• 제목/요약/키워드: Ni/Au

검색결과 327건 처리시간 0.032초

Board Level Reliability Evaluation for Package on Package

  • 황태경
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2007년도 SMT/PCB 기술세미나
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    • pp.37-47
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    • 2007
  • Factor : Structure Metal pad & SMO size Board level TC test : - Large SMO size better Board level Drop test : - Large SMO size better Factor : Structure Substrate thickness Board level TC test : - Thick substrate better Board level Drop test : - Substrate thickness is not a significant factor for drop test Factor : Material Solder alloy Board level TC test : - Not so big differences over Pb-free solder and NiAu, OSP finish Board level Drop test : - Ni/Au+SAC105, CuOSP+LF35 are better Factor : Material Pad finish Board level TC test : - NiAu/NiAu is best Board livel Drop test : - CuOSP is best Factor : Material Underfill Board level TC test - Several underfills (reworkable) are passed TCG x500 cycles Board level Drop test : - Underfill lots have better performance than non-underfill lots Factor : Process Multiple reflow Board level TC test : - Multiple reflow is not a significant actor for TC test Board level Drop test : N/A Factor : Process Peak temp Board level TC test : - Higher peak temperature is worse than STD Board level Drop test : N/A Factor : Process Stack method Board level TC test : - No big difference between pre-stack and SMT stack Board level Drop test : - Flux dipping is better than paste dipping but failure rate is more faster

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Fabrication of Core-Shell Structure of Ni/Au Layer on PMMA Micro-Ball for Flexible Electronics

  • Hong, Sung-Jei;Jeong, Gyu-Wan;Han, Jeong-In
    • Current Photovoltaic Research
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    • 제4권4호
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    • pp.140-144
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    • 2016
  • In this paper, core-shell structure of nickel/gold (Ni/Au) conductive layer on poly-methyl-methacrylate (PMMA) micro-ball was fabricated and its conduction property was investigated. Firstly, PMMA micro-ball was synthesized by using dispersion polymerization method. Size of the ball was $2.8{\mu}m$ within ${\pm}7%$ deviation, and appropriate elastic deformation of the PMMA micro-ball ranging from 31 to 39% was achieved under 3 kg pressure. Also, 200 nm thick Ni/Au conductive layer was fabricated on the PMMA micro-ball by uniformly depositing with electroless-plating. Adhesion of the conductive layer was optimized with help of surface pre-treatment, and the layer adhered without peeling-off despite of thermal expansion by collision with accelerated electrons. Composite paste containing core-shell structured particles well cured at low temperature of $130^{\circ}C$ while pressing the test chip onto the substrate to make electrical contact, and electrical resistance of the conductive layer showed stable behavior of about $6.0{\Omega}$. Thus, it was known that core-shell structured particle of the Ni/Au conductive layer on PMMA micro-ball was feasible to flexible electronics.

SMT(Surface Mounting Technology)용 Cu 패드의 유기솔더보전제 처리공정 및 CTQ(Critical-to-Quality)분석 (Fabrication Process and CTQ Analysis of Organic Solderability Preservatives(OSP) Finish on Cu Pad for SMT)

  • 이효수;이민수
    • 마이크로전자및패키징학회지
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    • 제14권1호
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    • pp.1-9
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    • 2007
  • OSP(Organic Solderability Preservatives)표면처리는 저비용, 고신뢰성, 친환경 특성으로 기존의 금속계 표면처리인 Ni/Au 표면처리를 대체할 수 있는 공정으로 관심 받고 있다. 그러나, OSP는 저분자로 구성된 유기물이므로 여러 온도공정으로 구성된 전자패키지공정에서 제품의 변색이 필연적으로 발생하여 전체 양산수율에 미치는 영향은 매우 크다. 본 연구에서 OSP 처리된 제품을 전자패키지 공정별로 발생하는 변색수준에 따라서 시편을 분류 및 채취하여 변색원인분석 및 솔더조인트 특성평가를 수행하였으며, 기존의 표면처리공정인 Ni/Au 처리된 제품과 통계 적으로 비교 분석하였다. 따라서 변색원인에 대한 분석을 통하여 OSP 처리된 전자패키지 제품에 적용 시 발생하는 공정문제점에 대한 해결책을 제시하였다.

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티타늄과 비귀금속 합금에 중간층으로 적용한 Au bonding agent의 금속-도재 결합에 대한 평가 (Evaluation of Bond Strength in cp-Ti and Non-precious Metal-Ceramic System Using a Gold Bonding Agent)

  • 이정환;안재석
    • 대한치과기공학회지
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    • 제31권4호
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    • pp.15-23
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    • 2009
  • The aim of this study was to evaluate the bond strength of using a Au bonding agent applied on cp-Ti and nonprecious metal-gold-ceramic system. Metallic frameworks(diameter: 5mm, height: 20mm)(N=56, n=7per group) cast in Ni-Cr alloy, Co-Cr alloy and cp-Ti were obtained using acrylic templates and airborne particle abraded with $110{\mu}m$ aluminum oxide. Au bonding agent was applied on wash opaque firing as intermediate layer. SEM and SEM/EDS line profile were performed on the cutting the cross-section of the metal substrate-porcelain with intermediate Au coating. Groups were tested using shear bond strength(SBS) testing at 0.5mm/min. The mean SBS values for the ceramic-Au layer-metal combination were significantly higher than those ceramic-metal combination. While ceramic-Au layer-cp-Ti combinations failed to increase bond strength instead of using a titanium bonding porcelain. The appication of using Au intermediate layer significantly improve the bond strength combination with metal-ceramic system.

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PCBs의 스크랩으로부터 Au 용출과 회수 (The Leaching and Recovery of Au from Scrap of PCBs)

  • 유돈상;박천영
    • 한국지구과학회지
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    • 제35권4호
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    • pp.259-266
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    • 2014
  • 폐 PCBs의 스크랩으로부터 염소-차아염소산염 용액을 이용하여 Au와 Ag를 친환경적이고 효과적으로 용출시키고자 하였다. PCBs에 Cu, Sn, Sb, Al, Ni, Pb, Au 등과 같은 유용금속이 함유되어 있는 것을 EDS 분석으로 확인하였다. 최대 Au 용출율은 1%의 광액농도, 2:1의 염산:차아염소산나트륨 그리고 2 M의 NaCl 농도조건이다. Au 회수율이 가장 높은 메타중아황산나트륨 농도는 3 M에서였다. 염소-차아염소산염이 폐 컴퓨터에 함유되어 있는 Au와 Ag를 효과적으로 용출시킬 수 있는 용매제 임을 그리고 메타중아황산나트륨이 Au를 간단하게 침전시킬 수 있는 첨가제임을 확인하였다.

Sn계 무연 솔더에 관한 연구

  • 이창배;정승부;서창제
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2001년도 추계 기술심포지움
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    • pp.75-87
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    • 2001
  • Three different kinds of substrate used in this study : bare Cu substrate, Ni-P/Cu substrate with a Ni-P layer thickness of $5\mu\textrm{m},$ and Au/Ni-P/Cu substrate with the Ni-P and Au layers of $0.15\mu\textrm{m}$ and $5\mu\textrm{m}$ thickness respectively. The wettability of various Sn-base solders was affected by the substrate metal finish used, i.e., nickel, gold and copper. On the Au/Ni-F/Cu substrate, Sn-base solders wet better than any of the other substrate metal finishes tested. The interfacial reaction between various substrate and Sn-base solder was investigated at $70^{\circ}C,$ $100^{\circ}C,$ $120^{\circ}C,$ $150^{\circ}C,$ $170^{\circ}C$ and $200^{\circ}C$ for reaction times ranging from 0 day to 60 day. Intermetallic phases was formed along a Sn-base solder/ various substrate interface during solid-state aging. The apparent activation energy for growth of Sn-Ag/Cu, Sn-Ag-Bi/Cu, and Sn-Bi/Cu couples were 65.4, 88.6, and 127.9 Kj/mol, respectively. After isothermal aging, the fracture surface shoved various characteristics depending on aging temperature and time, and the types of BGA pad.

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몇가지 $d^8$ 전이금속-디포스핀 착물 ($MCl_2PP$)의 합성과 촉매적 응용 (M = $Ni^{2+}$, $Pd^{2+}$, $Pt^{2+}$, $Au^{3+}$ ; PP = diphosphines) (Synthesis Catalytic Application of Several$d^8Transition Metal Diphosphine Complexes, (MCl_2PP) (M = Ni^{2+}, Pd^{2+}, Pt^{2+}, Au^{3+} ; PP = diphosphines)$)

  • 박유철;김경채;조영제
    • 대한화학회지
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    • 제36권5호
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    • pp.685-691
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    • 1992
  • 디포스핀을 포함한 몇가지 $d^8$ 전이금속착물$(MCl_2PP)$은 출발물질 $K_nMCl_m$을 사용하여 합성하였다. 중심금속(M)은 Ni(II), Pd(II), Pt(II), Au(III)이며, 디포스핀(PP)은 bis(diphenylphosphino)methane(dppm), bis(diphenylphosphino)ethane(dppe), bis(diphenylphosphino)propane (dppp) 및 bis(diphenylphosphino)ethylene(dppety)이었다. 착물의 조성이나 특성은 원소분석과 $^1H-NMR$, $^{31}P-NMR$ 및 UV-Visible 스펙트럼을 이용하여 확인하였다. 이들 착물의 촉매적 활성은 3(2H)-furanone 및 cyclic carbonate 생성반응에 대하여 각각 조사하였다. 2-methyl-3-butyn-2-ol로부터 생성물 3(2H)-furanone을 얻은 반응 (1)에서 Ni(II)-, Pd(II)-diphosphine 착물은 좋은 촉매적 효과를 나타내었다. 그러나 이들 diphosphine 착물들은 cyclic carbonate 생성반응 (2)에 대해 촉매제로서의 활성을 거의 나타내지 않았다.

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신축성 전자패키지용 강성도 국부변환 신축기판에서의 플립칩 공정 (Flip Chip Process on the Local Stiffness-variant Stretchable Substrate for Stretchable Electronic Packages)

  • 박동현;오태성
    • 마이크로전자및패키징학회지
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    • 제25권4호
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    • pp.155-161
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    • 2018
  • 강성도가 서로 다른 polydimethylsiloxane (PDMS) 탄성고분자와 flexible printed circuit board (FPCB)로 이루어진 PDMS/FPCB 구조의 강성도 국부변환 신축기판에 $100{\mu}m$ 직경의 Cu/Au 범프를 갖는 Si 칩을 anisotropic conductive adhesive (ACA)를 사용하여 플립칩 본딩 후, ACA내 전도성 입자에 따른 플립칩 접속저항을 비교하였다. Au 코팅된 폴리머 볼을 함유한 ACA를 사용하여 플립칩 본딩한 시편은 $43.2m{\Omega}$의 접속저항을 나타내었으며, SnBi 솔더입자를 함유한 ACA로 플립칩 본딩한 시편은 $36.2m{\Omega}$의 접속저항을 나타내었다. 반면에 Ni 입자를 함유한 ACA를 사용하여 플립칩 본딩한 시편에서는 전기적 open이 발생하였는데, 이는 ACA내 Ni 입자의 함유량이 부족하여 entrap된 Ni 입자가 하나도 없는 플립칩 접속부가 발생하였기 때문이다.

Study of order-disorder transition in Pt-Ni bimetallic alloys

  • 서옥균;황재성;오필건;강현철;정희수;김찬;김대균;김윤희;이수웅;김기호;정건영;노도영
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2009년도 제38회 동계학술대회 초록집
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    • pp.403-403
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    • 2010
  • The Pt-Ni alloy is an electro-catalyst of interest in the low temperature direct methanol fuel cells(DMFCs). It has been already reported that the Pt-Ni alloy catalysts may even have enhanced activity compared to pure platinum catalyst, depending on how the surfaces are prepared. The order-disorder transition in bimetallic alloy such as $\beta$-CuZn, Cu3Au, and CuAu have been investigated greatly by x-ray diffraction. After annealing the bimetallic alloy, the crystal structure changes as observed in the order-disorder transition of Cu3Au which changes from the face centered cubic to a simple cubic structure. Pt-Ni bimetallic alloy has been already reported to have the face centered cubic structure. However, in nano-scale Pt-Ni bimetallic alloy crystals the crystal structures changes to a simple cubic structure. In this experiment, we have studied the order-disorder transition in Pt-Ni bimetallic nanocrystals. Pt/Ni thin films were deposited on sapphire(0001) substrates by e-beam evaporator and then Pt-Ni alloy were formed by RTA at 500, 600, and $700^{\circ}C$ in a vacuum environment and Pt-Ni nano particles were formed by RTA at $1059^{\circ}C$ in a vacuum environment. We measured the structure of Pt-Ni bimetallic alloy films using synchrotron x-ray diffraction and SEM.

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