• Title/Summary/Keyword: Phosphor film

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Fabrication and characteristics of $ZnGa_2O_4$ phosphor thin film ($ZnGa_2O_4$ 형광체 박막의 제작 및 특성)

  • Kim, Yong-Chun;Hong, Beom-Joo;Kwon, Sang-Jik;Kim, Kyung-Hwan;Choi, Hyung-Wook
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.11a
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    • pp.539-542
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    • 2004
  • The $ZnGa_2O_4$ phosphor target is synthesized through solid-state reactions at the calcine temperature of $700^{\circ}C$ and sintering temperature of $1300^{\circ}C$ in order to deposit $ZnGa_2O_4$ phosphor thin film by rf magnetron sputtering system. The $ZnGa_2O_4$ phosphor thin film is deposited on Si(100) substrate and prepared $ZnGa_2O_4$ phosphor thin film is annealed by rapid thermal processor(RTP) at $700^{\circ}C$, 15sec. The x-ray diffraction patterns of $ZnGa_2O_4$ phosphor target and thin film show the position of (311) main peak. The cathodoluminescenre(CL) spectrums of $ZnGa_2O_4$ phosphor thin film show main peak of 420nm and maximum intensity at the substrate temperature of $500^{\circ}C$ and annealing temperature of $700^{\circ}C$ 15sec.

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Fabrication and characterization of $ZnGa_2O_4$ phosphor target and thin film for FED (FED용 $ZnGa_2O_4$ 형광체 타겟과 박막의 제작 및 특성분석)

  • Kim, Yong-Chun;Hong, Beom-Joo;Kim, Kyung-Hwan;Park, Yong-Seo;Choi, Hyung-Wook
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.1092-1095
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    • 2004
  • The $ZnGa_2O_4$ phosphor target is synthesized through solid-state reactions as calcine and sintering temperature in order to deposit $ZnGa_2O_4$ phosphor thin film by rf magnetron sputtering system. The $ZnGa_2O_4$ phosphor thin film is deposited on $Pt/Ti/SiO_2/Si$ substrate and prepared $ZnGa_2O_4$ Phosphor thin film is annealed by rapid thermal processor(RTP) at $750^{\circ}C$, 10 sec. The x-ray diffraction patterns of $ZnGa_2O_4$ phosphor target and thin film show the position of (311) main peak. The cathodolumincsccnce(CL) succtrums of $ZnGa_2O_4$ phosphor target show main peak of 360nm and broad bandwidth of about 180nm.

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A Study on Powder Electroluminescent Device through Structure and Thickness Variation (구조 및 두께 변화에 따른 후막 전계 발광소자에 관한 연구)

  • 오주열;정병선;이종찬;박대희
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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    • 1998.11a
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    • pp.9-11
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    • 1998
  • A phenomenon of electroluminescent radiate as electric field applied in the phosphor, in this paper, we produced the Powder Electroluminescent Device(PELD) which was changing the structure and the thickness of phosphor and insulator for realization of the PELD with high brightness. We made PELD with structure that is WK-1(ITO film/Phosphor/Insulator/Electrode), WK-2(ITO film/Phosphor/Insulator/Electro de), WK-3(ITO film/Phosphor/Insulator/Electrode), WK-4(ITO film/Phosphor+Insulator/ Electrode). The property of the produced PELD are analyzed by measuring the spectrum which electrical and optical property, the brightness and the transferred charge density. In this result, the structure of WK-4 have good luminescence property than others, it's effective thickness is 60${\mu}{\textrm}{m}$. At 100V 400Hz, High brightness of 2700cd/m2 was performed.

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Luminescence properties of $YVO_4:Eu^{3+}$ thin film phosphor deposited by RF magnetron sputter deposition technique

  • Kang, Jong-Hyuk;Han, Ji-Yeon;Jang, Ho-Seong;Yoo, Hyoung-Sun;Yun, Sun-Jin;Jeon, Duk-Young
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1547-1550
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    • 2007
  • $YVO_4:Eu^{3+}$ thin film phosphor samples have been deposited by using RF magnetron sputter deposition technique with various deposition temperatures. The Effect of deposition temperature (room temperature to $450\;^{\circ}C$) on morphological, crystal structure, and luminescence properties of $YVO_4:Eu^{3+}$ thin film phosphor has also been investigated. As the deposition temperature increases, the size of crystal grain and surface roughness of thin film increases principally and its crystallinity also increases. It is found that the asdeposited $YVO_4:Eu^{3+}$ thin film excited either photon or electron shows typical luminescence spectra successfully. CIE color coordinates of $YVO_4:Eu^{3+}$ thin film phosphor with increasing deposition temperature moved towards more reddish region.

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Fabrication and Characterization of ZnGa2O4 Phosphor Target (ZnGa2O4 형광체 타겟의 제작 및 특성분석)

  • Kim, Yong-Chun;Hong, Beom-Joo;Kwon, Sang-Jik;Kim, Kyung-Hwan;Park, Yong-Seo;Choi, Hyung-Wook
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.12
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    • pp.1347-1351
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    • 2004
  • The ZnGa$_2$O$_4$ phosphor target was synthesized through solid-state reactions as calcine and sintering temperature in order to deposit ZnGa$_2$O$_4$ Phosphor thin film by rf magnetron sputtering system. The x-ray diffraction patterns of ZnGa$_2$O$_4$ phosphor target showed the position of (311) main peak. The cathodoluminescence(CL) spectrums of ZnGa$_2$O$_4$ phosphor target showed main peak of 370 nm to 400 nm, and maximum intensity at the calcine temperature of $700^{\circ}C$ and sintering temperature of 130$0^{\circ}C$. It was possible to prepare The ZnGa$_2$O$_4$ phosphor thin film with synthesized ZnGa$_2$O$_4$ phosphor target and The prepared ZnGa$_2$O$_4$ phosphor thin film showed the position of (311) main peak.

Characteristics of ZnGa2O4 Phosphor Thin Film with Temperature of Substrate and Annealing (기판온도 및 Annealing에 따른 ZnGa2O4 형광체 박막의 특성)

  • Kim, Yong-Chun;Hong, Beom-Joo;Kwon, Sang-Jik;Lee, Dal-Ho;Kim, Kyung-Hwan;Park, Yong-Seo;Choi, Hyung-Wook
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.2
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    • pp.187-191
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    • 2005
  • A ZnGa$_2$O$_4$ phosphor target was synthesized through solid-state reactions at a calcine temperature of 700 $^{\circ}C$ and sintering temperature of 1300 $^{\circ}C$ in order to deposit ZnGa$_2$O$_4$ phosphor thin film at various temperature using rf magnetron sputtering system. A ZnGa$_2$O$_4$ phosphor thin film was deposited on Si(100) substrate and annealed by a rapid thermal processor(RTP) at 700 $^{\circ}C$, for 15 sec. The x-ray diffraction patterns of ZnGa$_2$O$_4$ phosphor target and thin film showed the main peak (311) direction. ZnGa$_2$O$_4$ thin film has better crystalization due to as function of increasing substrate and annealing temperature. The cathodoluminescence(CL) spectrums of ZnGa$_2$O$_4$ phosphor thin film showed the main peak 420 nm wavelength and the maximum intensity at the substrate temperature of 500 $^{\circ}C$ and annealing temperature of 700 $^{\circ}C$, for 15 sec.

Study of Efficiency Test and Subjective Responses about Pendent Task Lighting System Using Phosphor Luminescent Film LED (광기여 필름 LED 팬던트 작업조명시스템 주관평가와 성능검증)

  • Cha, Kwang-Seok;Kim, Hway-Suh
    • Korean Journal of Air-Conditioning and Refrigeration Engineering
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    • v.23 no.3
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    • pp.188-193
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    • 2011
  • For a long time work or study, pendent task lighting system prepared with phosphor luminescent film LED was developed for eye protection and working efficiency improvement. Developed lighting system was used together with pendent and ambient lighting. Such as, we made comfortable lighting environment system. Evaluation for developed lighting system, that had proceeded to Mock-up test and subjective evaluation. Also It had proceeded that lighting environment analyzed and compatibility valuation of installation. In subjective evaluation, the students have expressed themselves satisfied to phosphor luminescent film LED lighting system. In Mock-up test, It is not problem to intensity of illumination, luminance and color temperature. Therefore, developed LED lighting system was installed at the Daegu apartment. It is having a P.O.E study progress to phosphor luminescent film LED lighting system.

Developments of Transparent ac-PDPs

  • Choi, Hak-Nyun;Lee, Seog-Young;Kim, Yong-Seog
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.1621-1624
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    • 2008
  • Transparent ac-PDP test panel was prepared via a combination of materials including ITO sustaining electrodes, thin film dielectric layer and nano-sized phosphor powders. The thin film dielectric layer was prepared by E-beam evaporation process and phosphor layer was deposited on metal mesh pattern by electrophoretic deposition process. The optical transmittance and luminance of the panel indicated that full color transparent ac-PDP is feasible with the approach.

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Luminescent Properties of BaSi2O5:Eu2+ Phosphor Film Fabricated by Spin-Coating of Ba-Eu Precursor on SiO2 Glass

  • Park, Je Hong;Kim, Jong Su;Kim, Jong Tae
    • Journal of the Optical Society of Korea
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    • v.18 no.1
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    • pp.45-49
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    • 2014
  • Well-crystallized $BaSi_2O_5:Eu^{2+}$ phosphor films were synthesized by heat treatment of spin-coated BaO:Eu on $SiO_2$ glass. We investigated luminescence-structure properties of these phosphor films as a function of heat-treatment temperature. From x-ray diffraction patterns, our $BaSi_2O_5:Eu^{2+}$ phosphor films revealed that (111)- and (204)-crystal planes of $BaSi_2O_5$ crystal were dominantly increased with an increase of heat-treatment temperature. Photoluminescence intensities of $BaSi_2O_5:Eu^{2+}$ phosphor films were increased with amount of these crystal planes. It can be explained that $Eu^{2+}$ ions were stably occupied at specific crystal orientation of $BaSi_2O_5$ crystal, enhancing the luminescent intensities of $BaSi_2O_5:Eu^{2+}$ phosphor films. In addition, our $BaSi_2O_5:Eu^{2+}$ phosphor films had transmittance of 70% at 510 nm,.due to the dense morphology and specific crystallinity of $BaSi_2O_5:Eu^{2+}$ phosphor films.

Present and trend of oxide phosphor thin film development for electroluminescent device applications

  • Miyata, Toshihiro;Minami, Tadatsugu
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.1145-1148
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    • 2008
  • The present status and trend of oxide phosphor thin-film development for thin-film electroluminescent (TFEL) device application are presented in this paper. Recently, several newly developed types of bendable or bendable see-through oxide TFEL lamps have been fabricated using the TFEL technology with a newly developed bendable ceramic sheet, glass sheet or sapphire sheet substrate, which has become available on the market. Stable operation at high temperatures was obtained in double-insulating-layer-type TFEL lamps fabricated with a $Zn_2Si_{0.6}Ge_{0.}4O_4$:Mn thin-film emitting layer forming on translucent or transparent bendable sheet substrates.

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