• Title/Summary/Keyword: PMMA Thin Films

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Fabrication of Poly(methyl methacrylate) Beads Monolayer Using Rod-coater and Effects of Solvents, Surfactants and Plasma Treatment on Monolayer Structure (Rod 코팅을 이용한 Poly(methyl methacrylate) 비드의 단일층 형성 및 단일층 구조에 미치는 용매, 계면활성제, 플라즈마 처리의 영향)

  • Kim, Da Hye;Ham, Dong Seok;Lee, Jae-Heung;Huh, Kang Moo;Cho, Seong-Keun
    • Journal of Adhesion and Interface
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    • v.20 no.1
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    • pp.1-8
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    • 2019
  • Fabrication of monolayer is important method for enhancing physical and chemical characteristics such as light shielding and antireflection while maintaining thin film properties. In previous studies, monolayers were fabricated by various methods on small substrates, but processes were complicated and difficult to form monolayers with large area. We used rod coating equipment with a small amount of coating liquid to form a HCP (hexagonal closed packing) coating of PMMA beads on PET(poly(ethylene terephthalate)) substrate with $20cm{\times}20cm$ size. We observed that changes in morphologies of monolayers by using the solvents with different boiling points and vapor pressures, by adapting surfactants on particles and by applying plasma treatment on substrates. The coverage was increased by 20% by optimizing the coating conditions including meniscus of beads, control of the attraction - repulsion forces and surface energy. This result can potentially be applied to optical films and sensors because it is possible to make a uniform and large-scale monolayer in a simple and rapid manner when it is compared to the methods in previous studies.

Study on Lowering of the Polarization in SiOC Thin FIlms by Post Annealing (SiOC 박막에서 열처리에 의한 분극의 감쇄현상에 관한 연구)

  • Oh, Teresa
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.16 no.8
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    • pp.1747-1752
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    • 2012
  • The SiOC film of carbon centered system was prepared using bistrimethylsilylmethane (BTMSM) and oxygen mixed precursor by the chemical vapor deposition. The dielectric constant is measured by MIS(metal/insulator/Si) structure, but it could decrease the reliability because the uniformity is not assured. To research the dielectric constant of SiOC film, the range of low polarization was researched in SiOC film using the optical analysis and hardness, and then calculated the dielectric constant of SiOC film with amorphous structure of high degree. After annealing, the dielectric constant of SiOC film was decreased owing to the lowering of polarization, and FTIR spectra of the main bond was shifted to higher wave number. The main bond of 950~1200 cm-1 was composed of the Si-C and Si-O bonds. The intensity increases in Si-O bond infers the bonding strength became stronger than that of deposited film. Annealed SiOC film showed 2.06 in dielectric constant.

A Study on the Simulation and DSF Molding of V-groove Type Light Guide for a Backlight Unit (백라이트 유닛용 V-그루브 도광판의 전산모사 및 DSF성형에 관한 비교연구)

  • Cho K. H.;Yoon K. H.
    • Transactions of Materials Processing
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    • v.14 no.3 s.75
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    • pp.282-290
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    • 2005
  • Nowadays, TFT-LCD is widely used as display unit of many digital devices. And, the backlight unit(BLU) is used as a light source of TFT-LCD module. In the backlight unit, the most important component is a light guide, which guides the input light to the TFT-LCD module uniformly. Recently, many researchers have focused on improving the efficiency of BLU by changing the design and structure of a light guide. In the present paper, a series of simulation was performed to find the optimal luminance distribution of emanated light from the given geometry as the first step. From the results of simulations for the light guide with given V-groove pattern, the emanated light from it is mostly affected by the groove angle. In the case of acute angle, about 74 degrees was found as optimal angle to satisfy the restrictions of angular luminance distribution, FWHM, the maximum luminance, etc. However, as far as the average luminance value was concerned, the case of 120 degrees(abtuse angle) was found to be the best while prism films were added to the BLU. As a next step the light guide samples of 74 and 120 degrees were manufactured by DSF method, which was recently proposed by the authors. Of course, most of design parameters were chosen by the aid of simulation results. Finally, the results of average luminance values were compared between the simulation and DSF molded samples.

Resistive Switching Effect of the $In_2O_3$ Nanoparticles on Monolayered Graphene for Flexible Hybrid Memory Device

  • Lee, Dong Uk;Kim, Dongwook;Oh, Gyujin;Kim, Eun Kyu
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.396-396
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    • 2013
  • The resistive random access memory (ReRAM) has several advantages to apply next generation non-volatile memory device, because of fast switching time, long retentions, and large memory windows. The high mobility of monolayered graphene showed several possibilities for scale down and electrical property enhancement of memory device. In this study, the monolayered graphene grown by chemical vapor deposition was transferred to $SiO_2$ (100 nm)/Si substrate and glass by using PMMA coating method. For formation of metal-oxide nanoparticles, we used a chemical reaction between metal films and polyamic acid layer. The 50-nm thick BPDA-PDA polyamic acid layer was coated on the graphene layer. Through soft baking at $125^{\circ}C$ or 30 min, solvent in polyimide layer was removed. Then, 5-nm-thick indium layer was deposited by using thermal evaporator at room temperature. And then, the second polyimide layer was coated on the indium thin film. After remove solvent and open bottom graphene layer, the samples were annealed at $400^{\circ}C$ or 1 hr by using furnace in $N_2$ ambient. The average diameter and density of nanoparticle were depending on annealing temperature and times. During annealing process, the metal and oxygen ions combined to create $In_2O_3$ nanoparticle in the polyimide layer. The electrical properties of $In_2O_3$ nanoparticle ReRAM such as current-voltage curve, operation speed and retention discussed for applictions of transparent and flexible hybrid ReRAM device.

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