• Korean Journal of Optics and Photonics
• /
• v.20 no.1
• /
• pp.29-33
• /
• 2009

We propose a new measuring technique based on optical low-coherence reflectometry that enables us to determine the refractive index and the geometrical thickness of a transparent sample by one-time scanning only. By passing a collimated beam having a finite size through the edge of the sample, the refractive index and the geometrical thickness can be determined simultaneously from the comparison of interferograms generated by two kinds of reflected beams. In this study, a refractive index could be determined with the accuracy of $10^{-3}$, and its accuracy would be enhanced by using a more precise translator and a thicker sample.