• Title/Summary/Keyword: MIL-HDBK-217F

Search Result 34, Processing Time 0.022 seconds

A Study on Design for Reliability for the PBA of Warship based on Reliability Physics Analysis (신뢰성 물리학 분석 기반 함정탑재 PBA 신뢰성 설계에 대한 연구)

  • Cha, Jong-Han;Park, Kyoung-Deok;Lee, Ki-Won;Bak, Byeong-Ho;Kim, Hee-Earn;Kwon, Hyeong-Ahn
    • Journal of the Korea Academia-Industrial cooperation Society
    • /
    • v.20 no.12
    • /
    • pp.535-545
    • /
    • 2019
  • The PBA of ship weapon system should be installed and operated under harsh environmental conditions and so it should be highly reliable to endure the mission profiles during its entire lifetime. In the case of PBA failure during operation, rapid maintenance is highly likely to be difficult due to problems such as supply of parts, which can have a devastating effect on the mission. In order to validate the reliability of PBA, a series of tests are performed with PBA samples, but they require time, testing facilities, samples, expenses and failure analysis if failed. The reliability of PBA is predicted on the basis of specifications such as MIL-HDBK-217F, but this specification does not take into account failure mechanisms for specific design details, environment and usage, interconnects and its characteristics that drive many failures of PBA in the field. Therefore, this study predicts the reliability of PBA using an RPA tool and proposes the RPA methodology as a validation process at the design stage. With RPA, it is now possible to achieve design validation including inherent failure mechanism, identification of weakest link, alternative design options, and test plan development.

A Study on Electronic Component Failure Rate Trend Based on Technology Changes (전자기술의 발전과 전자부품 기본 고장률의 추이)

  • Jang, Ju-Su;Yun, Cha-Jung;Lee, Eun-Kyu;Lee, Eul-Jae;Jang, Jeong-Hoon;Kim, Yong
    • Proceedings of the KSR Conference
    • /
    • 2011.10a
    • /
    • pp.2527-2538
    • /
    • 2011
  • The Reliability started for MILitary purposes during World War II in 1942, getting more important for maintenance, safety, etc in modern society. As technologies develop, also international standards for measuring the reliability is advancing. RAMS activities for maintenance, safety verification is material to national railroad. And for this, it needs quick response for the changes of standards. Even now standards are upgrading for developing electronic technologies. Therefore analysis of failure rate's trend about such standards is judged necessary. So We submit a this paper for comparative analysis of changing process standards according to development of electronic technologies and reliability. At first, we compared actual usage ratio of standards for understanding the current state of usage. Based of these state of usage, discuss the major standard. And then, introduced reliability standards's trend, calculation method of failure rate and difference of failure rate calculation standard according to march of time. In this paper, used standards are MIL-HDBK-217F, Telcodia, etc.

  • PDF

Prediction of Remaining Useful Life (RUL) of Electronic Components in the POSAFE-Q PLC Platform under NPP Dynamic Stress Conditions

  • Inseok Jang;Chang Hwoi Kim
    • Nuclear Engineering and Technology
    • /
    • v.56 no.5
    • /
    • pp.1863-1873
    • /
    • 2024
  • In the Korean domestic nuclear industry, to analyze the reliability of instrumentation and control (I&C) systems, the failure rates of the electronic components constituting the I&C systems are predicted based on the MIL-HDBK-217F standard titled 'Reliability Prediction of Electronic Equipment'. Based on these predicted failure rates, the mean time to failure of the I&C systems is calculated to determine the replacement period of the I&C systems. However, this conventional approach to the prediction of electronic component failure rates assumes that factors affecting the failure rates such as ambient temperature and operating voltage are static constants. In this regard, the objective of this study is to propose a prediction method for the remaining useful life (RUL) of electronic components considering mean time to failure calculations reflecting dynamic environments, such as changes in ambient temperature and operating voltage. Results of this study show that the RUL of electronic components can be estimated depending on time-varying temperature and electrical stress, implying that the RUL of electronic components can be predicted under dynamic stress conditions.

An application plan of NSWC-98/LE1 when predicting the reliability of mechanical components of design and development phase (체계 개발 단계별 기계 부품에 대한 신뢰도 예측 시 NSWC-98-LE1 적용 방안)

  • Kwon, Ki Sang;Park, Eun Sim;Cho, Cha Hyun;Lee, Dong Woo;Lee, Su Jung
    • Journal of the Korean Society of Systems Engineering
    • /
    • v.4 no.1
    • /
    • pp.35-43
    • /
    • 2008
  • Generally, in analysis of reliability of Design and Development Phase, reliability of electrical components is analyzed based on standards such as MIL-HDBK-217F, Bellcore Issue 4,5,6 by analyzing stress of architectural side (Power, Voltage, Current and quality level of components) of weapon system and stress of operational side (operational environment, operational temperature, Operational Profile). But the reliability of mechanical components is analyzed based on the data book of failure history of mechanical parts called NPRD-95(Nonelectronic Parts Reliability Data-95) without any analysis of above stress. However, even if it's the same mechanical parts, it might have different failure rate(fatigue, wear, corrosion) during operation depending on how weary(stress : pressure, vibration, temperature during operation) the parts are. Therefore, analyzing reliability using just data book can cause big difference in reliability instead of analyzing based upon stressfulness that parts might have, operational concept, and other various factors. Thus, This paper will guide the way of predicting reliability by organizing ways of predicting reliability for system organization and adopt ing NSWC-98/LE1(Naval Surface Warfare Center-98/LE1) for mechanical components.

  • PDF