• Title/Summary/Keyword: Optical microscopy

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Atomic-scale Controlled Epitaxial Growth and Characterization of Oxide Thin Films

  • Yang, G.Z.;Lu, H.B.;Chen, F.;Zhao, T.;Chen, Z.H.
    • Proceedings of the Optical Society of Korea Conference
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    • 2001.02a
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    • pp.6-11
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    • 2001
  • More than ten kinds of oxide thin films and their heterostructure have been successfully fabricated on SrTiO$_3$(001) substrates by laser molecular beam epitaxy (laser MBE). Measurements of atomic force microscopy (AFM), high-resolution transmission electron microscopy (HRTEM) and X-ray small-angle reflectivity reveal that the surfaces and interfaces are atom-level-smooth. The unit cell layers and the lattice structure are perfect. The electrical and optical properties of BaTiO$_3$-x thin films and BaTiO$_3$/SrTiO$_3$ (BTO/STO) superlattices were examined. The all-perovskite oxide P-N junctions have been successfully fabricated and the better I-V curves were observed.

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Three Dimensional Shape Measurement of a Micro Fresnel Lens with In-line Phase-shifting Digital Holographic Microscopy

  • Kang, Jeon-Woong;Hong, Chung-Ki
    • Journal of the Optical Society of Korea
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    • v.10 no.4
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    • pp.178-183
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    • 2006
  • An in-line phase-shifting digital holographic microscopy system was constructed by inserting a conventional microscope in the object arm of a Mach-Zehnder interferometer. It was used to measure the three dimensional shape of a micro Fresnel lens. It was also shown that both the lateral and the axial resolutions of the in-line phase-shifting system using a self-calibration algorithm were superior to those of the best off-axis system.

Optical Scanning Holography - A Review of Recent Progress

  • Poon, Ting-Chung
    • Journal of the Optical Society of Korea
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    • v.13 no.4
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    • pp.406-415
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    • 2009
  • Optical scanning holography (OSH) is a distinct digital holographic technique in that real-time holographic recording a three-dimensional (3-D) object can be acquired by using two-dimensional active optical heterodyne scanning. Applications of the technique so far have included optical scanning cryptography, optical scanning microscopy, 3-D pattern recognition, 3-D holographic TV, and 3-D optical remote sensing. This paper reviews some of the recent progress in OSH. Some possible further works are also discussed.

Three-dimensional Information and Refractive Index Measurement Using a Dual-wavelength Digital Holographic

  • Shin, Sang-Hoon;Yu, Young-Hun
    • Journal of the Optical Society of Korea
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    • v.13 no.2
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    • pp.173-177
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    • 2009
  • Digital holographic microscopy allows optical path difference measurement. Optical path difference depends on the both refractive index and morphology of sample. We developed a dual-wavelength in-line digital holographic microscope that can measure simultaneously the refractive index and morphology of a sample, providing highly precise three-dimensional information. Here we propose theoretical and experimental methods for dual-wavelength in-line digital holographic microscopy. The measured data were reasonable, although there was data error. By improving the experimental method, we could measure the refractive index more precisely and obtain more accurate three-dimensional information on samples.

Background-noise Reduction for Fourier Ptychographic Microscopy Based on an Improved Thresholding Method

  • Hou, Lexin;Wang, Hexin;Wang, Junhua;Xu, Min
    • Current Optics and Photonics
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    • v.2 no.2
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    • pp.165-171
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    • 2018
  • Fourier ptychographic microscopy (FPM) is a recently proposed computational imaging method that achieves both high resolution (HR) and wide field of view. In the FPM framework, a series of low-resolution (LR) images at different illumination angles is used for high-resolution image reconstruction. On the basis of previous research, image noise can significantly degrade the FPM reconstruction result. Since the captured LR images contain a lot of dark-field images with low signal-to-noise ratio, it is very important to apply a noise-reduction process to the FPM raw dataset. However, the thresholding method commonly used for the FPM data preprocessing cannot separate signals from background noise effectively. In this work, we propose an improved thresholding method that provides a reliable background-noise threshold for noise reduction. Experimental results show that the proposed method is more efficient and robust than the conventional thresholding method.

Hot stage microscopy and its applications in pharmaceutical characterization

  • Arun Kumar;Pritam Singh;Arun Nanda
    • Applied Microscopy
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    • v.50
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    • pp.12.1-12.11
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    • 2020
  • Hot stage microscopy (HSM) is a thermal analysis technique that combines the best properties of thermal analysis and microscopy. HSM is rapidly gaining interest in pharmaceuticals as well as in other fields as a regular characterization technique. In pharmaceuticals HSM is used to support differential scanning calorimetry (DSC) and thermo-gravimetric analysis (TGA) observations and to detect small changes in the sample that may be missed by DSC and TGA during a thermal experiment. Study of various physical and chemical properties such sample morphology, crystalline nature, polymorphism, desolvation, miscibility, melting, solid state transitions and incompatibility between various pharmaceutical compounds can be carried out using HSM. HSM is also widely used to screen cocrystals, excipients and polymers for solid dispersions. With the advancements in research methodologies, it is now possible to use HSM in conjunction with other characterization techniques such as Fourier transform infrared spectroscopy (FTIR), DSC, Raman spectroscopy, scanning electron microscopy (SEM) which may have additional benefits over traditional characterization techniques for rapid and comprehensive solid state characterization.