• Journal of Korea Multimedia Society
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• v.15 no.2
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• pp.204-214
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• 2012

This paper proposes an image segmentation for a vision-based automated defect inspection system on surface image of TFT-LCD(Thin Film Transistor Liquid Crystal Display) panels. TFT-LCD images have non-uniform brightness, which is hard to finding defective regions. Although there are several methods or proposed algorithms, it is difficult to divide the defect with high reliability because of non-uniform properties in the image. Kamel and Zhao disclosed a method which based on logical stage algorithm for segmentation of graphics and character. This method is a one of the local segmentation method that has a advantage. It is that characters and graphics are well segmented in an image which has non-uniform property. As TFT-LCD panel image has a same property, so this paper proposes new algorithm to segment regions of defects based on Kamel and Zhao's algorithm. Our algorithm has an advantage that there are a few ghost objects around the defects. We had experiments to prove performance in real TFT-LCD panel images, and comparing with the FFT(Fast Fourier Transform) method which is used a bandpass filter.

• Journal of Advanced Marine Engineering and Technology
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• v.41 no.3
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• pp.251-257
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• 2017

In this paper, an algorithm for detecting defects in thin-film-transistor liquid-crystal display (TFT-LCD) cell images is presented. TFT-LCD cell images typically contain periodic cell patterns that make it difficult to detect defects. We propose an efficient and powerful algorithm for eliminating the cell patterns using magnitude spectrum analysis. The first step was to obtain a spectrum for a cell image using the Fourier transform while eliminating larger coefficients using an adaptive filter. Next, an image without the cell pattern was obtained by using the inverse Fourier transform. Finally, the defect pixels were detected using the STD algorithm. The validity of the proposed method was investigated using real TFT-LCD cell images. The experimental results indicate that the proposed technique is extremely effective for detecting defects in TFT-LCD cell images.

• The Journal of the Korea Contents Association
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• v.16 no.7
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• pp.689-699
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• 2016

As the demand for LCD increases, the importance of inspection equipment for improving the efficiency of LCD production is continuously emphasized. The pattern inspection apparatus is one that detects minute defects of pattern quickly using optical equipment such as line scan camera. This pattern inspection apparatus makes a decision on whether a pixel is a defect or not using a single threshold value in order to meet constraint of real time inspection. However, a method that uses an adaptive thresholding scheme with different threshold values according to characteristics of each region in a pattern can greatly improve the performance of defect detection. To apply this adaptive thresholding scheme it has to be known that a certain pixel to be inspected belongs to which region. Therefore, this paper proposes a region matching algorithm that recognizes the region of each pixel to be inspected. The proposed algorithm is based on the pattern matching scheme with the consideration of real time constraint of machine vision and implemented through GPGPU in order to be applied to a practical system. Simulation results show that the proposed method not only satisfies the requirement for processing time of practical system but also improves the performance of defect detection.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.41 no.3
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• pp.9-16
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• 2004

• Journal of Korea Multimedia Society
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• v.19 no.3
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• pp.633-641
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• 2016

Automatic defect inspection system is composed of the step in the pre-processing, defect candidate detection, and classification. Polarizing films containing various defects should be minimized over-detection for classifying defect blobs. In this paper, we propose a defect detection algorithm using a skewness of histogram for minimizing over-detection. In order to detect up defects with similar to background pixel, we are used the characteristics of the local region. And the real defect pixels are distinguished from the noise using the probability density function. Experimental results demonstrated the minimized over-detection by utilizing the artificial images and real polarizing film images.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.286-289
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• 2007

We have developed an automated circuit defect inspection and repair method that can be used to improve the yield ratio of TFT-LCD. The method focuses on correcting resist patterns after the development process to ensure shape regularity. We built a prototype system and confirmed that the method is valid.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.41 no.4
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• pp.69-74
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• 2004

In this paper, we propose a novel method for improving defect-detection performance based on reconstruction of line-scan camera images using both the projection profiles and color space transform. The proposed method consists of RGB region segmentation, representative value reconstruction using the tracing system, and Y image reconstruction using color-space transformation. Through experiments it is demonstrated that the performance using the reconstructed image is better than that using aerial image for LCD surface inspection.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.845-848
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• 2007

Analysis of point defects invisible by a microscope has been studied on the a-Si thin film transistor panel. The point defects which were named Invisible Point Defect (IPD) is characterized by no particles or distortion of patterns on a pixel structure and randomly distributed on panels. To investigate the IPD, measurements were carried out: gray level driving, transistor transfer characteristic, focused ion beam (FIB), and secondary ion mass spectrometry (SIMS). The results showed that a contamination layer had a bad influence on an active surface. The contamination layer consisted of oxygen and iron from a water supply line during cleaning process. After the process tuning, IPD has been stabilized.

• Journal of the Korean Institute of Landscape Architecture
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• v.40 no.4
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• pp.104-113
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• 2012

This study aimed to find out the improvement plan through analyzing the perception of the expert group engaged in landscape architectural construction and to focus on analyzing the expert groups' experience on Landscape Construction Defects (LCD), defect liability, warranty period, and implementation of the defect liability. The results are as follows: 1. Regarding the experience on the LCD, landscape construction contractors were an awareness of the LCD issue at a serious level, while public-sector clients recognize moderately the LCD issue; and on the first priority in defect implementation, landscape construction contractors considered repair cost while public-sector clients value the identifying causes of defects. 2. In disagreement on the defect liability, landscape construction contractors attributed it to client's lack of responsibility for maintenance while public-sector clients ascribed it to the absence of dealing a criteria with LCD, and regarding the appropriate defect implementation, public-sector clients preferred the following objective by dealing the criteria with LCD while landscape construction contractors advocates by sharing the responsibilities for dealing with LCD based on the identified causes of construction defects. 3. Regarding the warranty period, the public-sector clients considered the 2-year warranty period as appropriate while landscape construction contractors considered it comparatively long, and concerning the commencement of defect warranty period, the public-sector clients viewed it as it should commence to cover the overall completion of the construction while landscape construction contractors perceived it to start on the completion of each work. 4. As for the improvement of the defect implementation system, public-sector clients considered it necessary to establish the objective dealing the criteria with LCD while landscape construction contractors viewed the legislation of maintenance duty. Also, with regard to the important value in establishing and dealing the criteria with LCD, public-sector clients pointed out the objective of the criteria for determining the defects per work type while landscape construction contractors suggested client (user)'s maintenance duty. Because of research, because the system in dealing with LCD is an absence of LCD management agency and dealing the criteria with LCD, it is needed to establish an LCD management agency and make the system in dealing with LCD.

• Journal of Korea Multimedia Society
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• v.15 no.6
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• pp.784-793
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• 2012

Defects of TFT-LCD is detected by thresholding the difference image between the input image and template one because LCD panel has its inherent patterns. However, the pitch corresponding to pattern period is gradually changed according to the distance from the center of camera due to geometric distortion of camera characteristics. This paper presents a method to detect defects through comparing the pitch area with neighbor pitch areas where the perspective transform is performed with the extracted features to correct the distortion. The experimental results show that the performance of the proposed method is very effective for real data.