• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.3 s.333
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• pp.35-42
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• 2005

This paper proposes a new reseeding methodology using a variable-rank multiple-polynomial linear feedback shift register (MP-LFSR). In the proposed reseeding scheme, a test cube with large number of specified bits is encoded with a high-rank polynomial, while a test cube with a small number of specified bits is encoded with a low-rank polynomial. Therefore, according to the number of specified bits in each test cube, the size of the encoded data can be optimally reduced. A variable-rank MP-LFSR can be implemented with a slight modification of a conventional MP-LFSR and Multiple Polynomial can be represented by adding just 1 bit to encoding data. The experimental results on the largest ISCAS'89 benchmark circuits show that the proposed methodology can provide much better encoding efficiency than the previous methods with adequate hardware overhead.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.3
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• pp.26-31
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• 2009

A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock frequencies between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. H the clock frequency which is slower than the clock frequency for the scan chain by n times is used for LFSR, successive n scan cells are filled with the same data; such that the number of specified bits can be reduced with an efficient grouping of scan cells. Since the efficiency of the proposed scheme depends on the grouping mechanism, a new graph-based scan cell grouping heuristic has been proposed. The simulation results on the largest ISCAS 89 benchmark circuit show that the proposed scheme requires less memory storage with significantly smaller area overhead compared to the previous test compression schemes.