• 통합자연과학논문집
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• 제4권1호
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• pp.1-6
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• 2011

The properties of porous silicon, such as substrate properties, porosity, thickness, refractive index, surface area, and optical properties of porous silicon were reviewed. Some properties, such as porosity, refractive index, thickness, pore diameter, multi-structures, and optical properties, are strongly dependent on the anodization process parameters. These parameters include HF concentration, current density, anodization time, and silicon wafer type and resistivity.

• Journal of the Optical Society of Korea
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• 제18권3호
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• pp.236-243
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• 2014

Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.

• 한국표면공학회지
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• 제43권3호
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• pp.148-153
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• 2010

Transparent conducting films having a hybrid structure of GZO/Metal/GZO were prepared on glass substrates by sequential deposition using DC magnetron sputtering. Silver, copper, aluminum and zinc thin films were used as the intermediate metal layers in the hybrid structure. The electrical and optical properties of hybrid transparent conducting films were investigated with varying the thickness of metal layer or GZO layers. With increasing the metal thickness, hybrid films showed a noticeable improvement of the electrical conductivity, which is mainly dependent on the electrical property of the metal layer. GZO(40 nm)/Ag(10 nm)/GZO(40 nm) film exhibits a resistivity of $5.2{\times}10^{-5}{\Omega}{\cdot}cm$ with an optical transmittance of 82.8%. For the films with Zn interlayer, only marginal reduction in the resistivity was observed. Furthermore, unlike other metals, hybrid films with Zn interlayer showed a decrease in the resistivity with increasing the GZO thickness. The optimal thickness of GZO layer for anti-reflection effect at a given thickness of metal (10 nm) was found to be critically dependent on the refractive index of the metal. In addition, x-ray diffraction analysis showed that the insertion of Ag layer resulted in the improvement of crystallinity of GZO films, which is beneficial for the electrical and optical properties of hybrid-type transparent conducting films.

• Journal of the Optical Society of Korea
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• 제15권1호
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• pp.68-73
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• 2011

This study investigated, using the Orbscan II topography system, the influence of age and sex related changes on the corneal thickness and anterior corneal curvature, more specifically the fine structure of the cornea, in a Korean young population. The Orbscan II topography system is a computer-assisted slit-beam scanning technology that can map the anterior section of the cornea. The mean central corneal thickness of all subjects was $547.532{\pm}44.529\;{\mu}m$. There was no statistical difference (p>0.5) in the mean central corneal thickness between males and females. Sex and age related changes in the mean central corneal thickness had no specific statistical difference (P>0.5). There was a negative correlation between the anterior corneal curvature and the central corneal thickness in all subjects, except for the twenty year olds. However, the thickness relationship between the mean central corneal and the eight paracentral corneal thicknesses had strong statistical differences in all subjects. Also age and sex related changes in the central corneal thickness and the anterior corneal curvature in all subjects had no statistically significant difference, except from 20-26 years old (p>0.05). This information could be a suitable reference basis for future studies in the young population of Asia and for the development of examination tools for corneal refractive surgery.

• 한국광학회:학술대회논문집
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• 한국광학회 2006년도 하계학술발표회 논문집
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• pp.539-540
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• 2006

• 한국정밀공학회지
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• 제21권2호
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• pp.27-34
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• 2004

In the injection molding of plastic optical lenses, the molding conditions have critical effects on the quality of the molded lenses. Since there are many molding parameters involved in injection molding process, determination of the molding conditions for lens molding is very important in order to precisely control the surface contours of an optical lens. Therefore this paper presents the application of neural network in suggesting the optimized molding conditions for improving the quality of molded parts based on data of FE Analysis carried out through CAE software, Timon-3D. Suggested model in this paper, which serves to learn from the data of FE Analysis and induce the values for optimized molding conditions. has been implemented for searching the molding conditions without void and with minimized thickness shrinkage at lens center of injection molding optical lens. As the result of this study. we have confirmed that void creation at the inside of lens is primarily determined by mold temperature and thickness shrinkage at center of lens is primarily determined by the parameters such as holding pressure and mold temperature.

• 전자공학회논문지D
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• 제34D권11호
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• pp.76-82
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• 1997

The characteristics of optical waeguides and IDT electrodes fabricated for acousto-optic tunable filters (AOTE) used for optical communications were analyzed. A $Ti:LiNbO_3$ in-diffusion method was employed for the formation of the optical waveguide with a dimension of width $8\mu\textrm{m}$, length $30000\mu\textrm{m}$, and thickness $1150{\AA}$. The diffusion was carried at $1050^{\circ}C$ for 8 houss to pattern the optical waveguide with Ti. The resulted waveguide exhibited a single mode at a 1550nm wavelength range and its propagation loss was less than 0.5dB/cm. The width of IDT, with 10 SAW periods, was $5000\mu\textrm{m}$, S11 reflection characteristics and impedances of th eelectrodes deposited with Au were analyzed using a network analyzer; $48.1\Omega$ at th ecenter frquency of 193MHz for Au deposition thickness of $1500{\AA}$ and $50.7\Omega$ at the center frequency of 192MHz for au deposition thickness of $1600{\AA}$.

• 대한원격탐사학회지
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• 제33권5_1호
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• pp.607-615
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• 2017

본 연구에서는 동북아시아($15{\sim}55^{\circ}E$, $90{\sim}150^{\circ}N$) 영역에 대하여 극궤도 위성 Terra와 Aqua에 탑재된 Moderate Resolution Imaging Spectrometer (MODIS) 센서와 우리나라 정지궤도 위성인 통신해양기상위성(Communication, Ocean and Meteorological Satellite, COMS)에 탑재된 Meteorological Imager (MI) 센서에 의한 에어로졸 광학두께(AOT) 산출 결과와 지상의 Aerosol Robotic Network (AERONET) 관측 자료를 비교 분석하였다. 그 결과 MODIS와 MI에 의한 에어로졸 광학두께는 해양에서 비교적 잘 일치하였으나 구름 가장자리와 육지에서는 두 센서의 에어로졸 광학두께 차이가 크게 나타났다. 그 이유로서 MODIS는 가시 채널과 적외 채널을 혼용하는 반면 MI는 오직 가시채널 만 사용하기 때문에 구름 가장자리의 옅은 구름을 에어로졸로 인식할 수 있고 육지에서는 지표면 특성에 따라 MODIS와 MI에 의한 에어로졸 광학두께 산출 차이가 발생된다. 따라서 MI 에어로졸 광학두께는 구름 가장자리와 지표면 특성의 영향을 주는 지표면 반사도의 정확성 개선을 통해 에어로졸 광학두께 산출 결과를 개선할 수 있다고 사료된다.

• Current Optics and Photonics
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• 제7권1호
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• pp.38-46
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• 2023

Optical Fourier-domain reflectometry (OFDR) sensors have been widely used to measure distances with high resolution and speed in a noncontact state. In the electroplating process of a printed circuit board, it is critically important to monitor the copper-plating thickness, as small deviations can lead to defects, such as an open or short circuit. In this paper we employ a phase-based OFDR sensor for in situ relative distance sensing of a sample with nanometer-scale resolution, during electroplating. We also develop an optical-path difference (OPD)-regulated sensing probe that can maintain a preset distance from the sample. This function can markedly facilitate practical measurements in two aspects: Optimal distance setting for high signal-to-noise ratio OFDR sensing, and protection of a fragile probe tip via vertical evasion movement. In a sample with a centimeter-scale structure, a conventional OFDR sensor will probably either bump into the sample or practically out of the detection range of the sensing probe. To address this limitation, a novel OPD-regulated OFDR system is designed by combining the OFDR sensing probe and linear piezo motors with feedback-loop control. By using multiple OFDR sensors, it is possible to effectively monitor copper-plating thickness in situ and uniformize it at various positions.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2015년도 제49회 하계 정기학술대회 초록집
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• pp.179.1-179.1
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• 2015

Thickness-dependent electrical, structural, and optical properties of zinc oxide (ZnO) thin films on polyethylene terephthalate (PET) substrates were investigated in the very thin thickness range of 20 to 120 nm. A very unusual transition phenomenon, in which electrical resistance increases with an increase in film thickness, was observed. From structural and compositional analyses, this transition behavior was explained to arise from metallic Zn agglomerates dispersed in non-crystalline Zn-O matrix. It was unveiled that film thickness more than 80 nm is required for the development of hexagonal crystal structure of ZnO. ZnO films on PET substrates exhibited high optical transmittance and good mechanical flexibility in the thickness range. The results of this study would provide a valuable guideline for the design of ZnO thin films on organic substrates for practical applications.