• Proceedings of the KSRS Conference
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• 2008.10a
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• pp.29-32
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• 2008

In this paper, we propose one unsupervised classification technique using the degree of polarization (DoP) and the co-polarized phase-difference (CPD) statistics, instead of the entropy and alpha. It is shown that the DoP is closely related to the entropy, and the CPD to the alpha. The DoP explains the feature how much the effect of multiple reflections is contained. Hence, the DoP could be used as an important factor for classifying classes. The CPD can also be computed from the measured Mueller matrix elements. For the smooth surface scattering, the CPD is about $0^{\circ}$, and for dihedral-type scattering, the CPD is about $180^{\circ}$. A DoP-CPD diagram with appropriate boundaries between six different classes is developed based on the SAR image. The classification results are compared with the existing Entropy-alpha diagram as well as the IPL-AirSAR polarimetric data. The technique may have capability to classify an SAR image into six major classes; a bare surface, a village, a crown-layer short vegetation canopy, a trunk-layer short vegetation canopy, a crown-layer forest, and a trunk-dominated forest. Based on the DoP and CPD analysis, a simple three-component decomposition technique was also proposed.

• Current Optics and Photonics
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• v.7 no.4
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• pp.428-434
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• 2023

The compensators used in spectroscopic ellipsometers are usually assumed to be ideal linear waveplates. In reality, however, they are elliptical waveplates, because they are usually made by bonding two or more linear waveplates of different materials with slight misalignment. This induces systematic error when they are modeled as linear waveplates. We propose an improved calibration method based on an optical model that regards an elliptical waveplate as a combination of a circular waveplate (rotator) and a linear waveplate. The method allows elimination of the systematic error, and the residual error of optic axis measurement is reduced to 0.025 degrees in the spectral range of 450-800 nm.