• 한국표면공학회지
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• 제49권4호
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• pp.368-375
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• 2016

MoN-Cu thin films were prepared to achieve appropriate properties of high hardness and low friction coefficient, which could be applied to automobile engine parts for reducing energy consumption as well as solving wear problems. Composite thin films of MoN-Cu have been deposited by various processes using multiple targets such as Mo and Cu. However, those deposition with multiple targets revealed demerits such as difficulties in exact control of composition and homogeneous deposition. This study is aiming for suggesting an appropriate process to solve those problems. A single alloying target of Mo-Cu (10 at%) was prepared by powder metallurgy methods of mechanical alloying (MA) and spar plasma sintering (SPS). Thin film of MoN-Cu was then deposited by magnetron sputtering using the single alloying target of Mo-Cu (10 at%). Properties of the resulting MoN-Cu thin film were examined and compared to those of MoN-Cu thin films prepared with double targets of Mo and Cu.

• 한국표면공학회지
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• 제52권4호
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• pp.227-232
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• 2019

Mo-N based coatings have been studied for enhancing mechanical characteristics of thin films. In the case of Mo-X-N coatings, the microstructure and mechanical properties can be affected by the addition of the third element. In this work, Mo-Cu-N coatings were successfully fabricated with varying the Cu content from 4.5 at% to 31 at% by the co-sputtering method. Thus, properties of the coatings were analyzed by EDS, SEM, XRD, AFM, nano indentation and scratch test techniques. From observed results, MoxN bonds were made in a nitrogen atmosphere and Cu elements were present at grain boundaries. In addition, coatings with the Cu content above 14 at% had a Cu3N peak in the XRD results. Thus, it is suggested that the formation of Cu3N phase affected the microstructure and mechanical properties of Mo-Cu-N coatings. Mechanical properties of Mo-Cu-N coatings were found to be relatively better at Cu content of about 12 at%.

• 한국표면공학회:학술대회논문집
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• 한국표면공학회 2015년도 춘계학술대회 논문집
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• pp.73-74
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• 2015

본 연구에서는 상호간의 고용도가 없는 Mo, Cu 재료의 합금화가 용이하도록 기계적 합금화법(Mechanical Alloying)을 이용하여 Mo-Cu 합금분말을 제조하였고, 준안정상태의 구조의 유지가 가능한 방전 플라즈마 소결법(Spark Plasma Sintering)을 이용하여 합금타겟을 제작하였다. Mo-Cu 박막을 제작하기 위해서 합금타겟을 이용하였고 스퍼터링 공정을 진행하여 박막을 제작하였다. 그 결과 Mo-10wt%Cu 단일타겟을 이용하여 제작한 박막의 경우 Ar : N 분위기에서 27.7GPa 로 가장 높은 경도값을 가지는 것을 확인하였다. 또한 Mo-5wt%Cu 단일타겟을 이용하여 Ar : N 분위기에서 제작한 박막은 건식조건에서의 마찰계수값이 0.69 로 가장 낮은 것을 확인할 수 있었으며 윤활조건(GF4)에서는 Mo-10wt%Cu 단일타겟을 이용하여 Ar : N 분위기에서 제작한 박막이 0.56 으로 가장 낮았다.

• 한국진공학회지
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• 제6권2호
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• pp.143-150
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• 1997

본 연구에서는 1000$\AA$두께의 Molybdenum화합물(Mo, Mo-N,$MoSi_2$, Mo-Si-N)의 Cu에 대한 확산방지막으로서의 특성을 면저항측정장비(four-point-probe), XRD, XPS, SEM, RBS 분석을 통하여 조사하였다. 각 박막층은 dc magnetron sputtering장비를 이용하 여 증착되었고 $300^{\circ}C$-$800^{\circ}C$의 온도구간에서 30분동안 진공열처리하였다. Mo 및 $MoSi_2$ 방지 막은 낮은 온도에서 확산방지막으로서의 특성파괴를 보였다. 결정립계를 통한 Cu의 확산과 Mo-실리사이드내의 Si의 Cu와의 반응이 그 원인인 것으로 사료된다. 질소를 첨가한 시편의 경우 확산방지특성 파괴온도는 Mo-N방지막의 경우 $650^{\circ}C$-30분, Mo-Si-N방지막의 경우 $700^{\circ}C$-30분으로 향상되었다. Cu와 Si의 확산은 방지막의 결정립계를 통하여 더욱 빠르게 확 산된다. 따라서 증착시 결정립계를 질소와 같은 물질로 채워 Cu와 Si의 확산을 저지할 수 있을 것으로 사료된다. 본 실험결과에서의 질소첨가는 이와 같은 stuffing 효과외에도 Mo- 실리사이드 박막의 결정화 온도를 다소 높인 것으로 나타났고, 그 결과 결정립계의 밀도를 감소시켜 확산방지막으로서의 특성을 향상시킨 것으로 사료된다. 또한 질소첨가는 실리사이 드내의 금속과 실리콘과의 비를 변화시켜 확산방지막의 특성에 영향을 미친 것으로 보인다. 본 실험에서 조사된 확산방지막 중에서는 Mo-Si-N박막이 Cu와 Si간의 확산을 가장 효과적 으로 저지시킨 것으로 나타났으며 $650^{\circ}C$-30분까지 안정한 특성을 보였다.

• Journal of Korean Vacuum Science & Technology
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• 제1권1호
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• pp.30-37
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• 1997

Interactions of Cu films with Si substrates separated by thin layers of molybdenum and molybdenum nitride were investigated in the viewpoint of diffusion barrier to copper. the diffusion barrier behavior of the layers was studied as functions of deposition and annealing conditions by cross-sectional transmission electron microscopy and Nomarski microscopy. the layers deposited at $N_2$ gas ratios of 0.4 and 0.5 exhibited good diffusion barrier behaviors up to $700^{\circ}C$, mainly due to the phase transformation of molybdenum to $\gamma$-Mo$_2$N phase. The increase in the N gas ratio in deposition elevates the lower limit of barrier failure temperature. Futhermore, amorphous molybdenum nitride films deposited at 20$0^{\circ}C$ and 30$0^{\circ}C$ did not fail, while the crystalline $\gamma$-Mo$_2$N films deposited at 40$0^{\circ}C$ and 50$0^{\circ}C$ showed signs of interlayer interactions between Cu and Si after annealing at 75$0^{\circ}C$ for 30 minutes. Therefore, the amorphous nature of the molybdenum nitride layer enhanced its ability to reduce Cu diffusion and its stability as a diffusion barrier at elevated temperatures.

• 한국재료학회지
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• 제17권9호
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• pp.484-488
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• 2007

Mo(Ti) alloy and pure Cu thin films were subsequently deposited on $SiO_2-coated$ Si wafers, resulting in $Cu/Mo(Ti)/SiO_2$ structures. The multi-structures have been annealed in vacuum at $100-600^{\circ}C$ for 30 min to investigate the outdiffusion of Ti to Cu surface. Annealing at high temperature allowed the outdiffusion of Ti from the Mo(Ti) alloy underlayer to the Cu surface and then forming $TiO_2$ on the surface, which protected the Cu surface against $SiH_4＋NH_3$ plasma during the deposition of $Si_3N_4$ on Cu. The formation of $TiO_2$ layer on the Cu surface was a strong function of annealing temperature and Ti concentration in Mo(Ti) underlayer. Significant outdiffusion of Ti started to occur at $400^{\circ}C$ when the Ti concentration in Mo(Ti) alloy was higher than 60 at.%. This resulted in the formation of $TiO_2/Cu/Mo(Ti)\;alloy/SiO_2$ structures. We have employed the as-deposited Cu/Mo(Ti) alloy and the $500^{\circ}C-annealed$ Cu/Mo(Ti) alloy as gate electrodes to fabricate TFT devices, and then measured the electrical characteristics. The $500^{\circ}C$ annealed Cu/Mo($Ti{\geq}60at.%$) gate electrode TFT showed the excellent electrical characteristics ($mobility\;=\;0.488\;-\;0.505\;cm^2/Vs$, on/off $ratio\;=\;2{\times}10^5-1.85{\times}10^6$, subthreshold = 0.733.1.13 V/decade), indicating that the use of Ti-rich($Ti{\geq}60at.%$) alloy underlayer effectively passivated the Cu surface as a result of the formation of $TiO_2$ on the Cu grain boundaries.

• 한국자기학회지
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• 제17권2호
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• pp.95-98
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• 2007

본 연구에서는 하지층으로 사용한 Mo(MoN)의 두께 변화에 따른 스핀밸브 구조의 자기적 특성과 열처리 결과를 비교 검토하였다. 사용된 스핀밸브는 Si 기판/Mo(MoN)$(t{\AA})/NiFe(21{\AA})/CoFe(28{\AA})/Cu(22{\AA})/CoFe(18{\AA})/IrMn(65{\AA})/Ta(25{\AA})$ 구조이다. 또한 본 연구에서는 MoN 하지층을 Si 기판에 증착하여 열처리후 특성을 분석하였다. Mo 박막에 비해 MoN 박막의 질소량이 증가할수록 증착률은 감소하였고, 비저항은 증가하였다. MoN 하지층을 사용한 경우 Mo의 경우보다 하지층 두께 변화($51{\AA}$까지)에 따라 자기저항비와 교환결합력의 변화는 소폭이었다. Mo 하지층의 열처리 온도별 자기저항비는 열처리 전 상온에서 2.86% 이었고, $200^{\circ}C$ 열처리 때 2.91 %로 증가하였다. 이후 열처리 온도를 $300^{\circ}C$까지 증가시키면 자기저항비는 2.91 %에서 2.16%로 감소하였다. 질소 유입량이 1 sccm인 MoN의 열처리 온도별 자기저항비는 열처리 전 상온에서 5.27%, $200^{\circ}C$일때 5.56%증가하였다. 이후 열처리 온도를 $300^{\circ}C$까지 증가시키면 자기저항비는 5.56%에서 4.9%로 감소하였다.

• 한국반도체및디스플레이장비학회:학술대회논문집
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• 한국반도체및디스플레이장비학회 2005년도 춘계 학술대회
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• pp.139-145
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• 2005

In the study, in order to deposit TaN thin film using diffusion barrier and bottom electrode we made the Plasma Assisted ALD equipment and confirmed the electrical characteristic of TaN thin films deposited PAALD method, PAALD equipment depositing TaN thin film using PEMAT(pentakis(ethylmethlyamlno) tantalum) Precursor and $NH_3$ reaction gas is aware that TaN thin film deposited of high density and amorphous phase with XRD measurement The degree of diffusion and react ion taking place in Cu/TaN(deposited using 150 W PAALD)/$SiO_2$/Si systems with increasing annealing temperature was estimated from MOS capacitor property and the $SiO_2(600\;\AA)$/Si system surface analysis by C-V measurement and secondary ion material spectrometer(SIMS) after Cu/TaN/$SiO_2(400\;\AA)$ system etching. TaN thin film deposited PAALD method diffusion barrier have a good diffusion barrier property up to $500^{\circ}C$.

• 반도체디스플레이기술학회지
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• 제4권2호
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• pp.39-43
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• 2005

In the study, in order to deposit TaN thin film for diffusion barrier and bottom electrode we made the Plasma Assisted ALD equipment and confirmed the electrical characteristics of TaN thin films grown PAALD method. Plasma Assisted ALD equipment depositing TaN thin film using PEMAT(pentakis(ethylmethlyamino) tantalum) precursor and NH3 reaction gas is shown that TaN thin film deposited high density and amorphous phase with XRD measurement. The degree of diffusion and reaction taking place in Cu/TaN (deposited using 150W PAALD)/$SiO_{2}$/Si systems with increasing annealing temperature was estimated for MOS capacitor property and the $SiO_{2}$, (600${\AA}$)/Si system surface analysis by C-V measurement and secondary ion material spectrometer (SIMS) after Cu/TaN/$SiO_{2}$ (400 ${\AA}$) layer etching. TaN thin film deposited PAALD method diffusion barrier have a good diffusion barrier property up to 500$^{\circ}C$.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 하계학술대회 논문집 C
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• pp.1397-1399
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• 2002

Effects of bottom electrode materials (Al, Cu, Ti, and Mo), included in film bulk acoustic resonators (FBARs), on the orientation of piezoelectric AlN thin films and the frequency response characteristic of resonators were investigated. The texture coefficient (TC) for (002) orientation, crystallite size, full width half maximum (FWHM), and surface roughness of deposited AlN films were measured for the various bottom electrodes. The return tosses estimated from the frequency responses of fabricated resonators were also compared. Experimental results showed that the difference of lattice constant and thermal expansion coefficient between the bottom electrode and the AlN film were the most important factors for achieving a high performance resonator.