• Journal of Magnetics
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• v.5 no.4
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• pp.135-138
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• 2000

In order to study the effect of the magnetic anisotropy on the giant magnetoresistance in a Co/Cu multilayered system, the angle dependent magnetoresistance (MR) was measured. The experimental results showed that the maximum MR ratio depends on the angle between the direction of the applied field and the easy axis. The angular modulation of the MR ratio can be explained by the alignments of the two 'effective' magnetization vectors that are bound to their own easy axes. Two maxima observed in MR loops at the second antiferromagnetic maximum are discussed in relation to the magnetic anisotropy, The simulated results under the assumption of the existence of two in-plane easy axes in the sample are compared with the experiments.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.11a
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• pp.355-358
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• 2000

Magnetoresistance changes of NiFe thin films were investigated as a function of deposition temperature. DC magnetron sputtering was employed to fabricate Ta/NiFe(t)/Ta thin films on Si(001) substrates with in-situ field or with no-field. The thickness(t) of NiFe films was a range of 4 to 15nm. Substrate temperature was a range of 30 to 400$^{\circ}C$. MR measurement was carried out as a function of angle $\theta$, between external field and current direction. MR ratio increased with increasing substrate temperature, also, max. MR ratio was observed in samples deposited at 300$^{\circ}C$. With increasing upto 400$^{\circ}C$, MR ratio was rapidly decreased in the case of thinner NiFe films. In non-field deposited NiFe films, both angle $\theta$=0, 90。, there was no significant change in MR curves. However, MR curves of in-situ field deposited NiFe films were different in both angles $\theta$=0 and 90。

• Journal of the Korean Magnetics Society
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• v.14 no.4
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• pp.115-119
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• 2004

We measured in-plane 2 dimensional magnetization vector using two pick-up coil sets and investigate the relationship between magnetization vector and anisotropic magnetoresistance. We can determine magnetization vector by measuring magnetic moment in x and y direction simultaneously. As the uniaxial magnetic anisotropy of permalloy film increases, magnetoresistance approaches the expectation which is calculated from the angle between current vector and magnetization vector. Magnetoresistance ratio is linearly proportional to the y moment magnitude which is parallel to the current direction.

• Journal of the Korean Magnetics Society
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• v.7 no.2
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• pp.82-89
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• 1997

Dependence of magnetoresistance on the thickness of Cu, type and thickness of buffer layer, and the stacking number of multilayer in the form buffer /$[Co(17{\AA}/Cu(t{\AA})]_{20}$ were investigated. To evaluate effect of annealing on this samples, X-ray diffraction analysis, vibrating sample magnetometer analysis, and magnetoresistance measurement (4-probe method) were performed. The magnetoresistance ratio exhibits a maximum of 21% for the multilayer with Cu thickness of 24$\AA$ and Fe buffer layer thickness of 50$\AA$. Deposition of film under low base pressure induces in increase magnetoresistance ratio by preventing oxidation. The multilayer annealed below 30$0^{\circ}C$ temperature allowed larger textured grain without loss in the periodicity. Magnetoresistance ratios of the multilayer with Cu thickness of 24$\AA$ and 36$\AA$ were increased due to the increase in the antiferromagnetically coupled fraction after annealing.

• Journal of the Korean Magnetics Society
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• v.6 no.6
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• pp.411-416
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• 1996

We have studied the effect of a spin-dependence interface electron scattering on the giant magnetoresistance by adding a Fe magnetic material to the Co/Cu interfaces. The $Fe(50\;{\AA})/[Co(17\;{\AA})/Fe(t\;{\AA})/Cu(24\;{\AA})]_{20}$ multilayers are deposited on the Corning glass 2948 and 7059 substrates in a dc magnetron sputtering system. The magnetoresistance ratio is 22 % in the only Co/Cu multilayer, while it is increased to 26 % with inserted ultra thin Fe interface layer and reduced with increasing thickness of the Fe interface layer. It was investigated to the dependence of the magnetoresistance behaviors on annealing temperature. The magnetic properties of the multilayers were measured by vibrating sample magnetometer. Also, the structures and the surface roughness of samples were characterized by X-ray diffraction and atomic force microscope, respectively. The magnetoresistance ratio was increased to annealing temperature $300^{\circ}C$, but reduced at the temperature higher than $300^{\circ}C$ due to the interfacial diffuse.

• Journal of the Korean Magnetics Society
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• v.5 no.5
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• pp.456-460
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• 1995

Giant magnetoresistance(GMR) of $Cu_{85-x}Co_{15}Ni_{x}$ melt-spu ribbons is closely correlated with the microstructure produced by the spinodal decomposition. The solid solution range is extanded by the replacement of Cu by Ni in the as-quenched state. The wavelengths obtained by subsequent isothermal aging in Cu-Co-Ni ribbons are shorter than those in Cu-Co binary ribbons, resulting in the increase of the surface-to-volume ratio. The largest MR ratio of 8 % in high field has been achieved in the $Cu_{80}Co_{15}Ni_{5}$ aged ribbon. The field dependence of MR ratio in low fields becomes larger with the Ni content.

• Proceedings of the IEEK Conference
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• 1999.06a
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• pp.950-953
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• 1999

Spin tunneling giant magnetoresistance effect was studied to utilize in the application of random access memory. Ferromagnetic/Insulator/Ferromagnetic films were sputtered on glass substrates and perpendicular current was applied. Measurements of magneto- resistance of the junction showed 8.6% of MR ratio. Voltage output depends on the magnetization directions of the write line and read line, thus enabling the system to be used as a random access memory

• Journal of Magnetics
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• v.3 no.1
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• pp.36-38
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• 1998

We measure the magnetoresistance (MR) of sputtered Permalloy ($Ni_{83}Fe_{17}$) films with external strains produced by piezoelectric tranducer actuators. We observe that the MR raito was increased by 2.3 times by a compressive strain of $3.5{\times}10^{-4}$ compared to that of the as-deposited film. Tensile strains and compressive strains reduced the MR ratio. These observations suggest that it is possible to tune the MR properties through the use of the external strains. We expect to apply the results for the multi-head magnetic recorders with selectively activated recording heads.

• Journal of Magnetics
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• v.12 no.4
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• pp.152-155
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• 2007

Spin dependent transport was investigated in lateral $Py(Ni_{81}Fe_{19})/Au/Py$ spin valve devices. Clear spin valve effect was observed in conventional four-terminal measurement geometry. Higher resistance was found in antiparallel magnetization field of two Py electrodes which is determined by anisotropy magnetoresistance (AMR) measurements. The rectangular shape of spin signal together with good agreement of switching field convinces observed spin valve signal is resulted from effective spin injection and detection. The magnetoresistance ratio decays exponentially with channel length by which spin diffusion length of Au channel was estimated to be 76 nm.

• Journal of the Korean Magnetics Society
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• v.5 no.3
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• pp.203-209
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• 1995

A study of the dependence of the magnetoresistance in $glass\[Cu_{x\AA}\NiFe_{50\AA}\Cu_{x\AA}\Co_{50\AA}](X;\=\;8,\;10,\;14,\;18,\;22,\;26,\;28,\;38,\;48,\;58\;\AA,\;N\;=\;2,\;3,\;4,\;10,\;20)$ multilayers prepared by dc magnetron sputtering on the interlayer thickness of Cu (X), the number of multylayer(N) and annealing temperature has been performed. Resistance measurement were made by four terminal method, and the magnetic field applied to perpendicular and parallel for the current. The maximum magnetoresistance(MR) ratio(%) was appeared in the vicinity of $10\;\AA$ in Cu layer, and it was oscillated with the thickness of Cu. The MR ratio was increased with the number of layers N, however the ratio for the N = 4 layers decreased rather than the N = 3 layers. The dependence of the ratio on the annealing temperature was increased to $250^{\circ}C$.