• Journal of Power Electronics
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• v.14 no.4
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• pp.806-813
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• 2014

Planar electromagnetic interference (EMI) filters are widely used to restrain the conducted EMI of switching power supplies. Such filters are characterized by small size, low parasitic parameters, and better high-frequency performance than the passive discrete EMI filter. However, EMI filter performance cannot be exactly predicted by using existing methods. Therefore, this paper proposes a method to use scattering parameters (S-parameters) for the measurement of EMI filter performance. A planar EMI filter sample is established. From this sample, the relationship between S-parameters and insertion gain (IG) of EMI filter is derived. To determine the IG under different impedances, the EMI filter is theoretically calculated and practically measured. The differential structure of the near-field coupling model is also deduced, and the IG is calculated under standard impedance conditions. The calculated results and actual measurements are compared to verify the feasibility of the theory.

• Journal of Power Electronics
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• v.16 no.3
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• pp.1200-1208
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• 2016

Planar electromagnetic interference (EMI) filter has significant engineering significance to power electronic system integration and miniaturization. However, the value of differential mode capacitance cannot meet the demand of noise suppression because of the size limit of ceramics. In this case, the EMI filter of novel multilayers is recommended to address this issue. A novel integrated structure of EMI filter based on multilayer ceramic is proposed in this study. The inductance and capacitance of the new structure can be designed separately, which is an advantage in manufacturing. Insertion loss is measured more closely to the actual situation in this study, which is different from the condition where source and load impedances are both 50 Ω. In the process of designing a novel EMI filter, noise impedance is considered. Moreover, the prototype is created and applied to a small switching power supply, which verifies the effectiveness of the developed EMI filter.