• Journal of the Institute of Electronics Engineers of Korea SD
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• v.37 no.4
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• pp.71-79
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• 2000

The original March algorithms cannot detect CMOS ADOFs(Address Decoder Open Faults) which requires separate deterministic test patterns. Modified March algorithm using DOF(Degree of Freedom) was suggested to detect these faults in addition to conventional stuck faults. This paper augments the modified march test to further capture NPSFs(Neighborhood Pattern Sensitive Faults). Complete CA(Cellular Automata) is used for address generation and Rl-LFSRs(Randomly Inversed LFSRs) for data generation. A new modified March algorithm can detect SAF, CF, TF, CMOS ADOFs, and part of NPSFs. Time complexity of this algorithm is still O(n).