• Title/Summary/Keyword: Non Precision Approach

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Against Skepticism: Doubt and Belief in C. S. Peirce and Michael Polanyi (찰스 S. 퍼스와 마이클 폴라니의 회의론과 믿음(belief)에 대한 비교 연구)

  • Kim, Dong Ju
    • 기호학연구
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    • no.54
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    • pp.7-36
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    • 2018
  • Michael Polanyi's idea of tacit knowledge came from the realization that scientific objectivity and critical philosophy had become too restrictive for philosophy, especially in the realm of meaning, which is beyond positivistic proof and contains more non-critical elements than critical ones. In social life, people still share certain kinds of knowledge and beliefs which they obtain without making or learning those explicitly. Contemplating the role and significance of tacit knowledge, he called for a post-critical philosophy that integrates the realm of meaning and thereby appreciates the intertwined nature of tacit and explicit knowledge. Polanyi's position towards skepticism and doubt shows similarities with Charles S. Peirce's thinking about the relationship between belief and doubt. Although Peirce's semeiotics stands firmly in the tradition of critical philosophy, he affirms that doubt cannot be a constant state of mind and only belief can form a basis for a specific way of life. Polanyi's approach differs from Peirce's by focusing on the impossibility of scientific knowledge based solely on principles and precision, and his emphasis on the crucial role of the community of scientists. Nevertheless, the deeper implications of Peirce's contemplations on belief and doubt have myriad ramifications on the philosophy of science as well as the sociology of science.

Development of deep learning network based low-quality image enhancement techniques for improving foreign object detection performance (이물 객체 탐지 성능 개선을 위한 딥러닝 네트워크 기반 저품질 영상 개선 기법 개발)

  • Ki-Yeol Eom;Byeong-Seok Min
    • Journal of Internet Computing and Services
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    • v.25 no.1
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    • pp.99-107
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    • 2024
  • Along with economic growth and industrial development, there is an increasing demand for various electronic components and device production of semiconductor, SMT component, and electrical battery products. However, these products may contain foreign substances coming from manufacturing process such as iron, aluminum, plastic and so on, which could lead to serious problems or malfunctioning of the product, and fire on the electric vehicle. To solve these problems, it is necessary to determine whether there are foreign materials inside the product, and may tests have been done by means of non-destructive testing methodology such as ultrasound ot X-ray. Nevertheless, there are technical challenges and limitation in acquiring X-ray images and determining the presence of foreign materials. In particular Small-sized or low-density foreign materials may not be visible even when X-ray equipment is used, and noise can also make it difficult to detect foreign objects. Moreover, in order to meet the manufacturing speed requirement, the x-ray acquisition time should be reduced, which can result in the very low signal- to-noise ratio(SNR) lowering the foreign material detection accuracy. Therefore, in this paper, we propose a five-step approach to overcome the limitations of low resolution, which make it challenging to detect foreign substances. Firstly, global contrast of X-ray images are increased through histogram stretching methodology. Second, to strengthen the high frequency signal and local contrast, we applied local contrast enhancement technique. Third, to improve the edge clearness, Unsharp masking is applied to enhance edges, making objects more visible. Forth, the super-resolution method of the Residual Dense Block (RDB) is used for noise reduction and image enhancement. Last, the Yolov5 algorithm is employed to train and detect foreign objects after learning. Using the proposed method in this study, experimental results show an improvement of more than 10% in performance metrics such as precision compared to low-density images.