• 한국정밀공학회지
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• 제20권8호
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• pp.108-114
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• 2003

This research describes a image-processing technique for the scratch detecting algorithm for ITO coated glass. We use the modified logical thresholding method (called adaptive logical thresholding method) for binarization of gray-scale glass image. This method is useful to the algorithm for detecting the scratch of ITO coated glass automatically without need of any prior information of manual fine-tuning of parameters.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 춘계학술대회
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• pp.1173-1178
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• 2003

Recently, Organic EL(Electro Luminescence) is interested in Flat Panel Display(FPD) department of new generation. This paper describes a image processing algorithm for the scratch detecting for ITO coated glass. We use the logical level thresholding method for binarization of gray-scaled glass image. This method is useful to the algorithm for detecting scratch of ITO coated glass automatically without need of any prior information of manual fine tuning of parameters.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2002년도 International Meeting on Information Display
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• pp.849-851
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• 2002

This research describes a image-processing technique for the scratch detecting algorithm for ITO coated glass. We use the modified logical thresholding method for binarization of gray-scale glass image. This method is useful to the algorithm for detecting the scratch of ITO coated glass automatically without need of any prior information of manual fine-tuning of parameters.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2003년도 춘계학술대회 논문집
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• pp.1275-1278
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• 2003

This research describes a image-processing technique for the scratch detecting algorithm for ITO coated glass. The light emitter efficiency of Organic EL has a failing-off in quality due to many causes. One of the many causes was the defects of the surface in ITO coated glass. We use the logical level thresholding method for binarization of gray-scaled glass image. This method is useful to the algorithm for detecting scratch of ITO coated glass automatically without need of any prior information of manual fine tuning of parameters.