• Title/Summary/Keyword: Photon extraction efficiency

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Effect of an emitting-layer height on a photon extraction efficiency in LED (LED에서 발광층의 높이가 광추출 효율에 미치는 영향)

  • Kwon, Keeyoung
    • The Journal of the Convergence on Culture Technology
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    • v.7 no.1
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    • pp.564-569
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    • 2021
  • In this paper, for the typical LED and the tilted LED, when there is no electrode, when 20% absorption (80% reflection) occurs at the electrode, and when 60% absorption (40% reflection) occurs at the electrode, the effect of the absorption at the electrode and the height of the active region on the photon extraction efficiency and the mean photon path length was investigated, and an appropriate height of the active region was proposed. In a typical LED, as the absorption of the electrode increases, the photon extraction efficiency decreases from 18% to 15% and 13%, and the photon extraction efficiency is highest when the height of the active area is located in the center between the two electrodes. In the tilted LED, as the absorption of the electrode increases, the photon extraction efficiency decreases from 38% to 33% and 25%, and the photon extraction efficiency is highest when the height of the active area is located in the center between the two electrodes. The tilted LED can increase the photon extraction efficiency more than twice than that of a typical LED, where photons are trapped inside the chip due to total reflection.

Photon Extraction Efficiency in InGaN Light-emitting Diodes Depending on Chip Structures and Chip-mount Schemes (InGaN LED에서 칩 구조 및 칩마운트 구조에 따른 광추출효율에 관한 연구)

  • Lee, Song-Jae
    • Korean Journal of Optics and Photonics
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    • v.16 no.3
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    • pp.275-286
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    • 2005
  • The performance of the InGaN LED's in terms of the photon extraction efficiency has been analyzed by the Monte Carlo photon simulation method. Simulation results show that the sidewall slanting scheme, which works well for the AlInGaP or InGaN/SiC LED, plays a very minimal role in InGaN/sapphire LED's. In contrast to InGaN/SiC LED's, the lower refractive index sapphire substrate restricts the generated photons to enter the substrate, minimizing the chances for the photons to be deflected by the slanted sidewalls of the epitaxial semiconductor layers that are usually very thin. The limited photon transmission to the sapphire substrate also degrades the. photon extraction efficiency especially in the epitaxial-side down mount. One approach to exploit the photon extraction potential of the epitaxial-side down mount may be to texture the substrate-epitaxy interface. In this case, randomized photon deflection off the textured interface directly increases the number of the photons entering the sapphire substrate, from which they easily couple out of the chip and thereby improving the photon extraction efficiency drastically.

Uranium Analysis in Aqueous Samples by Selective Extraction and Photon-Electron Rejecting Alpha Liquid Scintillation $(PERALS^\circledR)$ Spectrometry

  • Shin, Hyun-Sang;Lee, Myung-Ho;Park, Geun-Sik;Lee, Chang-Woo
    • Nuclear Engineering and Technology
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    • v.31 no.5
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    • pp.445-454
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    • 1999
  • This work describes the adaptation of extractive scintillation by URAE $X^{TM}$ with a photon-electron rejecting alpha liquid scintillation (PERAL $S^{)}$ spectrometer to the analysis of uranium in aqueous samples. The extraction efficiency of the system was evaluated under varing chemical conditions including pH, and sample-cocktail volume ratio. Isotopic information from the (PERAL $S^{)}$ spectrum of natural uranium was obtained using a curve fitting routine. Comparisons of the result with that obtained from alpha spectrometry method using ion implanted silicon detector showed good agreement.t.

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Implementation of LED BLU Using Metal core PCB with Anodizing Oxide Layer (에노다이징 절연층과 반시컵 구조를 보유한 COB타입 LED BLU 광원구현)

  • Hong, Dae-Un;Jo, Jae-Hyeon
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 2009.05a
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    • pp.157-159
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    • 2009
  • LED BLU(Back Light Unit), based on MCPCB(Metal Core Printed Circuit Board) with anodizing oxide dielectric layer and improved thermal dissipation property, are presented. Reflecting cups were also formed on the surface of the MCPCB such that optical coupling between neighboring chips were minimized for improving the photon extraction efficiency. LED chips were directly attached on the MCPCB by using the COB (Chip On Board) scheme.

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Basic Design Guidelines for LED Lamp Packages (LED 램프 패키지 설계를 위한 기본 지침)

  • Youk, Ji-Hyun;Hong, Dae-Woon;Lee, Song-Jae
    • Korean Journal of Optics and Photonics
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    • v.22 no.3
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    • pp.141-150
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    • 2011
  • Although significant amount of research has been done to develop LED lamp packages for improved performance, no standard theories or guidelines have been established yet for designing LED lamp packages. In this paper, the photon extraction efficiency depending on both the InGaN/Sapphire LED chip structure and its attachment schemes for chip mounting has been analyzed by using the Monte Carlo photon simulation method. Based on the results of the analysis, we have derived guidelines for LED lamp package design, which can be utilized in industries or research institutes for designing new LED lamp packages optimized for particular applications.

Analysis of the Effect of the Substrate Removal and Chip-Mount Type on Light Output Characteristics in InGaN/Sapphire LEDs (InGaN/Sapphire LED에서 기판 제거 유무와 칩 마운트 타입이 광출력 특성에 미치는 영향)

  • Hong, Dae-Woon;Yoo, Jae-Keun;Kim, Jong-Man;Yoon, Myeong-Jung;Lee, Song-Jae
    • Korean Journal of Optics and Photonics
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    • v.19 no.5
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    • pp.381-385
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    • 2008
  • We have analyzed the effect of the substrate removal and packaging schemes on light output characteristics in InGaN/Sapphire LEDs. The removal of the sapphire substrate helps to dissipate the heat generated in the junction, but the advantage comes only with the detrimental effect of degrading the photon extraction efficiency. If the substrate-removed chip is attached to a metallic mount with good thermal conductivity, the maximum driving current is increased drastically, producing significantly increased light output and therefore compensating the photon extraction efficiency degradation. On a dielectric mount with a relatively poor thermal conductivity, however, it produces smaller light output, over most input current range, than the regular type of chips with the sapphire substrate remaining. Thus, for low power applications, the regular chips may be preferred over the substrate-removed chips, regardless of the chip mounts employed.

Improvement of Light Extraction Efficiency of GaN-Based Vertical LED with Microlens Structure

  • Kwon, Eunhee;Kang, Eun Kyu;Min, Jung Wook;Lee, Yong Tak
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.221-221
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    • 2013
  • Vertical LED (VLED) has been recognized as a way to obtain the high-power LED due to their advantages [1]. However, approximately 4% of the light generated from the active region is extracted, if the light extraction from side walls and back side is neglected because of Fresnel reflection (FR) and total internal reflection (TIR) [2,3]. In this study, the optical simulation of the VLED with the various microstructures was performed. Among them, the microlens having the diameter of 3 ${\mu}m$ and the height of 1.5 ${\mu}m$ shown the best result was chosen, and then, optimized microlens was formed on a GaN template using conventional semiconductor process. Various microstructures were proposed to improve the light extraction efficiency (LEE) of the VLED for the simulation. The LEE was simulated using LightTools based on a Monte Carlo ray tracing. The microstructures with hemisphere, cone, truncated and cylinder pattern having diameter of 3 ${\mu}m$ were employed on the top layer of the VLED respectively. The improvement of the LEE by using the microstructure is 87% for the hemisphere, 77% for the cone, 53% for the truncated, 21% for the cylinder, compared with the LEE of the flat surface at the reflectance of 85%. The LEE was increased by 88% at the height of 1.5 ${\mu}m$, compared with the LEE of the flat surface. We found that the microlens on the top layer is the most suitable for increasing the LEE. In order to apply the proposed microlens on n-GaN surface, we fabricated microlens on a GaN template. A photoresist array having hexagonal-closed packed microlens was fabricated on the GaN template. Then, optimization of etching the GaN template was performed using a dry etching process with ICP-RIE. The dry etching carried out using a gas mixture of Cl2 and Ar, each having a flow rate of 16 sccm and 10 sccm, respectively with RF power of 50 W, ICP power of 900 W and chamber pressure of 2 mTorr was the optimum etching condition as shown in Fig. 2(a).

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Power extraction efficiency and lasing wavelength distribution of index-coupled DEB lasers above-threshold for various facet reflectivity combinations (문턱 전류 이상에서 양 단면 반사율 조합에 따른 index-coupled DFB 레이저의 파워 추출 효율과 발진 파장 분포)

  • 김상택;김부균
    • Korean Journal of Optics and Photonics
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    • v.14 no.4
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    • pp.413-422
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    • 2003
  • We have calculated the power extraction efficiency and the lasing wavelength distribution of index-coupled DFB lasers at threshold for various kL and facet reflectivity combinations, and compared with those above-threshold. The power extraction efficiency increases as the asymmetry of the facet reflectivities increases. The power extraction efficiency above-threshold is slightly larger than that at threshold. Since the relative photon density around the center region increases as kL increases, the power extraction efficiency decreases. The uniformity of the distribution of lasing wavelength over the stop band increases due to the relief of mode degeneracy as the asymmetry of the facet reflectivities increases. In the case of AR-HR combination, the lasing wavelength distributions at threshold are similar to those above-threshold. However, in the case of AR-AR combination, the lasing wavelength at threshold is concentrated on both edges of the stop band, while it is concentrated only on the longer wavelength edge above-threshold. As kL increases, the range of the lasing wavelength distribution increases due to the increase of the stop band. The effect of AR reflectivity on the power extraction and the lasing wavelength distribution is very weak.

Implementation of LED BLU Using Metal core PCB with Anodizing Oxide Layer and Reflection Cup Structure (에노다이징 절연층과 반사컵 구조를 보유한 COB타입 LED BLU 광원구현)

  • Cho, Jae-Hyun;Lee, Min-Soo
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.23 no.8
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    • pp.8-13
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    • 2009
  • LED BLU(Back Light Unit), based on MCPCB(Metal Core Printed Circuit Board) with anodizing oxide dielectric layer and improved thermal dissipation property, are presented. Reflecting cups were also formed on the surface of the MCPCB such that optical coupling between neighboring chips were minimized for improving the photon extraction efficiency. LED chips were directly attached on the MCPCB by using the COB (Chip On Board) scheme.

Photoluminescence analysis of patterned light emitting diode structure

  • Hong, Eun-Ju;Byeon, Gyeong-Jae;Park, Hyeong-Won;Lee, Heon
    • Proceedings of the Materials Research Society of Korea Conference
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    • 2009.05a
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    • pp.21.2-21.2
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    • 2009
  • 발광다이오드는 에너지 변환 효율이 높고 친환경적인 장점으로 인하여 차세대 조명용 광원으로 각광받고 있다. 하지만 현재 발광다이오드는 낮은 광추출효율로 인하여 미래의 수요를 충족시킬 수 있을 만큼 충분한 성능의 효율을 나타내지 못하고 있다. 발광다이오드의 낮은 광추출효율은 반도체소재와 외부 공기와의 큰 굴절률 차이로 인하여 발생하는 전반사 현상에 기인한 것으로 이 문제를 해결하기 위하여 발광다이오드 소자의 발광면 및 기판을 텍스처링하는 방법이 중요하게 인식되고 있다. 하지만 현재까지 패턴의 구조에 따른 광추출 특성을 분석한 연구는 미진한 상황이다. 본 연구에서는 임프린팅 및 건식식각 공정을 이용하여 다양한 구조의 나노 및 micron 급 패턴을 발광다이오드의 p-GaN층에 형성하였다. 발광다이오드 기판 위에 하드마스크로 사용하기 위한 SiO2를 50nm 증착한 후 그 위에 UV 임프린팅 공정을 진행하여 폴리머 패턴을 형성시켰다. 임프린팅 공정으로 형성된 폴리머 패턴을 CF4CHF3 플라즈마를 이용하여 SiO2를 건식식각하였고, 이후에 SiCl4와 Ar 플라즈마를 이용한 ICP 식각 공정을 진행하여 p-GaN층을 100nm 식각하였다. 마지막으로 BOE를 이용한 습식식각 공정으로 p-GaN층에 남아있는 SiO2층을 제거하여 p-GaN층에 sub-micron에서 micron급의 홀 패턴을 형성하였다. Photoluminescence(PL) 측정을 통해서 발광다이오드 소자에 형성된 패턴의 구조에 따른 광추출 특성을 분석하였다.

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