion Phenomena of $SF_6$ Arc in a Laval Nozzle

  • Lee, Byeong-Yoon;Liau, Vui Kien;Song, Ki-Dong;Park, Kyong-Yop
    • Proceedings of the KIEE Conference
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    • 2005.07b
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    • pp.972-974
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    • 2005
  • The present work deals with the theoretical study of the effects of copper vapours resulting from the erosion of the electrodes on the properties of a SF6 arc in a Laval nozzle. Computations have been done for a DC arc of 1000A with upstream gas pressure of 3.75MPa. The arc plasma is assumed to be in local thermodynamic equilibrium(LTE). The sheath and non-equilibrium region around the electrodes are not considered in this model. However, its effects on the energy flux into the electrodes are estimated from some experimental and theoretical data. The turbulence effects are calculated using the Prandtl mixing length model. A conservation equation for the copper vapour concentration is solved together with the governing equations for mass, momentum and energy of the gas mixture. Comparisons were made between the results with and without electrodes erosion. It has been found that the presence of copper vapours cools down the arc temperature due to the combined effects of increased radiation and increased electrical conductivity. The copper vapour distribution is very sensitive to the turbulent parameter. The erosion of upstream electrode(cathode) has larger effects on the arc compared to the downstream electrode(anode) as the copper vapour eroded from the anode cannot diffuse against the high-speed axial flow.

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