• Title/Summary/Keyword: Light Measurement

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Measurement and Analysis of Light Scattering of Au Pads on PCB Surface to Extract Scattering Parameters (인쇄회로기판용 Au 패드의 산란 특성 측정 및 분석에 의한 산란 인자 추출)

  • Ko, Nak-Hoon;Park, Dae-Seo;Kim, Young-Seok;O, Beom-Hoan;Park, Se-Geun;Lee, El-Hang;Lee, Seung-Gol;Choi, Tae-Il
    • Korean Journal of Optics and Photonics
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    • v.20 no.2
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    • pp.134-140
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    • 2009
  • In this study, the influence of surface roughness on light scattering from Au pads on a PCB surface was investigated. Angular distributions of light scattered from Au pads with different surface roughness were measured for several incident angles. Diffusely-scattered light could be separated by using the fact that the amount of specularly-scattered light was directly related to surface roughness. The separated diffuse term was curve-fitted with a physics-based model, and then the related scattering parameters were extracted and compared with measured parameters.

Micro-LIF Measurement in a Micro-channel Using an Micro Laser Light Sheet (마이크로 레이저 평면빔을 이용한 마이크로채널 내에서의 Micro-LIF 측정)

  • Yoon, Sang-Youl;Kim, Jae-Min;Kim, Su-Hun;Kim, Kyung-Chun
    • Proceedings of the KSME Conference
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    • 2004.11a
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    • pp.1540-1545
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    • 2004
  • Measurement of concentration fields in a micro-channel is the crucial technology in the area of Lab-on-a-chip to be used for various bio-chemical applications. It is wel-known that the only possible way to measure the concentration field in the micro-channel is using micro-LIF(Laser Induced Fluorescence) method. However, an accurate concentration field at a given cross plane in a micro-channel has not been made so far due to the limit of light illumination. The present study demonstrates a novel method to provide an ultra thin laser sheet beam having 5 microns thickness by a micro focus laser line generator. Nile Blue A was used as fluorescent dye for LIF measurement. The laser sheet beam illuminates an exact plane of concentration measurement in the micro-channel to increase the signal to noise ratio and reduce the depth uncertainty considerably.

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Optical Probe of white Light Interferometry for Precision Coordinate Metrology (정밀 삼차원 측정을 위한 백색광 간섭 광학 프로브 개발)

  • 김승우;진종한;강민구
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2002.05a
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    • pp.195-198
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    • 2002
  • Demand for high precision measurement of large area is increasing in many industrial fields. White-light Scanning Interferometer(WSI) is a well-known method for 3D profile measurement. However WSI has some limitations in a measurement range because of the sensing mechanism. Therefore, in this paper we use a heterodyne laser interferometer to get over the limitations of a short measurement range in WSI, We suggest a new WSI system combined with heterodyne laser interferometer. This system is aimed at eliminating Abbe error with measuring the focus point directly. With the use of triggering functionality of WSI, we can use this system as a probe of a precision stage such as a probe of CMM. The suggested system gives a repeatability of 87 nm in the absolute distance measurement test under the laboratory environment.

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Measurement of Coastal Waves using Marine Radar (선박용 레이더를 이용한 연안파 계측)

  • Park, Jun Soo
    • Journal of the Society of Naval Architects of Korea
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    • v.55 no.1
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    • pp.83-91
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    • 2018
  • In this paper, usefulness of marine radar for water waves measurement in coastal waters is presented. We installed a marine radar to acquire radar images of water wave around light beacon at Jujeon in Ulsan. Also, a series of analysis procedures for obtaining the wave information from the acquired image is described with a schematic diagram. We compared analysis results of radar images with measurement values using wave height gauge at light beacon. In order to improve accuracy of analysis results, detailed water depth information is essential. In conclusion, in case of the use of radar for water waves measurement, it is shown that it is very necessary to increase the accuracy of measurement by consideration of the water depth in the dispersion relation of water waves.

The comparison between measurement and prediction values for the vertical illuminances by relux program in the survey region (상용 조명해석 프로그램(Relux)을 이용한 가로등 주택침입광 예측값과 실측값 비교)

  • Jung, Dae-Kwan;Park, Hyung-Kyu;Jung, Joon-Sig
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.19 no.1
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    • pp.98-104
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    • 2018
  • The assessment of the light trespass in terms of light pollution is difficult due to the complexity of light environments. As a result, the light pollution research has examined the influences of light pollution using simulation program such as RELUX. However, there still exists a differences between the real measurement value and the simulation value for the light trespass. In this paper, we analyzed the light trespass using the RELUX simulation program, and compared results with real measurement values. In this study, the regions (Seoul, Incheon, etc.) were investigated regarding the light trespass for outdoor lighting. The survey of vertical illuminance was analyzed measuring point (more than 2 point) out the window that was expected to light trespass for the higher anticipated to illumination. The illuminational predicted values for the RELUX program were compared with maximum one. As a result of this study, the illuminational errors between the measurement values and predicted values for the simulation were examined from -0.97 lx to 0.65 lx except 2.08 lx and -7.70 lx. The light trespass was analyzed the higher by how much the located close to the height, length, width of the outdoor lighting for the window. For measuring predicted values using RELUX, it was not sufficiently considered in the simulation conditions because of environmental factors and investigator error etc. Limitations of this study include the limited number of measurements, and greater field data is required in future studies.

Development of Ranging Sensor Based on Laser Structured Light Image (레이저 구조광 영상기반 거리측정 센서 개발)

  • Kim, Soon-Cheol;Yi, Soo-Yeong
    • Journal of Institute of Control, Robotics and Systems
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    • v.21 no.4
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    • pp.309-314
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    • 2015
  • In this study, an embedded ranging system based on a laser structured light image is developed. The distance measurement by the structured light image processing has efficient computation because the burdensome correspondence problem is avoidable. In order to achieve robustness against environmental illumination noise and real-time laser structured light image processing, a bandpass optical filter is adopted in this study. The proposed ranging system has an embedded image processor performing the whole image processing and distance measurement, and so reduces the computational burden in the main control system. A system calibration algorithm is presented to compensate for the lens distortion.

Investigation of the Polarization Cross-Coupling in Fiber Coils Using White Light Michelson Interferometer (백색광 마이켈슨 간섭계를 이용한 광섬유 고리의 편광 교차결합 측정)

  • Jo, Min-Sik;Do, Jae-Chul
    • Journal of the Korea Institute of Military Science and Technology
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    • v.9 no.3
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    • pp.109-115
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    • 2006
  • The investigation of the polarization cross-coupling in fiber coils was made using white light Michelson interferometer. The white light interferometer has a light source of about 13nm spectral bandwidth and measurement resolution of less than -80dB. The measurement found that the 200m fiber coil has a polarization cross-coupling of about -64dB in average and -46dB in maximum.

Study on the Measurement Technology of Fluid Film Thickness with Nanometer Scale by Dichromatic Incident Light (Dichromatic 투사광선에 따른 나노 미터 해상도의 점접촉 유막 두께 측정 연구)

  • 공현상;장시열
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2003.06a
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    • pp.686-689
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    • 2003
  • Many technologies are applied to the measurement of elastohydrodynamic lubrication (EHL) film thickness. In particular, optical in-situ interferometric method has many advantages in making the actual contact behaviors realized with the experimental apparatus. Careful selection of incident lights greatly enhances the fringe resolution up to nanometer scale by using image processing technology. In this work, it is found that dichromatic incident light can provide much finer resolution of EHL film thickness than monochromatic incident light, because it has much more variables of color components to be discriminated among the wavelengths of colors according the variations of EHL film thickness. Some simulated interferometric images are shown how the film thickness is resolutionized in nanometer scale

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The Analysis for PDP Discharge as a Parameter of Electrode Structure by 3-Dimensional Light Emission Measurement (3차원 광 측정을 통한 PDP의 전극 구조별 방전 분석)

  • Woo, Seok-Gyun;Choi, Hoon-Young;Lee, Seok-Hyun
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.50 no.4
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    • pp.190-196
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    • 2001
  • We measured 3-dimensional images of the light emitted from plasma display panel(PDP) by using newly proposed scanned point detecting method(SPDM). The SPDM has the point detector with pinhole. The light emitted from PDP cell at the in-focus position can pass through the pinhole and be collected by detector. On the contrary, the light emitted from PDP cell at the out-of-focus positions is focused on the front of or the behind of the pinhole. We could analyze the characteristic of 3-dimensional light emission distribution by SPDM. From 3-dimensional measurement of 828[nm], the efficient design of PDP cell, the importance of opening ration, and the relations between BUS electrode position and discharge intensity are obtained. Also, the relationship between discharge characteristics and sustain electrode structures in AC-PDP are studied by measuring luminance, current, and discharge voltage.

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The 3-Dimensional Analysis for AC-PDP Discharge by Light Emission Measurement (AC-PDP의 3차원 광 측정을 통한 방전 분석)

  • 우석균;최훈영;이승걸;이석현
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.577-580
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    • 2000
  • We measured 3-dimensional images of the light emitted from plasma display panel(PDP) by using newly proposed scanned point detecting method(SPDM). The SPDM has the point detector with pinhole. The light emitted from PDP cell at the in-focus position can pass through the pinhole and be collected by detector. On the contrary, the light emitted from PDP cell at the out-of-focus positions is focused on the front of or the behind of the pinhole. We could analyze the characteristic of 3-dimensional light emission distribution by SPDM. From 3-dimensional measurement of 828nm, we found that the efficient design of PDP cell, the importance of opening ratio, and the relations between BUS electrode position and discharge intensity are obtained.

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