• Title/Summary/Keyword: Organic TFT

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유기 박막 트랜지스터 (Organic TFT)의 유기 활성층 기술 동향

  • 장상웅;최준환;윤호규;이주원;주병권;김재경
    • Electrical & Electronic Materials
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    • v.17 no.8
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    • pp.3-12
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    • 2004
  • 유기 박막 트랜지스터 (Organic Thin film Transistors ; 이하 OTFT)는 1986년부터(1) 반도체 장치의 새로운 부류로 급속하게 발전해 오고 있다. 반도체 산업에 있어 이러한 유기물질의 큰 발전은 1947년에 있었던 최초의 inorganic FET (Field Effect Transistor) 탄생에 버금갈 만한 성과라고 여겨진다.(중략)

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X-shaped Conjugated Organic Materials for High-mobility Thin Film Transistor

  • Choi, Dong-Hoon;Park, Chan-Eon
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.310-311
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    • 2009
  • New X-shaped crystalline molecules have been synthesized through various coupling reactions and their electronic properties were investigated. They exhibit good solubility in common organic solvents and good self-film forming properties. They are intrinsically crystalline as they exhibit well-defined X-ray diffraction patterns from uniform and preferred orientations of molecules. They also exhibited high field effect mobilities in thin film transistor (TFT) and good device performances.

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Study on the structure and morphology of vacuum-evaporated pentacene as a function of the evaporation condition

  • Chang, Jae-Won;Kim, Hoon;Kim, Jai-Kyeong;Lee, Yun-Hi;Oh, Myung-Hwan;Jang, Jin;Ju, Byeong-Kwon
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.754-758
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    • 2002
  • In order to reach the high quality of organic thin films such as high mobility for device applications, it is strongly desirable to study the growth properties of pentacene film as a function of evaporation condition. Here, we report the structure and morphology of thermal evaporated pentacene thin film by AFM, SEM, and XRD as a function of the evaporation rate and substrate temperature. These results play a key role in determining the electric performance of organic thin film transistor devices.

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Determination of optical constants and thickness of organic electroluminescence films using variable angle spectroscopic ellipsometry (가변입사각 분광타원법을 이용한 유기 발광 박막의 광학 상수 및 두께 결정)

  • 류장위;김상열;김동현;정혜인
    • Proceedings of the Optical Society of Korea Conference
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    • 2001.02a
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    • pp.264-265
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    • 2001
  • 영상표시방법은 관례적인 CRT 방법에 더하여 LCD, TFT-LCD, FED, PDP 등 다양한 방법들이 개발되었거나 개발되고 있다. 유기발광소자(OLED)를 이용한 영상표시법도 최근 그 실용성이 크게 향상된 방법으로 이 OLED를 이용하는 발광소자는 LCD, TFT-LCD 등의 방법과 마찬가지로 다층박막구조를 가지므로 각 박막층의 특성과 계면 급준성 등을 정확하게 평가하는 것은 긴요하다 하겠다. (중략)

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ZnO Thin Film Transistor Prepared from ALD with an Organic Gate Dielectric

  • Choi, Woon-Seop
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.543-545
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    • 2009
  • With injection-type source delivery system of atomic layer deposition (ALD), bottom-contact and bottom-gate thin-film transistors (TFTs) were fabricated with a poly-4-vinyphenol polymeric dielectric for the first time. The properties of the ZnO TFT were greatly influenced by the device structure and the process conditions. The zinc oxide TFTs exhibited a channel mobility of 0.43 $cm^2$/Vs, a threshold voltage of 0.85 V, a subthreshold slope of 3.30 V/dec, and an on-to-off current ratio of above $10^6$ with solid saturation.

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Characteristics of Schottky Barrier Thin Film Transistors (SB-TFTs) with PtSi Source/Drain on glass substrate

  • O, Jun-Seok;Jo, Won-Ju
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.08a
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    • pp.199-199
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    • 2010
  • 최근 평판 디스플레이 산업의 발전에 따라 능동행렬 액정 표시 소자 (AMOLED : Active Matrix Organic Liquid Crystral Display) 가 차세대 디스플레이 분야에서 각광을 받고있다. 기존의 TFT-LCD에 사용되는 a-Si:H는 균일도가 좋지만 전기적인 스트레스에 의해 쉽게 열화되고 낮은 이동도는 갖는 단점이 있으며, ELA (Eximer Laser Annealing) 결정화 poly-Si은 전기적인 특성은 좋지만 uniformity가 떨어지는 단점을 가지고 있어서 AMOLED 및 대면적 디스플레이에 적용하기 어렵다. 따라서 a-Si:H TFT보다 좋은 전기적인 특성을 보이며 ELA 결정화 poly-Si TFT보다 좋은 uniformity를 갖는 SPC (Solid Phase Crystallization) poly-Si TFT가 주목을 받고있다. 본 연구에서는 차세대 디스플레이 적용을 위해서 glass 기판위에 증착된 a-Si을 SPC 로 결정화 시킨 후 TFT를 제작하고 평가하였다. 또한 TFT 형성시에 저온공정을 실현하기 위해서 소스/드레인 영역에 실리사이드를 형성시켰다. 소자 제작시의 최고온도는 $500^{\circ}C$ 이하에서 공정을 진행하는 저온 공정을 실현하였다. Glass 기판위에 a-Si이 80 nm 증착된 기판을 퍼니스에서 24시간 동안 N2 분위기로 약 $600^{\circ}C$ 에서 결정화를 진행하였다. 노광공정을 통하여 Active 영역을 형성시키고 E-beam evaporator를 이용하여 약 70 nm 의 Pt를 증착시킨 후, 소스와 드레인 영역의 실리사이드 형성은 N2 분위기에서 $450^{\circ}C$, $500^{\circ}C$, $550^{\circ}C$에서 열처리를 통하여 형성하였다. 게이트 절연막은 스퍼터링을 이용하여 SiO2를 약 15 nm 의 두께로 증착하였다. 게이트 전극의 형성을 위하여 E-beam evaporator 을 이용하여 약 150 nm 두께의 알루미늄을 증착하고 노광공정을 통하여 게이트 영역을 형성 후 에 $450^{\circ}C$, H2/N2 분위기에서 약 30분 동안 forming gas annealing (FGA)을 실시하였다. 제작된 소자는 실리사이드 형성 온도에 따라서 각각 다른 특성을 보였으며 $450^{\circ}C$에서 실리사이드를 형성시킨 소자는 on currnet와 SS (Subthreshold Swing)이 가장 낮은것을 확인하였다. $500^{\circ}C$$550^{\circ}C$에서 실리사이드를 형성시킨 소자는 거의 동일한 on current와 SS값을 나타냈다. 이로써 glass 기판위의 SB-TFT 제작 시 실리사이드 형성의 최적온도는 $500^{\circ}C$로 생각되어 진다. 위의 결과를 토대로 본 연구에서는 SPC 결정화 방법을 이용하여 SB-TFT를 성공적으로 제작 및 평가하였고, 차세대 디스플레이에 적용할 경우 우수한 특성이 기대된다.

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Development of IGZO TFTs and Their Applications to Next-Generation Flat-Panel Displays

  • Hsieh, Hsing-Hung;Lu, Hsiung-Hsing;Ting, Hung-Che;Chuang, Ching-Sang;Chen, Chia-Yu;Lin, Yusin
    • Journal of Information Display
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    • v.11 no.4
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    • pp.160-164
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    • 2010
  • Organic light-emitting devices (OLEDs) have shown superior characteristics and are expected to dominate the nextgeneration flat-panel displays. Active-matrix organic light-emitting diode (AMOLED) displays, however, have stringent demands on the performance of the backplane. In this paper, the development of thin-film transistors (TFTs) based on indium gallium zinc oxide (IGZO) on both Gen 1 and 6 glasses, and their decent characteristics, which meet the AMOLED requirements, are shown. Further, several display prototypes (e.g., 2.4" AMOLED, 2.4" transparent AMOLED, and 32" AMLCD) using IGZO TFTs are demonstrated to confirm that they can indeed be strong candidates for the next-generation TFT technology not only of AMOLED but also of AMLCD (active-matrix liquid crystal display).

Photo-Leakage Currents in Organic Thin-Film Transistor

  • Cho, Sang-Mi;Han, Seung-Hoon;Kim, Jun-Hee;Lee, Sun-Hee;Choo, Dong-June;Uchiike, H.;Oh, Myung-Hwan;Jang, Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1386-1389
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    • 2005
  • We report the light illumination effect on the performance of pentacene organic thin-film transistor (OTFT). The TFT performance with and without illumination were measured at various temperatures. The off-state currents increase linearly with light intensity in the region of gate voltage where the holes are majority carriers in the TFT channel. The minimum photocurrents of OTFT increase with increasing light intensity.

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A New AMOLED Pixel Structure Compensating Threshold Voltage of TFT for Large-Sized and High Resolution Display (대면적 고해상도를 위한 AMOLED(Active Matrix Organic Light Emitting Diode)의 문턱전압 보상회로)

  • Ryu, Jang-Woo;Jung, Min-Chul;Hwang, Sang-Joon;Sung, Man-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.529-530
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    • 2005
  • A voltage driving AMOLED(Active Matrix Organic Light Emitting Diode) is useful for large-sized, high resolution OLED display. The conventional 2-TFTs, 1-CAP AMOLED circuit suffer from the threshold voltage variation of TFT. In this paper, a new AMOLED structure is proposed. It is composed of 5-TFTs and 2-capacitors. It is described that the operating principle and the characteristics of the proposed structure and is verified the performance by HSPICE simulation. The result of simulation shows that the effect of the threshold voltage variation in this circuit, is able to neglect.

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Improvement of Hysteresis Characteristics of Low Temperature Poly-Si TFTs (저온 Poly-Si TFT 소자의 Hysteresis 특성 개선)

  • Chung, Hoon-Ju;Cho, Bong-Rae;Kim, Byeong-Koo
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.2 no.1
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    • pp.3-9
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    • 2009
  • Although Active matrix organic light emitting diode (AMOLED) display has a better image quality in terms of viewing angle, contrast ratio, and response time than liquid crystal displays (LCDs), it still has some critical issues such as lifetime, residual images, and brightness non-uniformity due to non-uniformity in electrical characteristics of driving TFTs and IR drops on supplied power line. Among them, we improved irrecoverable residual images of AMOLED displays which is mainly related to the hysteresis characteristics of driving TFTs. We consider four kinds of surface treatment conditions before gate oxide deposition for improving hysteresis characteristics. We can reduce the hysteresis level of p-channel TFT to 0.23 V, interface trap states between the poly-Si layer and gate insulator to $3.11{\times}10^{11}cm^{-2}$, and output current variation of p-channel TFT to 3.65 % through the surface treatment using ultraviolet light and H2 plasma. Therefore, the recoverable residual image problem of AMOLED displays can be improved by surface treatment using ultraviolet light and $H_2$ plasma.

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