• Korean Journal of Optics and Photonics
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• v.13 no.1
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• pp.9-14
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• 2002

A surface plasmon sensor has been fabricated for detection of concentration and refractive-index of a mixed solution. Based on the Kretschmann-Raether attenuated-total-reflection configuration, the sensor consists of 54 nm-thick Ag metal layer under a prism and a cell containing the mixed solution. We have observed a nonlinear refractive-index change as the ethanol-water concentration increased. The experimental results show us that the detection limit of the SPR sensor is 3$\times$10$^{-2}$ % in ethanol mass ratio. The concentration-to-index curve shows a linear increase in the range of ethanol concentration from 0% to 50%, but a nonlinearity is observed beyond 50%. We have modeled the nonlinearity and compared it with the experimental results.

• Korean Journal of Optics and Photonics
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• v.8 no.4
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• pp.308-314
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• 1997

We have studied the generation of an array of dark spatial solitons in a self-deforcusing medium. Unlike a single fundamental dark spatial soliton, we show numerically that the generation of an array of dark spatial solitons from a spatially sinusoidal input beam needs an adiabatic amplification of nonlinear refractive index with the beam propagation distance. In experiment, we establish a Mach-Zehnder interferometer for making the sinusoidal input beam and use a cylindrical lens for the adiabatic amplification. We observe that the dark soliton's dip-width becomes narrower and the background intensity distribution becomes flatter with increasing the nonlinearity.

• Current Optics and Photonics
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• v.3 no.2
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• pp.143-149
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• 2019

Shape ellipticity dependence of the exciton fine energy levels in CdTe and CdSe nanocrystal quantum dots were compared theoretically by considering the crystal structure and the Coulomb interaction of an electron and a hole. While quantum dot ellipticity changes from an oblate to prolate quantum dot via spherical shape, both the fine energy levels and the dipole moment in wurtzite structure of a CdSe quantum dot change linearly for ellipticity. In contrast, CdTe quantum dots were found to show a level crossing between the bright and dark exciton states with a significant change of the dipole moment due to the cubic structure. Shape ellipticity dependence of the optical nonlinearities in CdTe and CdSe nanocrystal quantum dots was also calculated by using semiconductor Bloch equations. For a spherical shape quantum dot, only $1^L$ dominates the optical nonlinearities in a CdSe quantum dot, but both $1^U$ and $0^U$ contribute in a CdTe quantum dot. As excitation pulse area becomes strong (${\sim}{\pi}$), the optical nonlinearities of both CdSe and CdTe quantum dots are mainly governed by absorption saturation. However, in the case of a prolate CdTe quantum dot, the real part of the nonlinear refractive index becomes relatively significant.

• Journal of the Korean Ceramic Society
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• v.39 no.12
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• pp.1158-1163
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• 2002

An Ge/B-doped optical fiber with high photosensitivity was fabricated to induce large second-order optical nonlinearity by UV poling. It was found that long period fiber gratings were inscribed on the fiber by the 248 nm KrF excimer laser irradiation with pulse energy of 116 mJ/$cm^2$ and pulse frequency of 10 Hz without hydrogen loading treatment. The photosensitivity was measured by use of the long period fiber grating pair method and the refractive index change of 3.3$10{\times}^{-3}$ was found to be induced in the core of the optical fiber by the KrF excimer laser irradiation of 8.67 kJ/$cm^2$. An H-shaped optical fiber was also fabricated for the UV poling through optimization of the fiber drawing condition.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.11
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• pp.75-82
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• 2004

A metrological atomic force microscope (M-AFM) was developed fur the length measurements of nanometer range, through the modification of a commercial AFM. To eliminate nonlinearity and crosstalk of the PZT tube scanner of the commercial AFM, a two-axis flexure hinge scanner employing built-in capacitive sensors is used for X-Y motion instead of PZT tube scanner. Then two-dimensional displacement of the scanner is measured using two-axis heterodyne laser interferometer to ensure the meter-traceability. Through the measurements of several specimens, we could verify the elimination of nonlinearity and crosstalk. The uncertainty of length measurements was estimated according to the Guide to the Expression of Uncertainty in Measurement. Among several sources of uncertainty, the primary one is the drift of laser interferometer output, which occurs mainly from the variation of refractive index of air and the thermal stability. The Abbe error, which is proportional to the measured length, is another primary uncertainty source coming from the parasitic motion of the scanner. The expanded uncertainty (k =2) of length measurements using the M-AFM is √(4.26)$^2$+(2.84${\times}$10$^{-4}$ ${\times}$L)$^2$(nm), where f is the measured length in nm. We also measured the pitch of one-dimensional grating and compared the results with those obtained by optical diffractometry. The relative difference between these results is less than 0.01 %.