• 제목/요약/키워드: Metal organic chemical vapor deposition

검색결과 314건 처리시간 0.03초

ε-Ga2O3 박막 성장 및 MSM UV photodetector의 전기광학적 특성 (Thin film growth of ε-Ga2O3 and photo-electric properties of MSM UV photodetectors)

  • 박상훈;이한솔;안형수;양민
    • 한국결정성장학회지
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    • 제29권4호
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    • pp.179-186
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    • 2019
  • 본 연구에서는 $Ga_2O_3$ 박막의 구조적 특성과 Ti/Au 전극을 증착하여 제작된 metal-semiconductor-metal (MSM) photodetector 소자의 광학적, 전기적 특성에 대해 연구하였다. 유기 금속 화학 증착법(metal organic chemical vapor deposition, MOCVD)을 이용해 서로 다른 온도에서 $Ga_2O_3$ 박막을 성장하였다. 성장온도에 따라 $Ga_2O_3$의 결정상이 ${\varepsilon}$-상에서 ${\beta}$-상으로 변화하는 것을 확인할 수 있었다. X-선 회절 분석(X-ray diffraction, XRD) 결과로 ${\varepsilon}-Ga_2O_3$의 결정구조를 확인하였고, 주사 전자 현미경(scanning electron microscopy, SEM) 이미지로 결정구조의 형성 메커니즘에 대해 논의하였다. 음극선 발광(Cathode luminescence, CL) 측정으로 $Ga_2O_3$의 발광성 천이에 관여하는 에너지 준위의 형성 원인에 대해 논의하였다. 제작된 MSM photodetector 소자의 외부 광에 대한 전류-전압 특성과 시간 의존성 on/off 광 응답 특성을 통해 ${\varepsilon}-Ga_2O_3$로 제작한 photodetector는 가시광보다 266 nm UV 파장 영역에서 훨씬 뛰어난 광전류 특성을 보이는 것을 확인하였다.

붕소도핑 다이아몬드 전극을 이용한 수용성 폐절삭유의 전기화학적 특성연구 (A Study on the Electrochemical Properties of Water-soluble Waste Cutting Oil using Boron-Doped Diamond Electrodes)

  • 박진혁;김태규
    • 열처리공학회지
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    • 제35권6호
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    • pp.337-342
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    • 2022
  • In metal cutting, water-soluble cutting oil is used for cooling the surface of the workpiece and improving the surface roughness. However, waste cutting oil contains preservatives and surfactants, and if it is discarded as it is, it has an great influence on environmental pollution. For this reason, regulations on the use of cutting oil are being stricter. Hence, the development of eco-friendly treatment technologies is required. In this study, a diamond electrode doped with boron on a niobium substrate was deposited by thermal filament chemical vapor deposition and waste cutting oil was treated using an electrochemical method. Compared to the total amount of organic carbon contained in the waste cutting oil, it was confirmed that the boron-doped diamonds developed from this study showed much better performance than electrodes that has been widely used before.

A Study of the Change of Hall Effect as a Function of the V/III Ratio in n-GaAs compound Semiconductors

  • Kim, In-Sung
    • Transactions on Electrical and Electronic Materials
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    • 제10권4호
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    • pp.107-110
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    • 2009
  • In this study, the Hall effect has been studied in n-GaAs samples characterized by V/IIl growth ratios of 25, 50 and 100 and prepared by metal organic chemical vapor deposition. For the Hall effect measurements, the grown samples were cut to a size of 1${\times}$1 cm. The measurements were carried out at room temperature, using Indium contact metal at the four corners of the samples. According to the experimental results, the Schottky effect was not ovservation. Also for the n-GaAs sample of V/Ill 100 ratio the electron drift velocity was very high.

380-nm Ultraviolet Light-Emitting Diodes with InGaN/AlGaN MQW Structure

  • Bae, Sung-Bum;Kim, Sung-Bok;Kim, Dong-Churl;Nam, Eun Soo;Lim, Sung-Mook;Son, Jeong-Hwan;Jo, Yi-Sang
    • ETRI Journal
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    • 제35권4호
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    • pp.566-570
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    • 2013
  • In this paper, we demonstrate the capabilities of 380-nm ultraviolet (UV) light-emitting diodes (LEDs) using metal organic chemical vapor deposition. The epi-structure of these LEDs consists of InGaN/AlGaN multiple quantum wells on a patterned sapphire substrate, and the devices are fabricated using a conventional LED process. The LEDs are packaged with a type of surface mount device with Al-metal. A UV LED can emit light at 383.3 nm, and its maximum output power is 118.4 mW at 350 mA.

Atomic layer deposition of In-Sb-Te Thin Films for PRAM Application

  • Lee, Eui-Bok;Ju, Byeong-Kwon;Kim, Yong-Tae
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.132-132
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    • 2011
  • For the programming volume of PRAM, Ge2Sb2Te5(GST) thin films have been dominantly used and prepared by physical vapor deposition (PVD), chemical vapor deposition (CVD), atomic layer deposition (ALD). Among these methods, ALD is particularly considered as the most promising technique for the integration of PRAM because the ALD offers a superior conformality to PVD and CVD methods and a digital thickness control precisely to the atomic level since the film is deposited one atomic layer at a time. Meanwhile, although the IST has been already known as an optical data storage material, recently, it is known that the IST benefits multistate switching behavior, meaning that the IST-PRAM can be used for mutli-level coding, which is quite different and unique performance compared with the GST-PRAM. Therefore, it is necessary to investigate a possibility of the IST materials for the application of PRAM. So far there are many attempts to deposit the IST with MOCVD and PVD. However, it has not been reported that the IST can be deposited with the ALD method since the ALD reaction mechanism of metal organic precursors and the deposition parameters related with the ALD window are rarely known. Therefore, the main aim of this work is to demonstrate the ALD process for IST films with various precursors and the conformal filling of a nano size programming volume structure with the ALD?IST film for the integration. InSbTe (IST) thin films were deposited by ALD method with different precursors and deposition parameters and demonstrated conformal filling of the nano size programmable volume of cell structure for the integration of phase change random access memory (PRAM). The deposition rate and incubation time are 1.98 A/cycle and 25 cycle, respectively. The complete filling of nano size volume will be useful to fabricate the bottom contact type PRAM.

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MOCVD법에 의한 YBCO coated conductor용 YSZ 완충층 제작 (Fabrication of YSZ buffer layer for YBCO coated conductor by MOCVD method)

  • 선종원;김형섭;정충환;전병혁;김찬중
    • 한국초전도저온공학회:학술대회논문집
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    • 한국초전도저온공학회 2003년도 학술대회 논문집
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    • pp.129-132
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    • 2003
  • Yttria stabilized zirconia (YSZ) buffer layers were deposited by a metal organic chemical vapor deposition (MOCVD) technique using single liquid source for the application of YBa$_2$Cu$_3$$O_{7-x}$ (YBCO) coated conductor. Y:Zr mole ratio was 0.2:0.8, and tetrahydrofuran (THF) was used as a solvent. The (100) single crystal MgO substrate was used for searching deposition condition. Bi-axially oriented CeO$_2$ and NiO films were fabricated on {100}〈001〉 Ni substrate by the same method and used as templates. At a constant working pressure of 10 Torr, the deposition temperatures (660~80$0^{\circ}C$) and oxygen flow rates (100~500 sccm) were changed to find the optimum deposition condition. The best (100) oriented YSZ film on MgO was obtained at 74$0^{\circ}C$ and $O_2$ flow rate of 300 sccm. For YSZ buffer layer with this deposition condition on CeO$_2$/Ni template, full width half maximum (FWHM) values of the in-plane and out-of-plane alignments were 10.6$^{\circ}$ and 9.8$^{\circ}$, respectively. The SEM image of YSZ film on CeO$_2$/Ni showed surface morphologies without microcrack.k.

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Fabrication of YBCO thin film on a cube-textured Ni substrate by metal organic chemical vapor deposition (MOCVD) method

  • 이영민;이희균;홍계원;신형식
    • 한국초전도학회:학술대회논문집
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    • 한국초전도학회 2000년도 High Temperature Superconductivity Vol.X
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    • pp.56-60
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    • 2000
  • Cube texture를 갖는 Ni기판위에 MOCVD(Metal Chemical Vapor Deposition)를 이용하여 NiO, CeO$_2$, YBCO 박막을 제조하였다. NiO(200)와 CeO$_2$(200) buffer layer는 450${\sim}$470$^{\circ}$C에서 10분간 MOCVD방법으로 (100)<001>Ni 기판위에 직접 증착하였다. 제조된 NiO, CeO$_2$ buffer layer는 조직이 치밀하며 표면의 상태가 매우 좋으며 Ni기판 위에 epitaxial하게 성장하였다. NiO는 Ni기판과 NiO<100>//Ni<100>의 방위관계를 가지고 성장하였으며, CeO$_2$는 증착조건에 따라 CeO$_2$ <100>//Ni<100> 및 CeO$_2$ <110>//Ni<100> 의 방위관계를 가지고 성장하였다. 증착된 NiO막과 CeO$_2$막에서 균열은 발생하지 않았다. MOCVD법으로 표면에 biaxial texture를 갖는 ceramic buffer를 증착시킨 NiO/Ni및 CeO$_2$/Ni 기판위에 YBCO박막을 MOCVD법으로 제조하였다. YBCO막은 기판온도 800$^{\circ}$C,증착압력 10torr, 산소분압을 0.7torr로 하여 10분간 행하였다. 공급원료의 조성에 따라 YBCO의 막의 texture와 형성되는 상이 변화되었다. NiO/Ni및 CeO$_2$/Ni 기판 위에 증착된 YBCO막은 c축 배향성을 가지고 성장하였으며, -scan 및 ${\varphi}$ -scan으로 측정한 (500)면의 in-plane과 (110)면의 out-of-plane의 FWHM(Full Width Half Maximum)값은 각각 10$^{\circ}$ 미만으로 우수하였다.

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Effect of Plasma Pretreatment on Superconformal Cu Alloy Gap-Filling of Nano-scale Trenches

  • 문학기;이정훈;이수진;윤재홍;김형준;이내응
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2011년도 제40회 동계학술대회 초록집
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    • pp.53-53
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    • 2011
  • As the dimension of Cu interconnects has continued to reduce, its resistivity is expected to increase at the nanoscale due to increased surface and grain boundary scattering of electrons. To suppress increase of the resistivity in nanoscale interconnects, alloying Cu with other metal elements such as Al, Mn, and Ag is being considered to increase the mean free path of the drifting electrons. The formation of Al alloy with a slight amount of Cu broadly studied in the past. The study of Cu alloy including a very small Al fraction, by contrast, recently began. The formation of Cu-Al alloy is limited in wet chemical bath and was mainly conducted for fundamental studies by sputtering or evaporation system. However, these deposition methods have a limitation in production environment due to poor step coverage in nanoscale Cu metallization. In this work, gap-filling of Cu-Al alloy was conducted by cyclic MOCVD (metal organic chemical vapor deposition), followed by thermal annealing for alloying, which prevented an unwanted chemical reaction between Cu and Al precursors. To achieve filling the Cu-Al alloy into sub-100nm trench without overhang and void formation, furthermore, hydrogen plasma pretreatment of the trench pattern with Ru barrier layer was conducted in order to suppress of Cu nucleation and growth near the entrance area of the nano-scale trench by minimizing adsorption of metal precursors. As a result, superconformal gap-fill of Cu-Al alloy could be achieved successfully in the high aspect ration nanoscale trenches. Examined morphology, microstructure, chemical composition, and electrical properties of superfilled Cu-Al alloy will be discussed in detail.

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Deposition of CuInSe2 Thin Films Using Stable Copper and Indium-selenide Precursors through Two-stage MOCVD Method

  • Park, Jong-Pil;Kim, Sin-Kyu;Park, Jae-Young;Ok, Kang-Min;Shim, Il-Wun
    • Bulletin of the Korean Chemical Society
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    • 제30권4호
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    • pp.853-856
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    • 2009
  • Highly polycrystalline copper indium diselenide (CuInSe2, CIS) thin films were deposited on glass or ITO glass substrates by two-stage metal organic chemical vapor deposition (MOCVD) at relatively mild conditions, using Cuand In/Se-containing precursors. First, pure Cu thin film was prepared on glass or ITO glass substrates by using a single-source precursor, bis(ethylbutyrylacetate)copper(II) or bis(ethylisobutyrylacetato)copper(II). Second, on the resulting Cu films, tris(N,N-ethylbutyldiselenocarbamato)indium(III) was treated to produce CuInSe2 films by MOCVD method at 400 ${^{\circ}C}$. These precursors are very stable in ambient conditions. In our process, it was quite easy to obtain high quality CIS thin films with less impurities and uniform thickness. Also, it was found that it is easy to control the stoichiometric ratio of relevant elements on demands, leading to Cu or In rich CIS thin films. These CIS films were analyzed by XRD, SEM, EDX, and Near-IR spectroscopy. The optical band gap of the stoichiometric CIS films was about 1.06 eV, which is within an optimal range for harvesting solar radiation energy.

유기금속화학기상증착법을 이용한 전이금속 칼코게나이드 단일층 및 이종구조 성장 (Metal-organic Chemical Vapor Deposition of Uniform Transition Metal Dichalcogenides Single Layers and Heterostructures)

  • 장수희;신재혁;박원일
    • 마이크로전자및패키징학회지
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    • 제27권4호
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    • pp.119-125
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    • 2020
  • 1.1~2.1eV의 직접 천이형 밴드갭을 가지는 전이금속 칼코게나이드(Transition Metal Dichalcogenide, TMDC)는 빛에 대한 반응성이 크고 구조적 특징상 2차원 물질들과의 수직 이종접합구조를 형성하기 용이하다는 장점으로 차세대 광전소자와 반도체소자 물질로서 대두되고 있다. 하지만 TMDC를 얻는 공정들의 한계로 인해 고품질, 대면적의 수직이종접합구조의 형성에 어려움이 존재한다. 본 연구에서는 MOCVD 시스템을 제작하고, 단일층 TMDC 및 이들의 이종구조에 제조에 대한 연구를 수행하였다. 특히, 버블러 타입의 유기금속화합물 소스를 활용하여, 반응기 내로 유입되는 소스의 농도와 유량을 정밀하게 조절함으로써 전면적으로 균일한 박막을 얻을 수 있다. MOCVD로 MoS2, WS2 박막을 성장시키고 주사전자현미경, UV-visible spectrophotometer, Raman spectroscopy, photoluminescence 분석을 진행하여 균일한 박막을 성장시켰음을 확인하였다. 또한, MoS2 박막에 WS2 박막을 직접 성장시킴으로써 MoS2/WS2 수직 이종접합구조를 형성하였다.