• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.12
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• pp.1352-1355
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• 2004

We have applied front contact metallization of plated nickel and copper for high efficiency passivated emitter rear contact(PERC) solar cell. Ni is shown to be a suitable barrier to Cu diffusion as well as desirable contact metal to silicon. The plating technique is a preferred method for commercial solar cell fabrication because it is a room temperature process with high growth rates and good morphology. In this system, the electroless plated Ni is utilized as the contact to silicon and the plated Cu serves as the primary conductor layer instead of traditional solution that are based on Ti/Pd/Ag contact system. Experimental results are shown for over 20 % PERC cells with the Plated Ni/Cu contact system for good performance at low cost.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2018.06a
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• pp.99-99
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• 2018

본 연구는 무전해 니켈 도금 공정에서 고연성을 요구하는 Flexible 기판상에 많이 사용되어지고 있는 무전해 니켈 도금액 평가에 관한 것이다. 무전해 도금을 이용하여 도금된 표면은 다양한 패키징 분야에서의 높은 밀도를 가지는 초소형 소자 등의 실장 표면이나 접합 계면으로 사용되고 있는 등 부품 소재 산업에서의 중요성이 점차 증가되고 있다. 고연성 무전해 Ni-P 도금개발을 통하여 얻고자하는 기술적 과제는 도금층에 높은 연성을 제공하고 안정성이 향상된 무전해 니켈 도금액을 제공하는 것이다.

• Proceedings of the KAIS Fall Conference
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• 2004.06a
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• pp.65-68
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• 2004

순간금형가열방법(MmSH injection process)과 일반적인 방법으로 사출된 ABS 위에 전자파를 차폐하기 위한 무전해 Ni 과 Ag도금을 하였다. 무전해 Ni의 경우, 알칼리성 도금욕일수록 도금속도가 증가하였고 순간금형가열방법으로 사출된 ABS가 일반적인 방법으로 사출된 ABS 보다 밀착력, 광택. 전자파 차폐효율이 다소 높은 값을 가졌으며 pH 8에서 5B의 밀착력, 509의 광택도와 76dB의 전자파 차폐효과를 나타냈다.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.5 no.5
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• pp.433-437
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• 2004

The MmSH is a process of injecting ABS to produce innovated physical properties compared to the conventional injection process. Physical properties such as thickness and adhesion strength of Ni plate electrolessly coated on a conventional and a MmSH injected ABS have been studied in the pH range 4~8. Thickness of the plate on the MmSH and the conventionally injected ABS appeared to be directly proportional to pH. The ABS processed by the conventional injection showed adhesion strength corresponded to ASTM 4B above pH 5. On the other hand, the ABS processed by the MmSH injection showed a superior adhesion strength corresponded to ASTM 5B above pH 6. It was calculated the shielding effectiveness of above 50 dB in all conditions.

• Korean Journal of Materials Research
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• v.10 no.12
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• pp.853-863
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• 2000

In this study, a new UBM materials system for solder flip chip interconnection of Cu pads were investigated using electroless copper (E-Cu) and electroless nickel (E-Ni) plating method. The interfacial reaction between several UBM structures and Sn-36Pb-2Ag solder and its effect on solder bump joint mechanical reliability were investigated to optimife the UBM materials design for solder bump on Cu pads. Fer the E-Cu UBM, continuous coarse scallop-like $Cu_{6}$ $Sn_{5}$ , intermetallic compound (IMC) was formed at the solder/E-Cu interface, and bump fracture occurred this interface under relative small load. In contrast, Fer the E-Ni/E-Cu UBM, it was observed that E-Ni effectively limited the growth of IMC at the interface, and the Polygonal $Ni_3$$Sn_4$ IMC was formed because of crystallographic mismatch between monoclinic $Ni_3$$Sn_4$ and amorphous E-Ni phase. Consequently, relatively higher bump adhesion strength was observed at E-Ni/E-Cu UBM than E-Cu UBM. As a result, it was fecund that E-Ni/E-Cu UBM material system was a better choice for solder flip chip interconnection on CU PadS.

• Journal of environmental and Sanitary engineering
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• v.18 no.3 s.49
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• pp.35-42
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• 2003

The electric resistance and constant current were investigated on the nickel-thallium-phosphorus alloy deposits by electroless-plating. The Ni-Tl-P alloy deposits were achieved with a bath using sodium hypophosphit as the reducing agent and sodium citrate as the comlexing agent. The basic plating solution is composed of 0.1M NiSO$_4$, 0.005${\sim}$0.0IM Tl$_2$S0$_4$, 0.1${\sim}$O.2M sodium hypophosphite and 0.02${\sim}$O.IM sodium citrate and the plating condition were pH 5${\sim}$6, temperrature 80$_4$90${\circ}$C. The results obtained are summarized as follows: 1) The crystal structure of deposit was amorphous structure as deposited state, became microcrystallized centering on Ni(111) plane by heat treatment at 200${\circ}$C, and grew as polycrystalline Ni, Ni$_3$P, Ni$_5$p$_2$,Tl, etc. by heat treatment higher than 350${\circ}$C. The grain size of plated deposits was grown up to 28.3~42.0nm by heat treatment for 1hour at 500${\circ}$C. 2) The electrical resistivity showed a comparatively high value of 192.5$_4$208.3 ${\mu}$${\Omega}$Cm and its thermal stability was great with resistivity value less than 0.22% in the thermal surroundings of 200${\circ}$C. 3) Ni-Tl-P alloy deposit showed such good constant current-making-effect in the variation of electric voltage, heat treatment temperature, and the composition of the deposit that it can be put to practical use as the matter of constant current device.

• Journal of the Korea Institute of Military Science and Technology
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• v.18 no.5
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• pp.485-491
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• 2015

In this study, the experimental and analytical investigation on structural integrity evaluation of spline shaft of self propelled artillery' generator were carried out. For this work, macro and microstructure fractography of spline shaft were observed. According to the results of the structure analysis and simulation, the shaft was redesigned and optimized. To improve the stiffness and shear stress, the material was changed from the SNCM220 to SNCM439 and surface roughness and protective coating treatment are changed to increase the stress relaxation, respectively. From the result of the torsion test of shaft and accelerated life test of generator, the shaft of a SNCM439 with heat-treatment(Q/T) and electroless nickel plating was superior quality reliability and durability than the others. Therefore, modeling and simulation corresponded well with the experimental result and structural safety was confirmed by generator performing.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.204.1-204.1
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• 2014

스마트폰과 같은 통신기기 및 각종 전자제품에 있어 크기의 축소와 간소화 추세에 따라 인쇄회로기판(PCB)의 초미세회로설계 기술이 요구됨에 따라, 인쇄회로기판과 첨단 전자부품 사이의 접합 신뢰성을 향상시키기 위해 무전해 니켈 도금이 널리 사용되고 있다. 일반적으로, 무전해 Ni도금은 강산, 강염기성 용액을 이용하여 수행되고 있다. 따라서, 공정과정 중에 기판의 손상을 초래하기도 할뿐만 아니라, 환경적으로도 문제시 되고 있다. 본 연구에서는 친환경적 도금공정의 개발을 위해 중성에서 N-(B)무전해 도금을 시행하였다. 중성의 무전해 도금공정은 어떠한 기판을 사용하여도 기판의 손상없이 도금이 가능하다는 장점을 가지고 있고, Boron(B)은 Ni을 비정질화 시키는 물질로 알려져 있다. B가 첨가된 무전해 Ni도금 박막에 있어 B의 영향을 알아보기 위하여 중성조건에서 B를 포함한 DMAB의 첨가량을 조절하였다. Ni-(B) 무전해 도금 시 도금조의 온도는 $40^{\circ}C$로 하였고, 무전해 도금액의 pH는 7(중성)로 유지하였다. Cu Foil기판을 사용하여 DMAB의 양에 따라 성장된 Ni-B무전해 도금 박막의 특성을 분석하기 위해 X-ray Diffraction (XRD), Field Emission Scanning Electron Microscope (FE-SEM), Optical microscope (OM), X-ray Photoelectron Spectroscopy (XPS), X-ray Absorption Spectroscopy (XAS)을 이용하였다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2018.06a
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• pp.108-108
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• 2018

무전해 니켈도금 층은 마모, 마찰, 스크래치, tribology 등에 대한 내구성뿐만 아니라 내식성도 우수하여 산업현장에서 널리 적용되고 있다. 일반적으로 무전해 니켈도금 층의 내구성은 경도 값과 직접적인 상관관계를 가지며, 그 값은 약 $400-500H_V$ 정도이다. 이러한 무전해 도금 층에 대하여 약 $400^{\circ}C$에서 1시간 정도 열처리를 실시하면 경도 값은 약 $800-1000H_V$ 정도로 현저히 증가되고 내구성 역시 크게 향상시킬 수 있다. 그러나 해양환경에서 발생되는 캐비테이션 침식 부식에 대한 무전해 니켈도금 층의 열처리에 관한 연구는 거의 전무한 상태이다. 따라서 본 연구에서는 회주철의 캐비테이션 침식 부식을 방지하기 위해 무전해 니켈도금 후 다양한 온도와 시간으로 열처리를 실시하여 도금 층의 캐비테이션 침식 부식 특성을 평가하고자 하였다. 무전해 니켈코팅을 위한 모재는 회주철(FC250)을 $19.5mm{\times}19.5mm{\times}5mm$의 크기로 가공하였다. 도금조로 500mL 비커를 사용하였으며, 모든 시험편은 2시간 동안 무전해 니켈도금을 실시하였다. 그리고 캐비테이션 실험은 ASTM G32 규정에 의거하여 천연해수 내 $30^{\circ}C$에서 $50{\mu}m$의 진폭으로 실시하였다. 그 결과 열처리 적용 시 EN 도금의 표면경도가 현저히 증가하여 캐비테이션 침식 부식 저항성이 상당히 개선되었다.

• Proceedings of the KWS Conference
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• 2005.06a
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• pp.25-27
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• 2005

Sn-9Zn solder balls were bonded to Cu and ENIG (Electroless Nickel/Immersion Gold) pads, and the effect of aging on their joint reliability was investigated. The interfacial products were different from the general reaction layer formed in a Sn-base solder. The intermetallic compounds formed in the solder/Cu joint were $Cu_{5}Zn_{8}$ and $Cu_{6}Sn_{5}$. After aging treatment, voids formed irregularly at the bottom side of the solder because of Sn diffusion into the $Cu_{5}Zn_{8}$ IMC. In the case of the solder/ENIG joint, $AuZn_{3}$ IMCs were formed at the interface. In the case of the Sn-9Zn/ENIG, the shear strength remained nearly constant in spite of aging for 1000 hours at $150^{\circ}C$. On the other hand, in the case of the Sn-9Zn/Cu, the shear strength significantly decreased after aging at $150^{\circ}C$ for 100hours and then remained constant by further prolonged aging. Therefore, the protective plating layer such as ENIG must be used to ensure the mechanical reliability of the Sn-9Zn/Cu joint.