• The Journal of the Institute of Internet, Broadcasting and Communication
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• v.12 no.2
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• pp.35-41
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• 2012

Due to the technology scaling, more transistors can be placed on a cache memories of a processor. However, processors become more vulnerable to the soft error because of the highly integrated transistors, and consequently, the reliability of the cache memory must consider seriously at the design space level. In this paper, we propose the reliability improving technique which can be achieved with low energy and low area overheads. The simulation experiments of the proposed scheme shows over 95.4% of protection rate against the soft error with only 0.26% of performance degradations. Also, It requires only 2.96% of extra energy consumption.