• Title/Summary/Keyword: Mask Propagation

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Main causes of missing errors during software testing

  • Young-Mi Kim;Myung-Hwan Park
    • Journal of the Korea Society of Computer and Information
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    • v.29 no.6
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    • pp.89-100
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    • 2024
  • The primary goal of software testing is to identify and correct errors within software. A key challenge in this process is error masking, where errors disappear internally before reaching the output. This paper investigates the causes and characteristics of error masking, which complicates software testing. The study involved injecting artificial errors into three software programs to examine the extent of error masking by various test cases and to explore the underlying reasons. The experiment yielded four major findings. First, about 50% of the error masking occurred because the errors were not executed. Second, among various operators, logical and arithmetic operators masked errors less frequently, while relational and temporal operators tended to mask errors more extensively. Third, certain test cases demonstrated exceptional effectiveness in propagating errors to the output. Fourth, the type of error injected influenced the masking effect.

Flexible Optical Waveguide Film with Embedded Mirrors for Short-distance Optical Interconnection (근거리 광연결용 미러 내장형 연성 광도파로 필름)

  • An, Jong Bae;Lee, Woo-Jin;Hwang, Sung Hwan;Kim, Gye Won;Kim, Myoung Jin;Jung, Eun Joo;Rho, Byung Sup
    • Korean Journal of Optics and Photonics
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    • v.23 no.1
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    • pp.12-16
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    • 2012
  • In the paper, we fabricated a Ni master with $45^{\circ}$-mirror structures for flexible waveguide fabrication. The flexible waveguide films with embedded $45^{\circ}$-angled mirrors at the waveguide ends were successfully fabricated using a UV-imprint process. Next, in order to enhance the reflectivity of the mirrors, Ni(3 nm)-Au(200 nm) bilayers were evaporated on the $45^{\circ}$-angled facets through a locally opened thin mask using an electron beam evaporator. We measured propagation loss, bending loss, mirror loss and bending reliability of the fabricated waveguide.