• Title/Summary/Keyword: MIM device

Search Result 96, Processing Time 0.035 seconds

A Study on the MIM diode for LCD Device (LCD소자용 MIM 다이오드의 특성연구)

  • 최광남;이명재;곽성관;정관수;김동식
    • Journal of the Korean Vacuum Society
    • /
    • v.12 no.1
    • /
    • pp.40-45
    • /
    • 2003
  • High quality $Ta_2O_5$ thin films have been obtained from the anodization of deposited tantalum (Ta). The as-deposited amorphous films of 750 $\AA$ thickness have excellent electrical properties. These properties include refractive indices 2.1~2.2 dielectric constants ~25, and leakage currents $10^{-8}$ /A$\textrm{cm}^{-2}$ at 1 MV$\textrm{cm}^{-1}$. We fabricated a MIM element with the $Ta_2O_5$ films. They have perfect current-voltage symmetry characteristics. A high performance MIM device was formed by newly developed processes based on our unique anodization and annealing treatment. The effects of various processing conditions (top-electrode metals, annealing conditions) on the MIM device performances will be extensively discussed throughout this work.

A Study on Displacement Current Characteristics of DMPC Monolayer (II) (DMPC 인지질 단분자막의 변위전류 특성 연구 (II))

  • Song, Jin-Won;Lee, Kyung-Sup;Choi, Yong-Sung
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.56 no.2
    • /
    • pp.343-348
    • /
    • 2007
  • The physical properties of DMPC monolayer were made for dielectric relaxation phenomena by the detection of the surface pressures and displacements current. Lipid thin films were deposited by accumulation and the current was measured after the electric bias across the manufactured MIM device. It is found that the phospolipid monolayer of dielectric relaxation takes a little time and depend on the molecular area. When electric bias is applied across the manufactured MIM device by the deposition condition of phospolipid mono-layer, it wasn't breakdown when the higher electric field to impress by increase of deposition layers.

Electric & Dielectric Properties of MIM Device Using Copolymer LB Films (공중합체 LB막 MIM소자의 전기 및 유전 특성)

  • Yoo, Seung-Yeop;Jung, Sang-Bum;Park, Jae-Chul;Kwon, Young-Soo
    • Proceedings of the KIEE Conference
    • /
    • 1996.11a
    • /
    • pp.258-260
    • /
    • 1996
  • We fabricated MIM device using copolymer LB films of $C_{18}MA-VE_2$. Electric and dielectric properties of MIM device were investigated. In our experimental results, the thickness of maleate copolymer LB film by elipsometry measurements was about $27{\sim}30[\AA]$. Conductivity was found to be $10^{+15}{\sim}10^{-14}[S/cm]$. The maleate copolymer LB film have the property of insulator like organic ultra-thin film. Frequency-dependent dielectric properties was orientational polarization by the dipole.

  • PDF

Electronic Properties of MIM Structure for application in Communication Device (통신소자 응용을 위한 MIM 구조 유기박막의 전자특성)

  • Choi, Young-Il;Song, Jin-Won;Lee, Kyung-Sup
    • Proceedings of the IEEK Conference
    • /
    • 2005.11a
    • /
    • pp.1279-1282
    • /
    • 2005
  • Maxwell displacement current (MDC) measurement has been employed to study the dielectric property of Langmuir-films. MDC flowing across monolayers is analyzed using a rod-like molecular model. LB layers of Arachidic acid deposited by LB method were deposited onto slide glass as Y-type film. The structure of manufactured device is Au/Arachidic acid/Al, the number of accumulated layers are $3{\sim}9$. Also, we then examined of the MIM device by means of I-V. The I-V characteristic of the device is measured from -3 to +3[V].

  • PDF

Electronic Properties of MIM Structure Organic Thin-films that Manufacture by LB method (LB법으로 제작한 MIM 구조 유기 박막의 전자특성)

  • Choi, Young-Il;Lee, Kyung-Sup;Lim, Jung-Yeol;Song, Jin-Won
    • 전자공학회논문지 IE
    • /
    • v.43 no.4
    • /
    • pp.99-104
    • /
    • 2006
  • The Langmuir-Blodgett(LB) technique has attracted considerable interest in the fabrication of electrical and electronic devices. Maxwell displacement current (MDC) measurement has been employed to study the dielectric property of Langmuir-films. MDC flowing across monolayers is analyzed using a rod-like molecular model. A linear relationship between the monolayer compression speed u and the molecular area Am. Compression speed a was about 30, 40, 50mm/min. Langmuir-Blodgett(LB)layers of Arachidic acid deposited by LB method were deposited onto slide glass as Y-type film. The structure of manufactured device is Au/Arachidic acid/Al, the number of accumulated layers are 9$\sim$21. Also, we then examined of the Metal-Insulator-Metal(MIM) device by means of I-V. The I-V characteristics of the device are measured from -3 to +3[V]. The insulation property of a thin film is better as the distance between electrodes is larger.

A Study on the Phase Transfer and Electrical Properties of PBLG and PBDG (PBLG와 PBDG의 상전이와 전기특성에 관한 연구)

  • Kim, Beyung-Geun;Lee, Kyung-Sup
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2003.11a
    • /
    • pp.400-403
    • /
    • 2003
  • Recently, the study on development of electrical and electronic device is done to get miniature, high degrees of integration and efficiency by using inorganic materials. the study of Langmuir-Boldgett(LB) method that uses organic materials because of the limitation for the ultra small size. In this paper, detected displacement current using PBLG and PBDG, deposition and observed the electrical characteristics to each 1, 3, 5, 7, 9 layers by LB method. Maximum value of change ratio of displacement current by the detected speed and temperature appeared almost lineally, could confirm that it are in comparison relation each other speed temperature and displacement current. The structure of manufactured device is MIM. Also, we then examined of the MIM device by means of I-V. The I-V characteristic of the device is measured from 0 to +2[V]. The insulation property of a thin film is better as the distance between electrodes is larger.

  • PDF

A High Density MIM Capacitor in a Standard CMOS Process

  • Iversen, Christian-Rye
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.1 no.3
    • /
    • pp.189-192
    • /
    • 2001
  • A simple metal-insulator-metal (MIM) capacitor in a standard $0.25{\;}\mu\textrm{m}$ digital CMOS process is described. Using all six interconnect layers, this capacitor exploits both the lateral and vertical electrical fields to increase the capacitance density (capacitance per unit area). Compared to a conventional parallel plate capacitor in the four upper metal layers, this capacitor achieves lower parasitic substrate capacitance, and improves the capacitance density by a factor of 4. Measurements and an extracted model for the capacitor are also presented. Calculations, model and measurements agree very well.

  • PDF

A Study on the Characteristic Analysis of Implemented Baseband AIN MIM Capacitor for Wireless PANs & Mobile Communication (무선PAN 및 이동통신용 기저대역 AIN MIM Capacitor의 구현과 특성분석에 관한 연구)

  • Lee, Jong-Joo;Kim, Eung-Kwon;Cha, Jae-Sang;Kim, Jin-Young;Kim, Young-Sung
    • The Journal of The Korea Institute of Intelligent Transport Systems
    • /
    • v.7 no.5
    • /
    • pp.97-105
    • /
    • 2008
  • The micro capacitors are passive elements necessary to electronic circuits and wireless portable PAN(personal area network) and Mobile Communications device modules in the baseband circuits in combination with another passive and active devices. As capacitance is proportionally increased with dielectric constant and electrode areas, in addition, inversely decreased the thickness of the dielectric material, thus thin film capacitors are generally seen as a preferable means to achieve high performance and thin film capacitors are used in a variety of functional circuit devices. In this paper, propose dielectric material as AIN(Aluminium nitride) to make micro thin film capacitor, and this capacitor has the MIM(metal-insulator-metal) structure. AIN thin films are widespread applied because they had more excellent properties such as chemical stability, high thermal conductivity, electrical isolation and so on. In addition, AIN films show low frequency response for baseband signal ranges, I-V and C-V electrical characterization of a thin film micro capacitor. The above experimental test and estimated results demonstrate that the thin film capacitor has sufficient and efficient functional performance to be the baseband range frequency of general electronics circuit and passive device applications.

  • PDF

Characteristics of ALD-$Al_2O_3$ MIM Capacitor on $RuO_2$ Metal Electrode ($RuO_2$전극 위에 증착된 ALD-$Al_2O_3$ MIM 커패시터 특성)

  • Do, Seung-Woo;Mun, Kyung-Ho;Jang, Cheol-Yeong;Jung, Young-Chul;Lee, Jae-Sung;Lee, Yong-Hyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2005.07a
    • /
    • pp.143-144
    • /
    • 2005
  • Recently, MIM(metal-insulator-metal) capacitor is one of the essential device for DRAM device. In this thesis, $Al_2O_3$ thin film which has a relatively high dielectric constant was deposited by ALD(atomic layer deposition) using MPTMA and $H_2O$ source. Deposition temperature of $Al_2O_3$ thin film was $200^{\circ}C$ and its thickness was 300 ${\AA}$. $RuO_2$ bottom electrode was deposited by RF-magnetron sputtering using $RuO_2$ target. The physical characteristics of $Al_2O_3$ films were investigated by AES, TEM and Ellipsometry. Electrical characteristics were analyzed by C-V and I-V measurement.

  • PDF

A Study on Electrical Characteristics of Organic Thin Film (유기박막의 전기적 특성 연구)

  • Choi Yong-Sung;Song Jin-Won;Moon Jong-Dae;Lee Kyung-Sup
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.19 no.10
    • /
    • pp.953-959
    • /
    • 2006
  • Langmuir-Blodgett(LB)layers of Arachidic acid deposited by LB method were deposited onto slide glass as Y-type film. The structure of manufactured device is Au/arachidic acid/Al, the number of accumulated layers are $9{\sim}21$. Also, we then examined of the Metal-Insulator-Metal(MIM) device by means of I-V. The I-V characteristics of the device are measured from -3 to +3 V. The insulation property of a thin film is better as the distance between electrodes is larger.