• 전자공학회논문지A
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• 제31A권2호
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• pp.94-103
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• 1994

In testing for practical scan disigned logic circuits, there may exist logic value constraints on some part of primary inputs due to various requirements on design and test. This paper presents a logic value system called taboo logic values which targets the test pattern generation of logic circuits under logic value constraints. The taboo logic system represents the logic value constraints and identifies additional logic value constraints through the implication of the tqaboo logic values using a taboo logic calculus. Those identified logic value constraints will guide the search during the test pattern generation of avoid the unfruitful searches and to identify redundant faults due to the logic value constraints very quickly. Finally, experimental results on ISCAS85 benchmark circuits will demonstrate the efficiency of the taboo logic values.

• ETRI Journal
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• 제41권3호
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• pp.383-395
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• 2019

Clock Controlled Dual keeper Domino logic structures (CCDD_1 and CCDD_2) for achieving a high-speed performance with low power consumption and a good noise margin are proposed in this paper. The keeper control circuit comprises an additional PMOS keeper transistor controlled by the clock and foot node voltage. This control mechanism offers abrupt conditional control of the keeper circuit and reduces the contention current, leading to high-speed performance. The keeper transistor arrangement also reduces the loop gain associated with the feedback circuitry. Hence, the circuits offer less delay variability. The design and simulation of various wide fan-in designs using 180 nm CMOS technology validates the proposed CCDD_1 and CCDD_2 designs, offering an increased speed performance of 7.2% and 8.5%, respectively, over a conventional domino logic structure. The noise gain margin analysis proves good robustness of the CCDD structures when compared with a conventional domino logic circuit configuration. A Monte Carlo simulation for 2,000 runs under statistical process variations demonstrates that the proposed CCDD circuits offer a significantly reduced delay variability factor.

• 실천공학교육논문지
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• 제8권2호
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• pp.95-101
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• 2016

본 논문에서는 디지털 논리회로의 동작 원리에 대한 이해를 돕기 위해, 스위치 기반 LED (Light Emitting Diode) Art 논리 회로 구현 방법을 소개한다. 브레드 보드를 이용한 디지털 논리회로 실습은 국내 교육과정의 고등학교 및 대학교 수준의 해당 학과에서 필수 교육과정으로 지정하고 있다. 하지만 실제 실습에는 기초적인 구현 예제가 부족하고, 이에 따른 결과로 복잡한 디지털 논리회로 예제를 통한 학습으로 디지털 논리회로의 기초 동작 원리에 대한 이해를 방해하는 문제점을 갖고 있다. 따라서, 스위치를 이용한 기초적인 실습예제이며, 다수의 출력 장치 신호들을 동시에 제어하는 논리회로의 필요성을 이해할 수 있는 LED Art 회로 구현 방법을 제안하고 시험하였다.

• 대한전자공학회논문지
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• 제22권4호
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• pp.24-32
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• 1985

This paper presents the design method for multivalued logic functions using $I^2L$ circuits. First, the a비orithm that transforms delta functions into discrete functions of a truncated difference is obtained. The realization of multivalued logic circuits by this algorithm is discussed. And then, the design method is achieved by mixing discrete functions and delta functions using the modified algorithm for given multivalued truth tables. The techniques discussed here are easily extended to multi-input and multi-output logic circuits.

• 한국정보처리학회논문지
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• 제4권1호
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• pp.311-323
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• 1997

본 논문에서는 게이트 레벌 소자와 스위치 레벨 소자가 함께 사용한 혼합형 조합 회로에서의 고착 고장(stuck-at fault) 검출을 위한 고장 시뮬레이션에 대하여 기술 한다. 실용적인 혼합형 회로의 고장 검출용으로 사용하기 위하여 게이트 레벨 및 정 적 스위치 레벨 회로는 물론 동적 스위치 레벨의 회로들도 처리할 수 있도록 한다. 또한, wired 논리 소자에서의 다중 신호 충돌 현상을 해결하기 위하여 새로운 6치 논 리값과 연산 규칙을 정의하여 신호 세기의 정보와 함께 사용한다. 고장 시뮬레이션의 기본 알고리즘으로는 게이트 레벨 조합 회로에서 주로 사용되는 병렬 패턴 단일 고장 전달(PPSFP:parallel pattern single fault propagation) 기법을 스위치 레벨 소자에 확장 적용한다. 마지막으로 스위치 레벨 소자로 구현된 ISCAS85 벤치 마크 회로와 실 제 혼합형 설계 회로에 대한 실험 결과를 통하여 본 연구에서 개발된 시스템의 효율 성을 입증한다.

• 대한전자공학회논문지
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• 제26권10호
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• pp.1606-1616
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• 1989

In this paper, the design of DYNAMIC CMOS ARRAY LOGIC which has both advantages of dynamic CMOS and array logic circuits is proposed. The major components of DYNAMIC CMOS ARRAY LOGIC are two-stage dunamic CMOS circuits and an internal clock generator. The function block of dynamic CMOS circuits is realized as a parallel interconnection of NMOS transistors. Therefore the operating speed of DYNAMIC CMOS ARRAY LOGIC is much faster than the one of the conventional dynamic CMOS PLAs and static CMOS PLA. Also, the charge redistribution problem by internl delay is solved. The internal clock generator generates four internal clocks that drive all the dynamic CMOS circuits. During evaluation, two clocks of them are delayed as compared with others. Therefore the race problem is completoly eliminated. The internal clock generator also prevents the reduction of circuit output voltage and noise margin due to leakage current and charge coupling without any penalty in circuit operating speed or chip area utilization.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2000년도 ITC-CSCC -1
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• pp.179-182
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• 2000

Adiabatic dynamic CMOS logic circuits, which are called ADCL circuits, promise us to implement low power logic circuits. Since the power supply source for ADCL circuits had not been developed, we proposed a power supply circuit for them. It is shown experimentally that by using the power supply circuit ADCL circuits can work with lower power consumption than conventional static CMOS circuit. In this paper, the power supply circuit is improved so that the power consumption can be reduced. Also, it is shown by some experiments that by using the circuit, ADCL circuits can work with lower power consumption than before Improving.

• 융합신호처리학회논문지
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• 제6권3호
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• pp.134-142
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• 2005

전류모드 CMOS 회로기반 다치 논리 회로가 최근에 구현되고 있다. 본 논문에서는 4-치 Unary 다치 논리 함수를 전류모드 CMOS 논리 회로를 사용하여 합성하였다. 전류모드 CMOS(CMCL)회로의 덧셈은 각 전류 값들이 회로비용 없이 수행될 수 있고 또한 부의 논리 값은 전류흐름을 반대로 함으로써 쉽게 구현이 가능 하다. 이러한 CMCL 회로 설계과정은 논리적으로 조합된 기본 소자들을 사용하였다. 제안된 알고리듬을 적용한 결과 트랜지스터의 숫자를 고려하는 기존의 기법보다 더욱 적은 비용으로 구현할 수 있었다. 또한 비용-테이블 기법의 대안으로써 Unary 함수에 대해서 범용 UUPC(Universal Unary Programmable Circuit) 소자를 제안하였다.

• 전자공학회논문지A
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• 제33A권2호
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• pp.184-195
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• 1996

Beause BiCMOS logic circuits consist of CMOS part which constructs logic function and bipolar part which drives output load, the effect of short faults on BiCMOS logic circuits represented different types from that on CMOS. This paper proposes new test method which detects short faults on BiCMOS logic circuits using current path graph. Proposed method transforms BiCMOS circuits into raph constructed by nodes and edges using extended switch-level model and separates the transformed graph into pull-up part and pull-down part. Also, proposed method eliminates edge or add new edge, according ot short faults on terminals of transistor, and can detect short faults using current path graph that generated from on- or off-relations of transistor by input patterns. Properness of proposed method is verified by comparing it with results of spice simulation.

• 대한전자공학회논문지
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• 제27권7호
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• pp.1118-1127
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• 1990

In this paper a new test generation method for Domino CMOS logic circuits is proposed. Because the stuck-at type fault is not adequate for Domino CMOS circuits the stuck-open fault, stuck-on fault and bridging fault are considered as fault models. It is shown that the test generation problem of Domino CMOS circuits results in functional block test generation problem. Test set is generated by using the logic minimizer which is a part of logic design system. An algorithm for reduction of test set is described. The proposed test method can be easily applied to various figures of circuits and make it easy to construct automatic test generator in design system. The proposed algorithms are programed and their efficiency is confirmed by examples.