• Title/Summary/Keyword: Lead zirconate titanate

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Effects of Two-Step Annealing Process on the Pulsed Laser Ablated Lead Zirconate Titanate Thin Films

  • Rhie, Dong-Hee
    • KIEE International Transactions on Electrophysics and Applications
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    • v.3C no.2
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    • pp.43-47
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    • 2003
  • Lead zirconate titanate (PZT) thin films were fabricated by the pulsed laser ablation deposition (PLAD) method onto Pt/Ti/SiO$_2$/Si substrates. Crystalline phases as well as preferred orientations in PZT films were investigated by X-ray diffraction analysis (XRD). The well-crystallized perovskite phase and the (101) preferred orientation were obtained by two-step annealing at the conditions of $650^{\circ}C$, 1 hour. It was found that the temperature for the pulsed laser ablated PZT films annealed via a two-step annealing process can be reduced 20$0^{\circ}C$ compared to that of the conventional three-step annealing temperature profile for enhancing the transformation of the perovskite phase. The remanent polarization and the coercive field of this film were about 20 $\mu$C/$\textrm{cm}^2$ and 46 kV/cm, while the dielectric constant and loss values measured at 1 KHz were approximately 860 and 0.04, respectively. The interesting phenomena of this film, such as vertical shift in hysteresis curve, are also discussed.

Deposition and XPS Study of Pb, Zr, and Ti Films

  • Choi, Sujin;Park, Juyun;Jeong, Eunkang;Kim, Beob Jun;Son, Seo Yoon;Lee, Jeong Min;Lee, Jin Seong;Jo, Hee Jin;Park, Jihun;Kang, Yong-Cheol
    • Journal of Integrative Natural Science
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    • v.7 no.3
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    • pp.183-187
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    • 2014
  • Lead zirconate titanate (PZT) is significant material in electrical and optical devices for their ferroelectric, piezoelectric and dielectric properties. In this research, PZT films were fabricated by reactive RF co-sputtering method using Pb, Zr, and Ti targets. From XPS study, lead, zirconium, and titanium are successfully deposited on Si(100) substrate. Thickness of PZT films was measured with a surface profiler and the thickness was decreased as the oxygen gas ratio increased in the sputter gas.

Fabrication of 1 ㎛ Thickness Lead Zirconium Titanate Films Using Poly(N-vinylpyrrolidone) Added Sol-gel Method

  • Oh, Seung-Min;Kang, Min-Gyu;Do, Young-Ho;Kang, Chong-Yun;Yoon, Seok-Jin;Nahm, Sahn
    • Transactions on Electrical and Electronic Materials
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    • v.12 no.5
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    • pp.222-225
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    • 2011
  • Lead zirconate titanate (PZT) films were fabricated on Pt/Ti/$SiO_2$/Si substrate by the sol-gel method using a sol containing poly(N-vinylpyrrolidone) (PVP). PVP in alkoxide solutions can suppress the condensation reaction in gel films during heat treatment, and increase the viscosity of alkoxide solutions. Single-phase PZT films as thick as 1 ${\mu}m$ were deposited by repetitive coating with successive third-step heat treatments at 150$^{\circ}C$, 350$^{\circ}C$ and 650$^{\circ}C$. After heat treatment, the films were crack free, and optically transparent. As a result, we demonstrated a PZT film with a PVP molar ratio of 0.5, which has a permittivity of 734, a dielectric loss of 0.042, a $P_r$ of 40.5 ${\mu}C/cm^2$ and an $E_c$ of 156 kV/cm.

Aging Effect on Charge Sensitivity and Frequency Response of PZT Ceramics (PZT 세라믹스의 전하감도와 주파수 응답특성에 대한 경시변화 효과)

  • 신병철;임종인;윤만순;박병학;백성기
    • Journal of the Korean Ceramic Society
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    • v.26 no.4
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    • pp.588-590
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    • 1989
  • Charge sensitivity and its frequency response characteristics were measured in poled and aged lead zirconate titanate(PZT) ceramics prepared by sintering. Aged PZT has lower charge sensitivity and lower mounted resonance frequency than just poled PZT.

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Preparation of PZT-Ceramics by Coprecipitation Method (공침법에 의한 PZT-Ceramics의 제조)

  • 안영필;최석홍;이병우
    • Journal of the Korean Ceramic Society
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    • v.25 no.2
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    • pp.168-172
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    • 1988
  • In order to prevent the PbO vaporization during calcination and to produce the powder of good sinterability, a coprecipitation method for preparing homogeneous Lead-Zirconate-Titanate (PZT) powder from aqueous salt solution is described. In this method, the PZT-ceramics show low calcining and sintering temperature, and they have good sintering and electronic properties.

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Development of smart transducer with embedded sensor for automatic process control of ultrasonic wire bonding

  • Or, Siu Wing;Chan, Helen Lai Wa;Liu, Peter Chou Kee
    • Smart Structures and Systems
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    • v.1 no.1
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    • pp.47-61
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    • 2005
  • A ring-shaped lead zirconate titanate (PZT) piezoceramic sensor has been integrated with the Langevin-type piezoceramic driver of an ultrasonic wire-bonding transducer to form a smart transducer for in-situ measurement of three essential bonding parameters: namely, impact force, ultrasonic amplitude and bond time. This sensor has an inner diameter, an outer diameter and a thickness of 12.7 mm, 5.1 mm and 0.6 mm, respectively. It has a specifically designed electrode pattern on the two major surfaces perpendicular to its thickness along which polarization is induced. The process-test results have indicated that the sensor not only is sensitive to excessive impact forces exerted on the devices to be bonded but also can track changes in the ultrasonic amplitude proficiently during bonding. Good correlation between the sensor outputs and the bond quality has been established. This smart transducer has good potential to be used in automatic process-control systems for ultrasonic wire bonding.

Impedance Spectroscopy of (Pb0.92La0.08)(Zr0.95Ti0.05)O3 Ceramics above Room Temperatures

  • Jong-Ho Park
    • Korean Journal of Materials Research
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    • v.34 no.5
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    • pp.242-246
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    • 2024
  • La modified lead zirconate titanate ceramics (Pb0.92La0.08)(Zr0.95Ti0.05)O3 = PLZT-8/95/5 were prepared using the conventional solid state reaction method in order to investigate the complex impedance characteristics of the PLZT-8/95/5 ceramic according to temperature. The complex impedance in the PLZT-8/95/5 ceramic was measured over a temperature range of 30~550 ℃ at several frequencies. The complex dielectric constant anomaly of the phase transition was observed near TU1 = 179 ℃ and TU2 = 230 ℃. A remarkable diffuse dielectric constant anomalous behaviour of the complex dielectric constant was found between 100 ℃ and 550 ℃. The complex impedance spectra below and above TU1 and TU2 were fitted by the superposition of two Cole-Cole types of impedance relaxations. The fast component in the higher frequency region may be due to ion migration in the bulk, and the slow component in the lower frequency region is interpreted to be the formation and migration of ions at the grain boundary or electrode/crystal interfacial polarization.