• 한국전자파학회논문지
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• 제24권4호
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• pp.436-447
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• 2013

본 논문에서는 IC(Integrated Circuit) 전자파 전도내성 시험 방법인 BCI(Bulk Current Injection)와 DPI(Direct Power Injection)를 이용하여 1.8 V I/O 버퍼에 대한 IC 전자파 전도내성을 시험하였다. IC 전자파 전도내성 시험을 회로 해석기를 사용하여 시뮬레이션 할 수 있는 등가회로 모델(model)을 개발하고 검증하였다. BCI와 DPI의 주파수에 따른 forward 전력을 비교한 결과는 주파수 성분에 따라 실제 IC에 도달하는 전자파(electromagnetic, EM) 노이즈의 양이 제한됨을 보여준다. 시뮬레이션을 통해, 가해지는 RF(Radio Frequency) 노이즈가 전달되는 경로의 삽입손실을 구하여, 하나의 시험 방법만으로는 넓은 주파수 영역에서 실질적인 IC 전자파 내성시험의 어려움을 발견하였다. 따라서 규정된 시험 방법을 보완하여 넓은 주파수 영역의 노이즈에 대해 신뢰도 높은 IC 전자파 전도내성 시험 방법을 제안한다.

• 한국전자파학회논문지
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• 제27권10호
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• pp.917-925
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• 2016

슈미트 트리거 로직(Schmitt Trigger Logic)은 디지털 회로의 노이즈에 대한 내성을 향상시키기 위해 히스테리시스 특성을 보이는 게이트를 제안한 설계 방법이다. 슈미트 트리거 특성을 보이는 설계 방법 중 최근에 제안된 substrate bias를 조정하여 구현하는 Dynamic Threshold voltage MOS(DTMOS) 방법을 사용할 경우, 게이트 수를 늘이지 않고 내성을 향상 시킬 수 있는 설계방법이나, 범용 CMOS 공정에서 구현하여 시뮬레이션으로 예상하는 성능을 얻을 수 있는지는 검증되지 않았다. 본 연구에서는 $0.18{\mu}m$ CMOS 공정에서 DTMOS 설계 방법을 구현하여 히스테리시스 특성을 측정하여 검증하였다. DTMOS 슈미트 트리거 버퍼, 인버터, 낸드, 노어 게이트 및 간단한 디지털 로직 회로를 제작하였으며, 히스테리시스 특성, 전력 소모, 딜레이 등의 특성들을 관찰하고, 일반적인 CMOS 게이트로 구현된 회로와 비교하였다. 노이즈에 대한 내성이 향상되는 것을 Direct Power Injection(DPI) 실험을 통해 확인하였다. 본 논문을 통해 제작된 DTMOS 슈미트 트리거 로직은 10 M~1 GHz 영역에서 전자파 내성이 향상된 것을 확인할 수 있었다.

• 한국전자파학회지:전자파기술
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• 제14권1호
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• pp.35-42
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• 2003

Differential signaling has become a popular choice for high-speed interconnection schemes on Printed Circuit Boards (PCBs), offering superior immunity to external noise. However, conventional differential transmission lines on PCBs have problems, such as crosstalk and radiated emission. To overcome these, we propose a Twisted Differential Line (TDL) structure on a multi-layer PCB. Its improved immunity to crosstalk noise and the reduced radiated emission has been successfully demonstrated by measurement. The proposed structure is proven to transmit 3 Gbps digital signals with a clear eye-pattern. Furthermore, it is subject to much less crosstalk noise and achieves a 13 dB suppression of radiated emission. Index Terms - Twisted Differential Line, Differential Signaling, Crosstalk, Radiated Emission, Transmission Line, Twisted Pair

• Journal of Semiconductor Engineering
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• 제3권1호
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• pp.154-160
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• 2022

In this paper, we design a DC-DC boost converter with RF noise immunity to supply a stable positive output voltage for OLED displays. For RF noise immunity, an input voltage variation reduction circuit (IVVRC) is adopted to ensure display quality by reducing the undershoot and overshoot of output voltage. The boost converter for a positive voltage Vpos operates in the SPWM-PWM dual mode and has a dead-time controller using a dead-time detector, resulting in increased power efficiency. A chip was fabricated using a 0.18 um BCDMOS process. Measurement results show that power efficiency is 30% ~ 76% for load current range from 1 mA to 100 mA. The boost converter with the IVVRC has an overshoot of 6 mV and undershoot of 4 mV compared to a boost converter without that circuit with 18 mV and 20 mV, respectively.

• JSTS:Journal of Semiconductor Technology and Science
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• 제14권2호
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• pp.202-211
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• 2014

The bulk current injection (BCI) and direct power injection (DPI) method have been established as the standards for the electromagnetic susceptibility (EMS) test. Because the BCI test uses a probe to inject magnetically coupled electromagnetic (EM) noise, there is a significant difference between the power supplied by the radio frequency (RF) generator and that transferred to the integrated circuit (IC). Thus, the immunity estimated by the forward power cannot show the susceptibility of the IC itself. This paper derives the real injected power at the failure point of the IC using the power transfer efficiency of the BCI method. We propose and mathematically derive the power transfer efficiency based on equivalent circuit models representing the BCI test setup. The BCI test is performed on I/O buffers with and without decoupling capacitors, and their immunities are evaluated based on the traditional forward power and the real injected power proposed in this work. The real injected power shows the actual noise power level that the IC can tolerate. Using the real injected power as an indicator for the EMS test, we show that the on-chip decoupling capacitor enhances the EM noise immunity.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2003년도 ICCAS
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• pp.1643-1647
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• 2003

This paper, we propose a new high noise immunity phase-locked loop(PLL) which can suppress the high incident noise coupling with large amplitude and long period to the input frequency of PLL and keeps constant frequency and phase of the VCO output for providing the high stability distribution clock pulse.

• 한국전기전자재료학회논문지
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• 제37권5호
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• pp.465-475
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• 2024

Due to changes in the form factor of display panels and touch screen panels in various devices, capacitive touch systems have evolved to address various issues such as low power consumption, noise immunity, and small chip size. Furthermore, some devices have applications that use a stylus. Since the stylus operates similarly to a finger touch, it encounters similar issues. Recent research trends focus on addressing key issues such as noise, which is primarily caused by the self-capacitor formed between the display cathode and the touch screen panel. In this paper, Various research papers discussing methods to eliminate external noise will be reviewed. These advancements enhance noise immunity in touch systems, making it easier to use thinner and more flexible panels. These progress make touch technology more versatile and reliable in various applications.

• 제어로봇시스템학회:학술대회논문집
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• 제어로봇시스템학회 2000년도 제15차 학술회의논문집
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• pp.482-482
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• 2000

The essential requirements of neural network for human skill transfer are fast convergence, high storage capacity, and strong noise immunity. Bidirectional associative memory(BAM) suffering from low storage capacity and abundance of spurious memories is rarely used for skill transfer application though it has fast and wide association characteristics for visual data. This paper suggests generalization of classical BAM structure and new learning algorithm which uses supervised learning to guarantee perfect recall starting with correlation matrix. The generalization is validated to accelerate convergence speed, to increase storage capacity, to lessen spurious memories, to enhance noise immunity, and to enable multiple association using simulation work.

• 대한전자공학회논문지SD
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• 제48권8호
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• pp.10-17
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• 2011

휴대용 전자 기기 수요가 증가하면서 저전력 회로에 대한 관심이 커지고 있다. 이와 더불어 프로세서 데이터 패스의 폭이 넓어지고, 파이프라인의 단계가 많아짐에 따라, 사용되는 플립플롭의 수가 증가하였다. 그로 인해 플립플롭의 전력 소모 및 성능이 전체 시스템에 미치는 영향이 커졌다. 또한, 반도체 공정 스케일이 점점 줄면서, 공급 전압과 문턱 전압이 감소되었고 이로 인해 노이즈가 회로에 미치는 영향이 커지고 있다. 본 논문에서는 노이즈 면역을 향상시키면서도 저전력 시스템에 사용할 수 있는 플립플롭을 제안하고자 한다. 제안한 회로는 1.2V에서 동작하는 65nm CMOS 공정으로 구현하였다.

• 전기학회논문지
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• 제64권1호
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• pp.196-200
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• 2015

The switching noise in the power electronics of the power conversion equipment (Power Conditioning System) for large energy storage devices are generated. Since the burst-level transient noise from being generated in the power system at a higher power change process influences the control circuit of the low voltage driver circuit. Noise may cause the malfunction of the control device even if no dielectric breakdown leads to a control circuit. To overcome this, this paper proposes the installation of an additional nano-surge protection device on the power supply DC output circuit of the battery management unit.