• 한국신뢰성학회지:신뢰성응용연구
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• 제4권2호
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• pp.121-131
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• 2004

HALT (Highly Accelerated Life Test) was performed to improve the reliability by removing the potential failure for newly developing PCB used for the vibration condition from 2OHz to 2OOHz. During HALT, it is found that the lead of Al electrolytic capacitor of SMD type is detached from PCB. As the result for the failure analysis and FEM (Finite Element Method), it is clarified that the root cause for this failure is the improper attachment of an Al electrolytic capacitor on PCB by the mistake of a PCB design. HALT was performed in previous condition to verify the failure analysis after molding an epoxy resin to overcome the PCB design mistake and it is not observed the same failure. Therefore, it is assumed that the same failure in field will be not occurred by the proper implementation.

• 한국신뢰성학회지:신뢰성응용연구
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• 제12권3호
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• pp.153-163
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• 2012

Recently, as a electronic components are becoming more high-density, so that electronic circuits have smaller pitches between the leads and are more vulnerable to insulation failure. And the reliability of electric insulation has become an ever important issue as device contact pitches and print patterns shrink. Ion migration occurs in highly humid environment as voltage is applied to an installed print circuit. Under highly humid and voltage applied circumstances, electronic components respond to applied voltages by electrochemical ionization of metals, and a conducting filament forms between the anode and cathode across a nonmetallic medium. This leads to short-circuit failure of the electronic component. In thesis, we study acceleration test of ion migration in FR-4 PCB plated with Sn. Voltage applied test of FR-4 PCB circuits plated with Sn was tested in the temperature and humidity environments. As a result of this test, equation of acceleration model was derived.

• 한국재료학회지
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• 제15권1호
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• pp.54-60
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• 2005

Recently a lots of problems have observed in high densified and high integrated electronic components. One of them is ion migration phenomena, which induce the electrical short of electrical circuit. ion migration phenomena has been observed in the field of exposing the specific environment and using for a long tin e. This study was evaluated the generation time of ion migration and was investigated properly test method through water drop test and high temperature high humidity test. Also we observed direct causes and confirmed generation mechanism of dendritic growth as we reproduced the ion migration phenomena. We utilized PCB(printed circuit board) having a comb pattern as follows 0.5, 1.0, 2.0 mm pattern distance. Cu, SnPb and Au were electroplated on the comb pattern. 6.5 V and 15 V were applied in the comb pattern and then we measured the electrical short time causing by ion migration. In these results, we examined a difference of ion migration time depending on pattern materials, applied voltage and pattern spacing of PCB conductor.

• 동력기계공학회지
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• 제9권1호
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• pp.64-69
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• 2005

In evaluation of electronic reliability on the PCB(Print Circuit Borad),electrochemical migration is one of main test objects. The phenomenon of electrochemical migration occurs in the environment of the hight humidity and the hight temperature under bias through a continuous aqueous electrolyte. In this paper, the generating mechanism of electrochemical migration is investigated by using water drop acceleration test under various waters. The waters used in the water drop test are city water, distilled water and ionic water. It found that the generated velocity of electrochemical migration depended on electrolyte quantity which included in the various waters.

• Journal of Welding and Joining
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• 제18권2호
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• pp.222-222
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• 2000

PBGA(Plastic Ball Grid Array) is composed of some materials such as PCB(Printed Circuit Board), epoxy molding compound, die attach and so on. Reliability of PBGA package is weak compared with plastic packages. The weak points of reliability are the lower resistance to popcorn cracking, which is induced by moisture absorption in PCB, and the pressure cooker test corrosion, which is the basic problem due to the material characteristics of PCB. Introducing the PCB baking and the plasma treatment cleared the popcorn cracking phenomenon. The PCB baking and plasma treatment reduced the epoxy void by eliminating the source of moisture vaporization during the epoxy curing and enhanced the adhesion between PCB and epoxy. Also, plasma treatment enhanced the wettability of epoxy on PCB. The problem of corrosion is cleared using multi-functional epoxy. This type of EMC(Epoxy Molding Compound) is recommended in package using PCB as a substrate. (Received November 19, 1999)

• Journal of Welding and Joining
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• 제18권2호
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• pp.95-99
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• 2000

PBGA(Plastic Ball Grid Array) is composed of some materials such as PCB(Printed Circuit Board), epoxy molding compound, die attach and so on. Reliability of PBGA package is weak compared with plastic packages. The weak points of reliability are the lower resistance to popcorn cracking, which is induced by moisture absorption in PCB, and the pressure cooker test corrosion, which is the basic problem due to the material characteristics of PCB. Introducing the PCB banking and the plasma treatment cleared the popcorn cracking phenomenon. The PCB banking and plasma treatment reduced the epoxy void by eliminating the source of moisture vaporization during the epoxy curing and enhanced the adhesion between PCB and epoxy. Also, plasma treatment enhanced the wettability of epoxy on PCB. The problem of corrosion is cleared using multi-functional epoxy. This type of EMC(Epoxy Molding Compound) is recommended in package using PCB as a substrate.

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2011년도 춘계학술발표대회 논문집
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• pp.119-123
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• 2011

Through the test of ESD(Electro Static Discharge) for PCB circuit, we are able to research on the ESD effect. This paper also study on the ESD test method for measurement. It is interesting to compare their characteristics on and the other method.

• 한국신뢰성학회지:신뢰성응용연구
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• 제11권3호
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• pp.245-249
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• 2011

Through the test of ESD(Electro Static Discharge) for PCB circuit, we are able to research on the ESD effect. This paper also studys on the ESD test method for measurement. In the measurement of the discharge current, we used current probe(TC-1). The applied voltage to the PCB metal is -3 kV HBM mode. In conclusion ESD influences exponentially greater impact in nearer PCB circuit.

• 마이크로전자및패키징학회지
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• 제27권1호
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• pp.45-54
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• 2020

최근 PCB의 소형화, 박형화 및 고밀도화가 크게 요구되면서 MSAP (Modified Semi Additive Process) 기술을 이용한 SLP (Substrate Like PCB) 기술이 큰 주목을 받고 있다. 특히 SLP 기술은 스마트폰의 고용량 배터리 개발과 5G 기술에 꼭 필요한 기술이다. 본 연구에서는 기존의 HDI 기술과 MSAP 기술을 혼합하여 제작한 하이브리드 방식의 SLP의 신뢰성을 실험과 수치해석을 이용하여 분석하였다. 특히 최적의 SLP 설계를 위하여 프리프레그(prepreg)의 물성, 두께, 층수, 마이크로비아(microvia)의 크기 및 misalignment가 마이크로비아의 신뢰성에 미치는 영향을 IST(Interconnect Stress Test) 시험을 이용한 열사이클링 신뢰성 실험과 유한요소 수치해석을 통하여 고찰하였다. SLP 소재인 프리프레그의 열팽창계수가 적을수록 마이크로비아의 신뢰성은 크게 증가하며, 프리프레그의 두께가 얇을수록 신뢰성이 증가된다. 마이크로비아 홀의 크기 및 패드의 크기가 증가하면 응력이 완화되어 신뢰성은 향상된다. 반면 프리프레그의 층수가 증가할수록 마이크로비아의 신뢰성은 감소된다. 또한 misalignment가 크면 신뢰성은 감소하였다. 특히 이들 인자들 중에서 프리프레그의 열팽창계수가 마이크로비아의 신뢰성에 가장 큰 영향을 미친다. 수치 응력해석 결과도 실험 결과와 잘 일치하였으며, 응력이 낮을수록 마이크로비아의 신뢰성은 증가하였다. 본 실험과 수치해석의 결과는 향후 SLP 기판 제작 및 신뢰성 향상을 위한 유용한 설계 가이드라인으로 활용될 것으로 판단된다.

• 한국신뢰성학회지:신뢰성응용연구
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• 제9권3호
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• pp.259-274
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• 2009

Printed circuit boards for RAM are widely used in modern electronics such as computers, artificial satellites and consumer durables. They are exposed to a very diverse environment and consists of many complicated components and therefore needs careful approach to the enhancement and assessment of reliability of the item. In this article reliability standards for PCBs for RAM are established in terms of quality certification tests and failure rate tests.