• Title/Summary/Keyword: LCD defect

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Frequency Domain Pre-Processing for Automatic Defect Inspection of TFT-LCD Panels (TFT-LCD 패널의 자동 결함 검출을 위한 주파수영역 전처리)

  • Nam, Hyun-Do;Nam, Seung-Uk
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.57 no.7
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    • pp.1295-1297
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    • 2008
  • Large-sized flat-panel displays are widely used for PC monitors and TV displays. In this paper, frequency domain pre-filter algorithms are presented for detection of defects in large-sized Thin Film Transistor-Liquid Crystal Display(TFT-LCD) panel surfaces. Frequency analysis with 1-D, 2-D FFT methods for extract the periodic patterns of lattice structures in TFT-LCD is performed. To remove this patterns, frequency domain band-stop filters were used for eliminating specific frequency components. In order to acquire only defected images, 2-D inverse FFT methods to inverse transform of frequency domain images were used.

Adaptive Defect Detection Method based on Skewness of the Histogram in LCD Image (액정 표시 장치 표면 영상에서 히스토그램 비대칭도 기반의 적응적 결함 검출)

  • Gu, Eunhye;Park, Kil-Houm
    • Journal of the Institute of Electronics and Information Engineers
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    • v.53 no.1
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    • pp.107-117
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    • 2016
  • STD method using a mean and standard deviation is widely used in various inspection systems. The result of detection using the STD method is very dependent on the threshold value. This paper proposes an adaptive defect detection algorithm to with a precise detection of an ultimate defect. The proposed method is determined threshold value adaptively using a skewness that indicates a similarity of intensity and normal distribution of image. In the experiment, we used a various TFT-LCD images for a quantitative evaluation of defect detection performance evaluation result to prove the performance of the proposed algorithm.

Activation for Boron Doped poly-Si films by Hydrogen doping

  • Yang, Joon-Young;Yu, S.H.;Oh, K.M.;Kim, J.I.;Yang, M.S.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2002.08a
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    • pp.171-174
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    • 2002
  • When boron ions are doped into the poly-Si films, the hydrogen ions doped with boron ions compensate the defect sites and suppress to produce damage density. These samples can be easily activated by hydrogen doping at high acceleration voltage($V_{acc}$).

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Defect Detection of LCD Panel using Individual Dots Extraction Method (개별적인 Dot들의 추출 기법을 이용한 LCD 패널 불량검출)

  • 임대규;진주경;조익환;정동석
    • Proceedings of the Korean Information Science Society Conference
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    • 2004.04b
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    • pp.697-699
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    • 2004
  • LCD의 생산이 많아짐에 따라 LCD의 불량 검출이 중요해 지고 있다. 불랑 검사는 눈으로 확인할 수 있는 범위에서 검사가 이루어지고 있으며, 만약 눈으로 식별이 불가능한 경우 적외선 카메라나 초음파 센서를 사용하여 검사가 이루어진다. 본 논문에서는 카메라를 이용하여 LCD 패널의 표면에 있는 불량 검출을 위하여 각 Dot에 대한 R, G, B 값을 추출한 후, 추출된 픽셀을 제안된 알고리즘에 적용하여 불량을 검출하는 것을 목적으로 하고 있다.

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Feature extraction method using graph Laplacian for LCD panel defect classification (LCD 패널 상의 불량 검출을 위한 스펙트럴 그래프 이론에 기반한 특성 추출 방법)

  • Kim, Gyu-Dong;Yoo, Suk-I.
    • Proceedings of the Korean Information Science Society Conference
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    • 2012.06b
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    • pp.522-524
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    • 2012
  • For exact classification of the defect, good feature selection and classifier is necessary. In this paper, various features such as brightness features, shape features and statistical features are stated and Bayes classifier using Gaussian mixture model is used as classifier. Also feature extraction method based on spectral graph theory is presented. Experimental result shows that feature extraction method using graph Laplacian result in better performance than the result using PCA.

Study on Defect Cell Extraction of TFT-LCD Panel (TFT-LCD 결함패턴 추출에 관한 연구)

  • Cho, Jae-Soo;Ha, Gwang-Sung;Lee, Jin-Wook;Kim, Dong-Hyun;Jeon, Edward
    • Proceedings of the KIEE Conference
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    • 2007.10a
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    • pp.151-152
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    • 2007
  • 본 논문은 TFT-LCD 영상에서 결함을 자동검색하여 결함이 있는 LCD 영상의 경우 결함이 있는 LCD 패턴을 정확하게 추출해 내는 방법을 제안하였다. TFT-LCD 영상에서 결함이 있는 LCD 패턴 검색은 세단계로 이루어진다. 1단계는 먼저 입력영상에서 LCD 패턴영상의 특징을 이용하여 각 LCD 패턴의 기준점을 찾는다. 2단계는 1단계에서 찾은 여러 기준점 중에서 필터링과정을 통하여 정확한 한 개의 기준점을 최종 선택한다. 마지막으로 3단계에서는 최종적으로 선택된 기준점을 이용하여 결함정의(결함중심 및 결함사이즈)를 이용하여 결함이 포함되어 있는 LCD 패턴을 추출한다. 제안된 결함패턴 추출 알고리즘의 정확성은 컴퓨터 시뮬레이션을 통하여 그 효용성을 증명하였다.

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Novel Driving Scheme to remove residual image sticking in AMOLED

  • Parikh, Kunjal;Choi, Joon-Hoo;Cho, Kyu-Sik;Huh, Jong-Moo;Park, Kyong-Tae;Jeong, Byoung-Seong;Park, Yong-Hwan;Kim, Tae-Youn;Lee, Baek-Woon;Kim, Chi-Woo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2008.10a
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    • pp.553-556
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    • 2008
  • We hereby report novel driving scheme to eliminate effect of "residual" image sticking (RRI) problem which arises due to hysteresis problem in Thin Film Transistor (TFT) in AMOLED Displays. The driving scheme applies "black" voltage after every data voltage period in order to drive AMOLED in uni-direction. The system can be easily implemented with 120 Hz driving scheme which is well matured in AMLCD industries. Our analyses show systematic evaluation of the problem and thereby solving it by simple methods which will be significantly effective of driving OLED towards mass manufacturing stage.

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Interpretation of the lattice-shaped mura defects in thin-film-transistor liquid crystal displays

  • Woo, B.C.;Han, S.Y.
    • Journal of Information Display
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    • v.12 no.3
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    • pp.121-124
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    • 2011
  • The mechanism for lattice-shaped mura defects was proposed by characterizing the electro-optic properties of liquid crystal (LC), which showed different transmission properties between the normal and mura defect areas. An increase in the mura defect rate was observed when the dotted LC in the one drop filling (ODF) was exposed for a longer time. The dotted LC droplet at the edge evaporated more rapidly than that in the center. This resulted in a higher concentration of polar singles at the edge of the dotted LC droplet, leading to a higher ${\Delta}n$ value and higher transmittance. This implies that the reductio of the exposure time of the dotted LC to air plays a critical role in decreasing the occurrence of lattice-shaped mura defects in ODF.

Development on the Process Control System for Full Gate Visual Test of LCD Manufacturing Process (LCD 생산공정의 전게이트 시각 검사를 위한 공정 제어장치 개발)

  • Park, Hyoung-Keun
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.10 no.7
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    • pp.1725-1728
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    • 2009
  • This research developed process control device and FGV pattern generating device essential for full gate visual inspection to improve process so that defect detection capability may be maximized in specified environment. The devices developed in this research, which can be swiftly replaced in case loss or error occurs, are anticipated to improve module yield as well as maintain tact loss near '0'. In addition, as a result of mounting H/W and S/W system to control detailed operation sequence in production line and executing performance check and verification, detection rates were 98.1% and 99.1% respectively for pixel defect by tact and line defect, and yield of the entire module process including gate and visual level test increased up to 98.3%.

The optimization of new alignment films in the TNLC for low image-sticking

  • Lee, Jong-Hyun;Yi, Jun-Sin;Jung, Hwan-Kyung;Lee, Seung-Guk;Nam, Hyo-Hak;Nam, Yoon-Joung;Choi, Sung-Woo
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.513-516
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    • 2007
  • We introduce a new copolymer alignment film made by bridge-building structure. It is a better film to decrease the image-sticking level in LCD displays. It is noted that the image-sticking was decreased by preventing ion mixing between inter-layers through high hardness. We have investigated the electrical characteristics such as pretilt angle, Residual DC, VHR by changing cure temperature and process delay time conditions of the new alignment film. In this paper, we have investigated the solution for the deep-rooted image defect and incidentally got a contrast ratio improvement by high anchoring force and hardness elevation through the new copolymer alignment film.

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