• Title/Summary/Keyword: Ohmic

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Current Density Equations Representing the Transition between the Injection- and Bulk-limited Currents for Organic Semiconductors

  • Lee, Sang-Gun;Hattori, Reiji
    • Journal of Information Display
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    • v.10 no.4
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    • pp.143-148
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    • 2009
  • The theoretical current density equations for organic semiconductors was derived according to the internal carrier emission equation based on the diffusion model at the Schottky barrier contact and the mobility equation based on the field dependence model, the so-called "Poole-Frenkel mobility model." The electric field becomes constant because of the absence of a space charge effect in the case of a higher injection barrier height and a lower sample thickness, but there is distribution in the electric field because of the space charge effect in the case of a lower injection barrier height and a higher sample thickness. The transition between the injection- and bulk-limited currents was presented according to the Schottky barrier height and the sample thickness change.

A Study on Conduction Characteristics of Oriented Polypropylene Film (이축 연신 풀리프로필렌 필름의 전도특성에 관한 연구)

  • 김귀열;윤문수;이준욱
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.39 no.2
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    • pp.175-182
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    • 1990
  • In order to investigate the conduction characteistics of the biaxially oriented polypropylene film, several measurements have been carried out in the range of temperature between 5['c] and 25['c] as well as the field intensity between 10[MV/m] and 300[MV/m]. The whole range of the characteristics observed at 15['c] appears to be divided into five regions` the Ohmic conduction region due to ionic carrier below 40[MV/m], the region from 40[MV/m] to 70[MV/m] in which the conduction mechanism is attributed to Poole-Frenkel effect, the region from 70[MV/m] to 82[MV/m] in which the negative resistance characteristics are observed, then the region from 82[MV/m] which is dominated by Schottky effect and finally, the region from 240[MV/m] up to the point where dielectric breakdown occurs in which the mechanism is based on Flowler-Nordheim theory.

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Control Method for Minimizing Thrust Ripple of PM Excited Transverse Flux Linear Motor (영구자석 여자 횡축형 선형전동기의 추력맥동 저감 제어기법)

  • 안종보;강도현;김지원;정수진;임태윤;박준호
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.53 no.1
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    • pp.16-23
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    • 2004
  • Permanent magnet-excited transverse flux linear motor(TFLM) is known to have more excellent ratio of force to weight than any other linear motors. But, thrust generated by phase current is non-linear with regard to current and relative position like switched reluctance motor. This makes current and speed controller design difficult. This paper presents a method on minimization of thrust ripple of permanent magnet-excited transverse flux linear motor. Using genetic algorithm(GA), optimal current waveform can be found under the constraint conditions such as current limit, minimum of ohmic loss and limited rate of change of current etc. The effectiveness is verified through computer simulation and experimental test results.

Thermal Flow Characteristics Driven by Arc Plasmas in a Thermal Puffer Type GCB (열파퍼식 가스차단기에서 발생하는 아크 플라즈마에 의한 열유동 특성)

  • Lee, Jong-Chul;Kim, Youn J.
    • The Transactions of the Korean Institute of Electrical Engineers B
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    • v.54 no.11
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    • pp.527-532
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    • 2005
  • During the last ten years the new interruption techniques, which use the arc energy itself to increase the pressure inside a chamber by the PTFE nozzle ablation, have displaced the puffer circuit breakers due to reduced driving forces and better maintainability. In this paper, we have investigated the thermal flow characteristics inside a thermal puffer type gas circuit breaker by solving the Wavier-Stokes equations coupled with Maxwell's equations for considering all instabilities effects such as turbulence and Lorentz forces by transient arc plasmas. These relative inexpensive computer simulations might help the engineer research and design the new interrupter in order to downscale and uprating the GIS integral.

Al-Si Contact on Annealing condition (열처리 조건에 따른 Al-Si 접촉)

  • Kim, Tae-Hyung;Yu, Seok-Bin;Kim, Chang-Il;Chang, Eui-Goo
    • Proceedings of the KIEE Conference
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    • 1990.07a
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    • pp.261-264
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    • 1990
  • The specific contact resistance(SCR) of metal-semiconductor interface is an important design parameter for VLSI interconnecting technology. As the critical feature size of the integrated structures decrease, the physical size of ohmic contacts will also decrease and the series contact resistance will increase. Al-Si contacts on the annealing condition are studied. The propreties of the contacts depend considerably on the annealing procedures. Barrier height is measured from Capacitance-Voltage characteristics. The specific contact resistance are analyzed using a modified four point method.

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Electrochemical model for the simulation of solid oxide fuel cells (고체산화물연료전지의 시뮬레이션을 위한 전기화학모델)

  • Park, Joon-Guen;Lee, Shin-Ku;Bae, Joong-Myeon
    • 한국신재생에너지학회:학술대회논문집
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    • 2008.10a
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    • pp.63-66
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    • 2008
  • This study presents 0-dimensional model for solid oxide fuel cells(SOFCs). The physics of the cell and the simplifying assumptions are presented, and only hydrogen participates in the electrochemical reaction. The electrical potential is predicted using this model. The Butler-Volmer equation is used to describe the activation polarization and the exchange current density is changed according to the partial pressure of reactants and the temperature. The electrical conductivities of electrodes and an electrolyte are calculated for the ohmic polarization. Material characteristics and temperature affect those factors. Analysis of concentration polarization based on transport of gaseous species through porous electrodes is incorporated in this model. Both binary diffusion and Knudsen diffusion are considered as the diffusion mechanism. For validation, simulation results at this work are compared with our experimental results and numerical results by other researchers.

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Improved Electrical Properties of Indium Gallium Zinc Oxide Thin-film Transistors by AZO/Ag/AZO Multilayer Transparent Electrode

  • No, Yeong-Su;Yang, Jeong-Do;Park, Dong-Hui;Wi, Chang-Hwan;Jo, Se-Hui;Kim, Tae-Hwan;Choe, Won-Guk
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.443-443
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    • 2012
  • We fabricated a-IGZO TFT with AZO/Ag/AZO transparent multilayer source/drain contacts by rf magnetron sputtering. Enhanced electrical device performance of a-IGZO TFT with AZO/Ag/AZO multilayer S/D electrodes (W/L = = 400/50 mm) was achieved with a subs-threshold swing of 3.78 V/dec, a minimum off-current of 10-12 A, a threshold voltage of 1.80 V, a field effect mobility of 10.86 cm2/Vs, and an on/off ration of 9x109. It demonstrated the potential application of the AZO/Ag/AZO film as a promising S/D contact material for the fabrication of the high performance TFTs.

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열압착 공정을 통해 형성된 나노와이어와 금속전극간의 기계적/전기적 접촉특성 분석

  • Lee, Won-Seok;Park, In-Gyu;Lee, Ji-Hye
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.536-536
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    • 2012
  • 나노와이어는 센서, 메모리소자, 태양전지등과 같은 다양한 소자로 응용이 되고 있다. Bottom-up 방법으로 길러진 나노와이어들을 금속전극 위에 정렬 및 접합시킬 때, 나노와이어와 금속전극간의 기계적 접합강도와 안정적인 전기적 특성이 매우 중요하다. 본 연구에서는 열압착 공정과 솔더전극(Cr/Au/In/Au, Cr/Cu/In/Au)을 사용함으로써, 나노와이어를 금속전극에 압입시켜 강한 기계적 접합강도와 안정적인 전기적 특성을 얻을 수 있는 공정을 제안하였다. 나노와이어와 금속 전극간의 접합부 분석을 위해 scanning electron microscopy (SEM)와 transmission electron microscopy (TEM)을 이용하였으며, 기계적 특성은 lateral force microscopy (LFM), 전기적 특성은 semiconductor analyzer (Keithley 4200-SCS)를 사용하여 측정하였다. 접합강도 측정결과 lateral force가 나노와이어에 가해질 때 나노와이어가 파괴되는 힘에서도 나노와이어와 금속전극간의 접합부파괴가 일어나지 않았다. 또한 나노와이어와 금속전극간의 전기적 접촉특성은 안정적인 ohmic contact을 이루었다.

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Switching Characteristics of Amorphous GeSe TFT for Switching Device Application

  • Nam, Gi-Hyeon;Kim, Jang-Han;Jo, Won-Ju;Jeong, Hong-Bae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2012.02a
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    • pp.403-404
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    • 2012
  • We fabricated TFT devices with the GeSe channel. A single device consists of a Pt source and drain, a Ti glue layer and a GeSe chalcogenide channel layer on SiO2/Si substrate which worked as the gate. We confirmed the drain current with variations of gate bias and channel size. The I-V curves of the switching device are shown in Fig. 1. The channel of the device always contains amorphous state, but can be programmed into two states with different threshold voltages (Vth). In each state, the device shows a normal Ovonic switching behavior. Below Vth (OFF state), the current is low, but once the biasing voltage is greater than Vth (ON state), the current increases dramatically and the ON-OFF ratio is high. Based on the experiments, we draw the conclusion that the gate voltage can enhance the drain current, and the electric field by the drain voltage affects the amorphous-amorphous transition. The switching device always contains the amorphous state and never exhibits the Ohmic behavior of the crystalline state.

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