• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.4
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• pp.1803-1811
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• 2011

We have analyzed the electrical defect detection mechanism using low energy microcolumn on the TFT substrate for TFT-LCD. In this study, we have acquired the SEM images of the various pixel defects for 7-inch TFT substrate by scanning of low energy electron beam in the high vacuum chamber. Futhermore, we have interpreted the defect detection mechanism through the correlations between the SEM images and electrical behaviors of the defective pixels. As a result, we obtained consistent results as the follows. We can confirm that the SEM images using low energy electron beam are significantly affected by the space charge effect.

• The Journal of the Korea institute of electronic communication sciences
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• v.13 no.2
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• pp.435-442
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• 2018

This study implemented an FPGA-based system to extract PCB defect patterns. The FPGA-based system can perform pattern matching at high speed for vision automation. An image processing library that is used to extract defect patterns was also implemented in IPs to optimize the system. The IPs implemented are Camera Link IP, Histogram IP, VGA IP, Horizontal Projection IP and Vertical Projection IP. In terms of hardware, the FPGA chip from the Vertex-5 of Xilinx was used to receive and handle images that are sent from a digital camera. This system uses MicroBlaze CPU. The image results are sent to PC and displayed on a 7inch TFT-LCD and monitor.

• Journal of Korea Society of Industrial Information Systems
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• v.12 no.3
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• pp.116-123
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• 2007

Despite the number of backlight manufacturer is increased as the market of flat panel display equipments and related development devices is enlarged, the inspection based on the human eye is still used in many backlight production lines. The defects such as particle, spot and scratch on the light emitting surface of the backlight prevent the LCD device from displaying the colors correctly. From that manual inspection it is difficult to maintain the quality of backlight consistently because the accuracy and the speed of the inspection may change with the physical condition of the operater. In this paper we studied on the development of automatic backlight surface defect inspection system. For this, we made up of the computer vision system and we developed the main program with various user interfaces to operate the inspection system effectively. And we developed the image processing module to extract the defect information. Furthermore, we presented the labeling process to reconstruct defect regions using the labeling table and the defect index. From the experimental results, we found that our system can detect all defect regions identified from human eye and it is sufficient to substitute for the conventional surface inspection.

• The Transactions of the Korean Institute of Power Electronics
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• v.14 no.1
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• pp.8-14
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• 2009

A lamp which is currently employed to LCD(Liquid Crystal Display) Backlight is almost CCFL(Cold Cathod Fluorescent Lamp) and EEFL(External Electrode Fluorescent Lamp). However, the use of these lamps is being restricted as RoHS(the Restriction of the use of certain Hazardous Substances in electrical and electronic equipment) regulation is gradually reinforced. According to this situation, the manufacturing of a lamp which doesn't use mercury is unescapable. Moreover, LCD TV has a defect which take place Motion Blur phenomenon due to response time of LC(Liquid Crystal), and Hold-type characteristic which only exists in LCD differently to CRT, PDP. In this paper, an inverter is proposed to drive a plane light source lamp which is not containing mercury. Driving circuit of proposed inverter is simple because the number of semiconductor device and magnetic device is reduced by using forward topology. Also, Motion Blur phenomenon is decreased by dividing the plane light source lamp to six block along vertical direction, and scanning. Finally, we proved usefulness of proposed inverter through experiment.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.6
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• pp.743-748
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• 2009

In this paper, we propose an effective method to extract background components in automated vision inspection system for polarized film used in TFT LCD display panels. The test image signals are typically composed of three components such as ununiform background, random noises and target defect signals. It is important to analyze the background signal for accurate extraction of defect components. Two dimensional continuous wavelets with first derivative gaussian is used. This methods can be applied for reliable extraction of defect signal by elimination of the background signal from the original image. The proposed method outperforms over conventional FFT methods.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2002.10a
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• pp.164-169
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• 2002

Recently, LCD(Liquid Crystal Display) is the display product widely used on various fields of industry. This is generally composed of many parts. Among many parts, polarizer film control the intensity of the transmitted light according to the degree of rotation of the polarizer axis. Therefore, this film must be free from defects. But it contains many defects such as the defects caused by dust or different thing, adhesive badness, scratch. Presently, the inspection of these defects is depending on the sight of operator. In this paper, we propose the vision system composed of telecentric lens and optical mirror. This system use the coaxial illumination and the light is specularly reflected on the optical mirror. And we develop the image processing algorithm using the threshold and morphological technique.

• 제어로봇시스템학회:학술대회논문집
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• 2004.08a
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• pp.126-131
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• 2004

The popularity of flat-panel display(FPD), including plasma display panel(PDP) and liquid-crystal display(LCD), has given rise to the need to streamline their production. In these days, PDP is one of the most popular display devices because of its expansion of manufacturing process and simplicity. Bus electrodes, sustain electrodes, barrier ribs and RGB phosphors are patterned on PDP panel to display an image. Since a minute damage on the pattern can cause a serious defect to display, it is important to inspect the pattern precisely. In this paper, an automatic inspection system of repeated pattern in PDP panel has been introduced to find the defect, such as open, short, dirt, island, and so on. And the inspection system has been operated in the mass production line of PDP.

• 한국정보디스플레이학회:학술대회논문집
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• 2004.08a
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• pp.1159-1162
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• 2004

A modeling of the nucleation and dynamical behavior of defects from an inhomogeneous surface configuration using fast Q-tensor method is realized. On modeling the defect nucleation and dynamics, A fast Q-tensor method is applied. From the numerical modeling, we confirmed that surface inhomogeneity which makes strong strain energy in the local liquid crystal director field could cause defects. Experimental result has compared with numerical modeling in order to verify the simulation of the defect nucleation.

• International Journal of Precision Engineering and Manufacturing
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• v.1 no.1
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• pp.56-61
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• 2000

We present a fast inspection method of machine vision for in-line quality assurance of liquid crystal displays(LCD) and plasma display panels(PDP). The method incorporates an optical spatial filter in the Fourier plane of the imaging optics to block the normal periodic pattern, extracting only defects real time without relying on intensive software image process. Special emphasis is on designing a collimated white light source to provide high degree of spatial coherence for effective real time Fourier transform. At the same time, a low level of temporal coherence is attained to improve defect detection capabilities by avoiding undesirable coherent noises. Experimental results show that the proposed inspection method offers a detection accuracy of 15% tolerance, which is sufficient for industrial applications.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.11 no.4
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• pp.31-36
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• 2001

A spin coater is a machine to coat wafer or LCD display with thin film. Vibration in the spin coater may be one of main troubles in the coating process. In this paper, we focus on the difference between two spin coaters. Vibration sources are identified by experimental approach and are compared to find the difference between the two spin coaters. Also, the particle concentration is observed by laser particle counter (LPC) for the two spin coaters, when the spin coaxers are working. It is also considered whether the defect rate is proportional to the particle concentration. The result shows that particle generation in the coating process is related to excessive vibration of the spin coater shaft and the particles influence the defect rate of the thin film product.