• 제목/요약/키워드: Optical control layer

검색결과 160건 처리시간 0.027초

LCD with Tunable Viewing Angle by Thermal Modulation of Optical Layer

  • Gwag, Jin-Seog;Lee, You-Jin;Han, In-Young;Yu, Chang-Jae;Kim, Jae-Hoon
    • Journal of Information Display
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    • 제10권1호
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    • pp.19-23
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    • 2009
  • In this paper, we review the proposed liquid crystal display (LCD) with a tunable viewing angle consisting of a conventional liquid crystal display (LCD) panel and a thermally variable retardation layer (TVRL) characterized by uniformly aligned LC film with transparent indium-tin-oxide electrodes for Joule heating. In the TVRL, nematic phase is transitioned into isotropic by Joule heating. The numerical calculation showed that the intrinsic wide viewing angle was achieved at the isotropic phase of the TVRL by Joule heating, whereas the narrow viewing angle was obtained at the nematic phase of the TVRL. The simulated and experimental results of the proposed LCD show continuous and symmetrical viewing angle characteristics by tuning the retardation of TVRL using Joule heating. The structure of the viewing angle control proposed here is adoptable to all LCD modes with wide viewing angle characteristics.

The Influence of Rapid Thermal Annealing Processed Metal-Semiconductor Contact on Plasmonic Waveguide Under Electrical Pumping

  • Lu, Yang;Zhang, Hui;Mei, Ting
    • Journal of the Optical Society of Korea
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    • 제20권1호
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    • pp.130-134
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    • 2016
  • The influence of Au/Ni-based contact formed on a lightly-doped (7.3×1017cm−3, Zn-doped) InGaAsP layer for electrical compensation of surface plasmon polariton (SPP) propagation under various rapid thermal annealing (RTA) conditions has been studied. The active control of SPP propagation is realized by electrically pumping the InGaAsP multiple quantum wells (MQWs) beneath the metal planar waveguide. The metal planar film acts as the electric contact layer and SPP waveguide, simultaneously. The RTA process can lower the metal-semiconductor electric contact resistance. Nevertheless, it inevitably increases the contact interface morphological roughness, which is detrimental to SPP propagation. Based on this dilemma, in this work we focus on studying the influence of RTA conditions on electrical control of SPPs. The experimental results indicate that there is obvious degradation of electrical pumping compensation for SPP propagation loss in the devices annealed at 400℃ compared to those with no annealing treatment. With increasing annealing duration time, more significant degradation of the active performance is observed even under sufficient current injection. When the annealing temperature is set at 400℃ and the duration time approaches 60s, the SPP propagation is nearly no longer supported as the waveguide surface morphology is severely changed. It seems that eutectic mixture stemming from the RTA process significantly increases the metal film roughness and interferes with the SPP signal propagation.

증착시 및 플라즈마 후처리에 의한 수소 주입이 투명 박막 트랜지스터에서 산화아연 채널층의 물성에 미치는 영향 (Effects of Hydrogen Injection by In-Situ and Plasma Post-Treatment on Properties of a ZnO Channel Layer in Transparent Thin Film Transistors)

  • 방정환;김원;엄현석;박진석
    • 반도체디스플레이기술학회지
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    • 제9권1호
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    • pp.35-40
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    • 2010
  • We have investigated the effects of hydrogen injection via in-situ gas addition ($O_2$, $H_2$, or $O_2$ + $H_2$ gas) and plasma post-treatment (Ar or Ar + H plasma) on material properties of ZnO that is considered to be as a channel layer in transparent thin film transistors. The variations in the electrical resistivity, optical transmittance and bandgap energy, and crystal quality of ZnO thin films were characterized in terms of the methods and conditions used in hydrogen injection. The resistivity was significantly decreased by injection of hydrogen; approximately $10^6\;{\Omega}cm$ for as-grown, $1.2\;{\times}\;10^2\;{\Omega}cm$ for in-situ with $O_2/H_2\;=\;2/3$ addition, and $0.1\;{\Omega}cm$ after Ar + H plasma treatment of 90 min. The average transmittance of ZnO films measured at a wavelength of 400-700 nm was gradually increased by increasing the post-treatment time in Ar + H plasma. The optical bandgap energy of ZnO films was almost monotonically increased by decreasing the $O_2/H_2$ ratio in in-situ gas addition or by increasing the post-treatment time in Ar + H plasma, while the post-treatment using Ar plasma hardly affected the bandgap energy. The role of hydrogen in ZnO was discussed by considering the creation and annihilation of oxygen vacancies as well as the formation of shallow donors by hydrogen.

전면 유기 발광 소자의 유기물층과 반투명 전극의 두께 변화에 따른 광학적 특성 (Organic-layer and semitransparent electrode thickness dependent optical properties of top-emission organic light-emitting diodes)

  • 안희철;주현우;나수환;한원근;김태완;이원재;정동회
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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    • pp.57-58
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    • 2008
  • We have studied an organic layer and semitransparent Al electrode thickness dependent optical properties and microcavity effects for top-emission organic light-emitting diodes. Manufactured top-emission device structure is Al(100nm)/TPD(xnm)/Alq(ynm)/LiF(0.5nm)/Al(25nm). While a thickness of total organic layer was varied from 85nm to 165n, a ratio of those two layers was kept to be about 2:3. Semitransparent Al cathode was varied from 20nm to 30nm for the device with an organic layer total thickness of 140nm. As the thickness of total organic layer increases, the emission spectra show a shift of peak wavelength from 490nm to 580nm, and the full width at half maxima from 90nm to 35nm. The emission spectra show a blue shift as the view angle increases. Emission spectra depending on a transmittance of semitransparent cathode show a shift of peak wavelength from 515nm to 593nm. At this time, the full width at half maximum was about to be a constant of 50nm. With this kind of microcavity effect, we were able to control the emission spectra from the top-emission organic light-emitting diodes.

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Highly Stable Photoluminescent Qunatum Dot Multilayers by Layer-by-Layer Assembly via Nucleophilic Substitution Reaction in Organic Media

  • 윤미선;김영훈;정상혁;백현희;조진한
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2011년도 춘계학술발표대회
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    • pp.244.2-244.2
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    • 2011
  • We introduce a novel and robust method for the preparation of nanocomposite multilayers, which allows the excellent photoluminescent (PL) properties as well as the accurate control over the composition and dimensions of multilayers. By exchanging the oleic acid stabilizers of CdSe@ZnS quantum dots (QDs) synthesized in organic solvent with 2-bromo-2-methylpropionic acid (BMPA) in the same solvent, these nanoparticles were be alternately deposited by nucleophilic substitution reaction with highly branched poly(amidoamine) dendrimer (PAMA) through layer-by-layer (LbL) assembly process. Our approach does not need to be transformed into the water-dispersible nanoparticles with electrostatic or hydrogen-bonding groups, which can deteriorate their inherent properties, for the built-up of multilayers. The nanocomposite multilayers including QDs exhibited the strong PL properties achieving densely packed surface coverage as well as long-term PL stability under atmospheric conditions in comparison with those of conventional LbL multilayers based on electrostatic interaction. Furthermore, we demonstrate that the flexible multilayer films with optical properties can be easily prepared using nucleophilic substitution reaction between bromo and amino groups in organic media. This robust and tailored method opens a new route for the design of functional film devices based on nanocomposite multilayers.

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Exploratory research on ultra-long polymer optical fiber-based corrosion sensing for buried metal pipelines

  • Luo, Dong;Li, Yuanyuan;Yang, Hangzhou;Sun, Hao;Chen, Hongbin
    • Smart Structures and Systems
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    • 제26권4호
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    • pp.507-520
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    • 2020
  • In order to achieve effective corrosion monitoring of buried metal pipelines, a Novel nondestructive Testing (NDT) methodology using ultra-long (250 mm) Polymer Optical Fiber (POF) sensors coated with the Fe-C alloy film is proposed in this study. The theoretical principle is investigated to clarify the monitoring mechanism of this method, and the detailed fabrication process of this novel POF sensor is presented. To validate the feasibility of this novel POF sensor, exploratory research of the proposed method was performed using simulated corrosion tests. For simplicity, the geometric shape of the buried pipeline was simulated as a round hot-rolled plain steel bar. A thin nickel layer was applied as the inner plated layer, and the Fe-C alloy film was coated using an electroless plating technique to precisely control the thickness of the alloy film. In the end, systematic sensitivity analysis on corrosion severity was further performed with experimental studies on three sensors fabricated with different metal layer thicknesses of 25 ㎛, 30 ㎛ and 35 ㎛. The experimental observation demonstrated that the sensor coated with 25 ㎛ Fe-C alloy film presented the highest effectiveness with the corrosion sensitivity of 0.3364 mV/g at Δm = 9.32 × 10-4 g in Stage I and 0.0121 mV/g in Stage III. The research findings indicate that the detection accuracy of the novel POF sensor proposed in this study is satisfying. Moreover, the simple fabrication of the high-sensitivity sensor makes it cost-effective and suitable for the on-site corrosion monitoring of buried metal pipelines.

대전입자형 디스플레이의 충전 Layer 제어와 광학특성 평가 (Optical Estimation and Putting Layer Control of Charged Particle type Display)

  • 김백현;김영조
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.85-86
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    • 2008
  • We have developed charged particle type display using opposite-charged two particles. We fabricated the charged particle type display to be controlled the addressing layers by putting voltage. To get the effect of number of layers, we measured driving voltage, reflectivity, viewing angle, and color characteristics, for 1~2 layer. Reflectivity was different according to the number of layers and wavelength of yellow particles is alike to that.

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Endpoint Detection in Semiconductor Etch Process Using OPM Sensor

  • Arshad, Zeeshan;Choi, Somang;Jang, Boen;Hong, Sang Jeen
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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    • pp.237.1-237.1
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    • 2014
  • Etching is one of the most important steps in semiconductor manufacturing. In etch process control a critical task is to stop the etch process when the layer to be etched has been removed. If the etch process is allowed to continue beyond this time, the material gets over-etched and the lower layer is partially removed. On the other hand if the etch process is stopped too early, part of the layer to be etched still remains, called under-etched. Endpoint detection (EPD) is used to detect the most accurate time to stop the etch process in order to avoid over or under etch. The goal of this research is to develop a hardware and software system for EPD. The hardware consists of an Optical Plasma Monitor (OPM) sensor which is used to continuously monitor the plasma optical emission intensity during the etch process. The OPM software was developed to acquire and analyze the data to perform EPD. Our EPD algorithm is based on the following theory. As the etch process starts the plasma generated in the vacuum is added with the by-products from the etch reactions on the layer being etched. As the endpoint reaches and the layer gets completely removed the plasma constituents change gradually changing the optical intensity of the plasma. Although the change in optical intensity is not apparent, the difference in the plasma constituents when the endpoint has reached leaves a unique signature in the data gathered. Though not detectable in time domain, this signature could be obscured in the frequency spectrum of the data. By filtering and analysis of the changes in the frequency spectrum before and after the endpoint we could extract this signature. In order to do that, first, the EPD algorithm converts the time series signal into frequency domain. Next the noise in the frequency spectrum is removed to look for the useful frequency constituents of the data. Once these useful frequencies have been selected, they are monitored continuously in time and using a sub-algorithm the endpoint is detected when significant changes are observed in those signals. The experiment consisted of three kinds of etch processes; ashing, SiO2 on Si etch and metal on Si etch to develop and evaluate the EPD system.

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메쉬 스크린 장치가 과팽창 초음속 제트소음에 미치는 영향 (Effect of Mesh Screen Device on Over-Expanded Supersonic Jet Noise)

  • 권용훈;김재형;임채민;청목준지;김희동
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2007년도 춘계학술대회B
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    • pp.3150-3155
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    • 2007
  • This paper describes an experimental work to investigate the effect of mesh screen device on the jet structure and acoustic characteristics of over-expanded supersonic jet. The mesh screen device is placed into the supersonic jet stream. In order to perturb mainly the initial jet shear layer, the hole is perforated in the central part of the mesh screen. The diameter of the perforated hole and the location of mesh screen device are varied. A Schlieren optical system is used to visualize the flow fields of supersonic jet without and with the mesh screen device. Pitot pressure measurement is carried out to obtain the pressure distribution in the jet flow. Acoustic measurement also is performed to obtain the OASPL and noise spectra. The results obtained show that the jet structure and the jet noise control effectiveness is strongly dependent upon the diameter of the perforated hole and the location of the mesh screen device in the jet stream. Provided that the mesh screen device is placed at the location to perturb effectively the initial shear layer, the present control method is effective in suppressing the supersonic jet noise.

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다층퍼셉트론의 정합 근사화에 의한 2차원 영상의 카메라 오차보정 (A 2-D Image Camera Calibration using a Mapping Approximation of Multi-Layer Perceptrons)

  • 이문규;이정화
    • 제어로봇시스템학회논문지
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    • 제4권4호
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    • pp.487-493
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    • 1998
  • Camera calibration is the process of determining the coordinate relationship between a camera image and its real world space. Accurate calibration of a camera is necessary for the applications that involve quantitative measurement of camera images. However, if the camera plane is parallel or near parallel to the calibration board on which 2 dimensional objects are defined(this is called "ill-conditioned"), existing solution procedures are not well applied. In this paper, we propose a neural network-based approach to camera calibration for 2D images formed by a mono-camera or a pair of cameras. Multi-layer perceptrons are developed to transform the coordinates of each image point to the world coordinates. The validity of the approach is tested with data points which cover the whole 2D space concerned. Experimental results for both mono-camera and stereo-camera cases indicate that the proposed approach is comparable to Tsai's method[8]. Especially for the stereo camera case, the approach works better than the Tsai's method as the angle between the camera optical axis and the Z-axis increases. Therefore, we believe the approach could be an alternative solution procedure for the ill -conditioned camera calibration.libration.

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