• Journal of the Korean Society for Precision Engineering
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• v.16 no.11
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• pp.68-73
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• 1999

In this paper, the residual stresses for the wide-band laser heat treatment using a polygon mirror have been analyzed. The results of FE analysis are compared with the experimental results. ANSYS Version 5.3, a commercial FE-code, is used for the FE stress analysis. The structural analysis was performed on after thermal analysis. The residual stress distribution across the hardened area was measured by the X-ray diffraction technique. The laser hardening conditions, 2kW laser power and 2mm/s travel speed, were used for the experiment and the FE analysis. Analysis results, which is maximum tensile residual stress is about 143MPa and maximum compressive residual stress is about -380MPa. Under same parameters with the analysis, experimental results indicate that MTRS is about 152MPa and MCRS is about -312MPa. The experimental results is about 6% higher than the FE analysis. As a result, residual stress data from the experiment close well with that of the FE analysis.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.36 no.3
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• pp.286-291
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• 2023

Perovskite materials are promising candidates for next-generation optoelectronic devices owing to their outstanding external quantum efficiency, high color purity, and ability to tune the light emission wavelength. However, conventional thermal annealing processes caused the degradation of perovskite, resulting in poor optoelectronic properties and a short lifetime. Herein, we propose a laser-induced recrystallization of perovskite thin film to enhance its light-emitting properties. Laser-induced recrystallization process was performed using rapid and instantaneous laser heating, which successfully induced grain growth of the perovskite material. The laser processing conditions were thoroughly optimized based on theoretical calculations and various material analyses such as x-ray diffraction, scanning electron microscope, and photoluminescence spectroscopy.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2002.07b
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• pp.1042-1045
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• 2002

We have carried out two-beam interference experiments to form holographic gratings on amorphous $MgF_2$/As-Ge-Se-S multi-layer. In this study, holographic gratings have been formed using He-Ne laser(632.8nm). under different polarization combinations. The diffraction efficiency was obtained by +1st order intensity. The maximum diffraction efficiency of As-Ge-Se-S single layer and $MgF_2$/As-Ge-Se-S multi-layer were 0.8% and 1.4%

• Journal of the Optical Society of Korea
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• v.18 no.6
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• pp.685-690
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• 2014

Microholographic gratings were prepared on an aluminum oxide ($Al_2O_3$) surface using a 140-fs pulse at a center wavelength of 800 nm. The $Al_2O_3$ was deposited on a silicon wafer and on indium tin oxide glass to a thickness of approximately 25 nm using an atomic layer deposition process. The silicon wafer substrate exhibited reflection-type gratings that were measured as a function of the incidence angle. The diffraction efficiency of the fabricated gratings was measured, with a maximum diffraction efficiency of 45% at an incidence angle of approximately $30^{\circ}$.

• Proceedings of the KIEE Conference
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• 2001.07c
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• pp.1445-1447
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• 2001

We have investigated about the grating formation of the $a-Se_{75}-Ge_{25}$ chalcogenide thin films. In this study, holographic gratings have been formed by using He-Ne laser(632.8nm) with different polarization states(linear, circular polarization). The diffraction efficiency was obtained by +1st order intensity of the diffracted beam. We have obtained maximum efficiency for Ag-doped thin film. It is observed the difference of the diffraction efficiency with polarization states. S:S-polarized state is shown high efficiency than the other polarization.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2000.05a
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• pp.803-807
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• 2000

This paper deals wi th the establishment of the method of non-contact surface roughness measurement by developed system. One of the most Important factor of determinating quality of a produced manufacture is surface roughness The tendency of manufacturing method is changing from small amount manufactures / high-volume production to large amount manufactures / low volume production, and the study of reducing time for surface roughness measurement has been actively investigated The non-contact surface roughness method by using laser which is different from contact method has been only used to the polished surface, so new surface roughness measurement method was adopted by virtue of Fraunhofer diffraction in the periodic surface for on-the-machine. in this paper, we establish the method of non-contact surface roughness measurement which can reduce measuring time in the periodic surface

• Korean Journal of Optics and Photonics
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• v.25 no.1
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• pp.8-13
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• 2014

By using finite ray-tracing and curve fitting, a numerical method to determine the non-paraxial pupil function of a high-NA objective is presented. MTF degradations caused by the non-paraxial diffraction effect are analyzed for on-axial imaging of a far-infrared objective and aberration-free ellipsoidal mirror system. The ellipsoidal mirror system has the same paraxial specifications as the far-infrared objective.

• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.5
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• pp.868-873
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• 1987

Holographic diffraction gratings which are the core element of the optical instruments such as a spectrophotometer have been fabricated using the photoresist as a recording material. A 488nm line from an argon laser is used in making the gratings. Transmission type surface-relief phase grating and reflection type which is fabsricated by coating the aluminum on the transmission type with thickness 2000\ulcornerare fabricated, the spatical frequency of which are 1200 lines/mm. Diffraction efficiency, scattered light and wave-front aberratin are measured to test the performance of the developed gratings. A marimum diffraction efficiency is given when light is incident at the Bragg angle. Theoretical efficiency is about 80%, but measured efficiency of the transmission type and reflection type is 50% and 45%, respectively.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.299-302
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• 2000

In this study, we have made the large holographic surface relief gratings on amorphous chalcogenide $As_{40}$$Ge_{10}$$Se_{15}$$S_{35}$ films by two beam interference using a He-Ne laser(632.8nm) light. The film thickness was about 0.6$\mu\textrm{m}$, we could magnify beam size by using beam expander. We made use $90^{\circ}$ holder which was made of reflection mirror and sample. Formed the surface relief structures were investigated using optical microscope. The diffraction efficiency was obtained by measuring +lst order intensity. In addition we investigated grating formation and diffraction efficiency as a function of polarization states which is linear or circular polarization. The results indicate that the grating was formed by linear polarized beam is better clear than that by circular polarized beam.

• Proceedings of the KIEE Conference
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• 2007.11a
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• pp.134-135
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• 2007

Two-dimensional photonic crystal structures have been fabricated on the chalcogenide material using holography lithography out of many production technical. The fabricated lattice can be observed obliquely by measuring diffraction pattern. The diffraction pattern of the microstructure has been observed with a He-Ne laser beam at wavelength of 632.8 nm. The diffracted beam has been analyzed by using the diffraction efficiency measurement method.