• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.154-155
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• 2010

최근 Stranski-Krastanov (SK) 성장법을 이용한 자발형성 (Self-assembled) InAs/GaAs 양자점 (Quantum Dot) 연구가 기초 물리학뿐만 아니라 응용에 있어 활발하게 진행되고 있다. 그러나 기존 보고에 따르면 SK 성장법을 통한 InAs/GaAs 양자점은 크기, 균일도, 및 밀도 등의 성장거동 제어에 한계가 있다. 예로, 성장속도 및 증착양이 감소하더라도 상대적으로 크기가 큰 InAs/GaAs 클러스터 (Cluster)를 형성하여 크기분포의 불균일 및 결함을 야기하여 결과적으로 전기/광학적 특성을 저해하는 요인이 된다. 이를 개선하기 위한 방안으로 SK 성장법을 변형한 다양한 수정자발형성법이 제안되어 연구되고 있다. 본 논문에서는 기존 SK 성장법과 Arsenic-interruption Technique(AIT), In Pre-deposition (IPD)법을 각각 접목한 수정자발형성법을 이용하여 상대적으로 크기가 큰 InAs/GaAs 양자점 또는 클러스터 형성을 감소시켜 공간적 크기 균일도 및 밀도를 제어한 결과를 보고한다. 성장된 InAs/GaAs 양자점 시료의 구조 및 광학적 특성을 원자력간현미경 (Artomic Force Microscopy, AFM)과 Photoluminescence (PL) 분광법을 이용하여 분석하였다. 기존 SK 성장법을 이용하여 형성한 기준시료의 AFM 이미지에서 InAs/GaAs 양자점과 클러스터의 공간밀도는 각각 6.4*1010/cm2와 1.4*109/cm2로 관찰되었다. 그러나, AIT를 이용한 양자점 시료의 경우 상대적으로 크기가 큰 InAs/GaAs 클러스터는 관찰되어지지 않았고, 양자점 밀도는 8.4*1010/cm2로 SK 양자점에 비하여 30% 정도 개선되었다. 또한, InAs/GaAs 클러스터를 제외한 공간 균일도는 SK-InAs/GaAs 양자점의 15.6%에 비하여 8%로 크게 개선된 결과를 얻었다. AIT 성장법을 이용한 InAs/GaAs 양자점에서 원자의 이동거리 (Migration Length)의 제어로 양자점의 형성특성이 개선된 것으로 설명할 수 있으며, Arsenic 차단 시간이 임계점 이상으로 길어지면 다시 InAs/GaAs 클러스터들이 형성되는 것을 관찰할 수 있었다. InAs/GaAs 양자점과 클러스터 형성 특성이 초기 표면 조건에 어떻게 영향을 받는지 분석하기 위해, InAs 양자점 성장 이전에 V족 물질 공급 없이 Indium의 공급시간을 1초(IPDT1S 시료), 2초 (IPDT2S 시료), 3초 (IPDT1S 시료)로 변화시키면서 증착하고 기존 SK 성장법으로 양자점을 성장하였다 (IPD성장법). 그 결과 IDP1S 양자점 시료의 공간밀도가 10*1010/cm2로 SK InAs/GaAs 양자점 시료에 비해 약 60% 정도 증가하였고, 클러스터도 관찰 할 수 없었다. 그러나 IPD 시간이 증가할수록 다시 InAs/GaAs 클러스터들이 형성되는 것을 관찰할 수 있었다. 이러한 결과는 InAs/GaAs 양자점 성장초기에 InAs 핵생성 사이트 (Nucleation site)의 크기 및 상태를 제어하는 것이 양자점의 밀도 및 균일도를 제어하는 중요한 요소임을 알 수 있다.

• Applied Chemistry for Engineering
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• v.28 no.5
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• pp.547-553
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• 2017

This study focused on the difference of photocatalytic performance by the incorporation of Pd into the $TiO_2$ framework and suggested five different catalysts composed of $TiO_2$ and x mol% $Pd-TiO_2$ (x = 0.25, 0.5, 0.75, and 1.0). A typical sol-gel method was used to synthesize catalysts, and the phenol photodegradation performance of each catalysts was evaluated. The physicochemical and optical properties of catalysts were confirmed by X-ray diffraction (XRD), transmission electron microscopy (TEM), scanning electron microscopy/energy dispersive spectrometer (SEM/EDS), ultraviolet/visible spectroscopy (UV/Vis), photoluminescence spectroscopy (PL), and photocurrent measurements. With the addition of Pd ions, the band gap of catalysts was shortened and the charge separation between photogenerated electrons and holes easily also occurred. As a result, the phenol photo-destruction performance over 0.75 mol% $Pd-TiO_2$ catalyst was 3 times higher than that of pure $TiO_2$. This is believed to be due to Pd ions acted as an electron capturing function during photocatalysis.

• Korean Chemical Engineering Research
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• v.40 no.6
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• pp.752-756
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• 2002

Green-emitting $Zn_2SiO_4:Mn$ phosphors for PDP(Plasma Display Panel) application were synthesized by colloidal seed-assisted spray pyrolysis process. The codoping with $Gd^{3+}/Li^+$, which replaces $Si^{4+}$ site in the willemite structure, was performed to improve the luminous properties of the $Zn_2SiO_4:Mn$ phosphors. The particles prepared by spray pyrolysis process using fumed silica colloidal solution had a spherical shape, small particle size, narrow size distribution, and non-aggregation characteristics. The $Gd^{3+}/Li^+$ codoping amount affected the luminous characteristics of $Zn_2SiO_4:Mn$ phosphors. The codoping with proper amounts of $Gd^{3+}/Li^+$ improved both the photoluminescence efficiency and decay time of $Zn_2SiO_4:Mn$ phosphor particles. In spray pyrolysis, the post-treatment temperature is another factor controlling the luminous performance of $Zn_2SiO_4:Mn$ phosphors. The $Zn_{1.9}SiO_4:Mn_{0.1}$ phosphor particles containing 0.1 mol% $Gd^{3+}/Li^+$ co-dopant had a 5% higher PL intensity than the commercial product and 5.7 ms decay time after post-treatment at $1,145^{\circ}C$.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.293-294
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• 2011

It is known that semiconductor quantum-dot (QD) heterostructures have superior zero-dimensional quantum confinement, and they have been successfully applied to semiconductor laser diodes (QDLDs) for optical communication and infrared photodetectors (QDIPs) for thermal images [1]. The self-assembled QDs are normally formed at Stranski-Krastanov (S-K) growth mode utilizing the accumulated strain due to lattice-mismatch existing at heterointerfaces between QDs and cap layers. In order to increase the areal density and the number of stacks of QDs, recently, sub-monolayer (SML)-thick QDs (SQDs) with reduced strain were tried by equivalent thicknesses thinner than a wetting layer (WL) existing in conventional QDs (CQDs) by S-K mode. Despite that it is very different from CQDs with a well-defined WL, the SQD structure has been successfully applied to QDIP[2]. In this study, optical characteristics are investigated by using photoluminescence (PL) spectra taken from self-assembled InAs/GaAs QDs whose coverage are changing from submonolayer to a few monolayers. The QD structures were grown by using molecular beam epitaxy (MBE) on semi-insulating GaAs (100) substrates, and formed at a substrate temperature of 480$^{\circ}C$ followed by covering GaAs cap layer at 590$^{\circ}C$. We prepared six 10-period-stacked QD samples with different InAs coverages and thicknesses of GaAs spacer layers. In the QD coverage below WL thickness (~1.7 ML), the majority of SQDs with no WL coexisted with a small amount of CQDs with a WL, and multi-peak spectra changed to a single peak profile. A transition from SQDs to CQDs was found before and after a WL formation, and the sublevel of SQDs peaking at (1.32${\pm}$0.1) eV was much closer to the GaAs bandedge than that of CQDs (~1.2 eV). These revealed that QDs with no WL could be formed by near-ML coverage in InAs/GaAs system, and single-mode SQDs could be achieved by 1.5 ML just below WL that a strain field was entirely uniform.

• Journal of the Korean Chemical Society
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• v.44 no.5
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• pp.453-459
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• 2000

FED has deserved an intensive attentioD as a new flat panel display. The present investigationaims at undemtanding the photoluminescence and cathodoluminescent properties of hGaO$_3$: $Eu^{3+}$ phosphor bytaking into account the possibility that this phosphor could be applied for FED. In onler to investigate on.sucha detailed behavior; 8everM experimental skil18 Je conducted to the LaGaO$_3$:$Eu^{3+}$ phosphoL The excimtion srectrum artd emission spectmn were rnezsured in the UV range and then decay curve of $^5D_0$+$^7F_j$transitions\vas examined. The decay behavior of $^5D_0$ emission was anMyzed by a newly Iuoposed cross-relaxation mech-ani8In in asswiation with inteFwnter di1ffision (or migration). The cross-mlaxation from $^5D_0$ to CTB (Cha'geTransfer Band) wuld be a quite retsonable by considering the excitation spectrum. It could be also found thatthe quenching type was changed from ditfrsion controlled process to the direct quenching process -s inJeasing $Eu^{3+}$ oncntration.

• Korean Journal of Materials Research
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• v.3 no.5
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• pp.443-450
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• 1993

Self-alignment gatc Schottky contact structure on Si- implanted GaAs was formed by plasma enhanced chemical vapor dcposirion. Tungsten nitride thin films (ahclut 1600$\AA$) \vcre dopositcd on GaAs at $350^{\circ}C$ in order to fahricarc GaAs 1Cs and ttwn rapidly annealed at $750^{\circ}C$ to $900^{\circ}C$. Thermal charac tcristics of PECVD)-$W_{67}N_{43}$/GaAs structure were investigated by X-ray diffraction, photolumintesccnce. and optical deep level transient specrroscopy. Results revealed that $W_{67}N_{33}$ gate was more thermally sta ble with GaAs substrate than W gate and Si atoms implanted In $W_{67}N_{33}$/GaAs structure became morr active than those In W/GaAs after annealing. I-V characteristics of $W_{67}N_{33}$/GaAs diod c exhibired a nearly ideal diode behavior. The termal stability of $W_{67}N_{33}$/GaAs diode was better than that of W/GaAs diode with the post annealing at temperatures from 800 to $900^{\circ}C$ for 20s without As overpressure.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.20 no.4
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• pp.164-167
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• 2010

Bulk GaN single crystal with 1.5 mm thickness was successfully grown by hydride vapor phase epitaxy (HVPE) technique. Free-standing GaN substrates of $10{\times}10,\;15{\times}15$ mm size were fabricate after lift-off of sapphire substrate and their optical properties were characterized properties for device applications. X-ray diffraction patterns showed (002) and (004) peak, and the FWHM of the X-ray rocking curve (XRC) measurement in (002) was 98 arcsec. A sharp photoluminescence spectrum at 363 nm was observed and defect spectrum at visible range was not detected. The hexagonal-shaped etch-pits are formed on the GaN surface in $200^{\circ}C\;H_3PO_4$ at 5 minutes. The defect density calculated from observed etch-pits on surface was around $5{\times}10^6/cm^2$. This indicates that the fabricated GaN substrates can be used for applications in the field of optodevice, and high power electronics.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.12
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• pp.11-17
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• 2000

We investigated the growth of InGaN/GaN multiple quantum wells (MQWs) structures which emit blue light. The samples were grown in a low pressure metalorganic chemical vapor deposition system. We examined InGaN/GaN MQWs by varying growth temperatures and thicknesses of InGaN well and GaN barrier layers in MQWs. Especially, the thickness of GaN barrier in InGaN/GaN MQWs was found to severely affect the interfacial abruptness between InGaN well and GaN barrier layers. The higher order satellite peaks in the high resolution x-ray diffraction spectra and the high resolution cross sectional transmission electron microscope image of MQW structrues revealed that the interface between InGaN and GaN layers was very abrupt. Room-temperature photoluminescence spectra also showed a blue emission from InGaN/GaN MQWs at the wavelength of 463.5nm with a narrow full width at half maximum of 72.6meV.

• Journal of the Korean Vacuum Society
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• v.19 no.4
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• pp.281-286
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• 2010

Thickness effects on the structural and optical properties of ZnO thin films fabricated by spin coating method have been carried out. With increase in the thickness of the ZnO thin films, the width and density of striation shape are increased. The ZnO thin film with thickness of 450 nm has a smooth surface morphology. For the ZnO thin film with a smooth surface, orientation factor ${\alpha}_{(002)}$ is sharply increased and FWHM of (002) diffraction peak is decreased compared to the ZnO thin films with a striation shape surface. Thickness and surface morphology of the ZnO thin films hardly affect the NBE peak position. However, the DLE peak position is blue-shifted as the surface morphology is changed from striation to smooth surface. The PL intensity ratio of the NBE to DLE is increased and the FWHM of NBE peak is decreased as the thickness of the ZnO thin films is increased.

• Korean Journal of Materials Research
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• v.8 no.8
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• pp.737-743
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• 1998

The synthesis of $SrAI_2O_4:Eu^{2+}$ phosphor and its properties of both photoluminescence and long-phosphorescent were investigated as a function of sintering condition. Single phase of $SrAl_2O_4$ was obtained by sintering the mixtures of $SrCO_3$, $Eu_2O_3$, $AI_2O_34 and 3wt% $B_2O_3$ powders over 100$0^{\circ}C$ in Ar/H2 atmosphere. The optimum sintering condition for the long-phosphorescent phosphor of $SrAI_2O_4:Eu^{2+}$ was found at 130$0^{\circ}C$ for 3hours. The PL emission spectrum of $SrAI_2O_4:Eu^{2+}$ shows a maximum peak intensity at 520nm(2.384eV) with a broad emission extending from 450 to 650nm which resulted from the $4f^65d^1$$\rightarrow$$4f^7$ transition of $Eu^{+2}$ under 360nm exitation. Monitored at 520nm. the excita¬tion spectrum of $SrAI_2O_4:Eu^{2+}$ exhibits a maximum peak intensity at 360nm (3.44eV) with a broad absorption band extending from 250 to 480nm.