• Proceedings of the KIEE Conference
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• 2006.07d
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• pp.2061-2062
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• 2006

a-Si(amorphous silicon) TFT(thin film transistor)는 TFT-LCD(liquid crystal display)의 화소 스위칭(switching) 소자로 폭넓게 이용되고 있다. 현재는 a-Si을 이용하여 gate drive IC를 기판에 집적하는 ASG(amorphous silicon gate) 기술이 연구, 적용되고 있는데 이때 가장 큰 제약은 문턱 전압(Vth)의 이동이다. 특히 고온에서는 문턱 전압의(Vth) 이동이 가속화 되고, Ioff current가 증가 하게 되고, 저온($0^{\circ}C$)에서는 전류 구동능력이 상온($25^{\circ}C$) 상태에서 같은 게이트 전압(Vg)에 대해서 50% 수준으로 감소하게 된다. 특히 ASG 회로는 여러 개의 TFT로 구성되는데, 각각의 TFT가 고온에서 Vth shift 값이 다르게 되어 설계시 예상하지 못 한 고온에서의 화면 무너짐 현상 즉 고온 노이즈 불량이 발생 할 수 있다. 고온 노이즈 불량은 고온에서의 각 TFT의 문턱전압 및 $I_D-V_G$ 특성을 측정한 결과 고온 노이즈 불량에 영향을 주는 인자가 TFT의 width와 기생 capacitor비 hold TFT width가 영향을 주는 것으로 실험 및 시뮬레이션 결과 확인이 되었다. 발생 mechanism은 ASG 회로는 AC 구동을 하기 때문에 Voff 전위에 ripple이 발생 되는데 특히 고온에서 ripple이 크게 증가 하여 출력 signal에 영향을 주어 불량이 발생하는 것을 규명하였다.

• Journal of Korea Society of Industrial Information Systems
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• v.15 no.2
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• pp.69-81
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• 2010

A Cold Cathode Fluorescent Lamp(CCFL) is used as a LCD Monitor's backlight widely. The most common way to check CCFL's defects is an examination with the naked eye. This naked eye examination can cause an examination inconsistency and an industrial disaster. To examine CCFL defects, a shooting equipment and a defect detection algorithm are necessary. This paper shows the shooting environments for checking CCFL and presents some CCFL defect detection algorithms. As a result of experiments, our implementations showed 98.32% of successful defect detection of CCFL.

• Proceedings of the IEEK Conference
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• 2003.07e
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• pp.1783-1786
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• 2003

In this paper, an automated line-defect detection method for TFT-LCD panel is presented. A DFB(Directional Filter Bank) and line-projection method are used to find line-defect which is one of the major defects occurred in TFT-LCD panel. The experimental results show that the proposed algorithm gave promising results for applying automated inspection technique for TFT-LCD panel.

• Proceedings of the KAIS Fall Conference
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• 2006.11a
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• pp.80-82
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• 2006

This paper is particle decreasing method of LCD stocker crane by TRIZ.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.7
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• pp.1725-1728
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• 2009

This research developed process control device and FGV pattern generating device essential for full gate visual inspection to improve process so that defect detection capability may be maximized in specified environment. The devices developed in this research, which can be swiftly replaced in case loss or error occurs, are anticipated to improve module yield as well as maintain tact loss near '0'. In addition, as a result of mounting H/W and S/W system to control detailed operation sequence in production line and executing performance check and verification, detection rates were 98.1% and 99.1% respectively for pixel defect by tact and line defect, and yield of the entire module process including gate and visual level test increased up to 98.3%.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.05a
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• pp.59-60
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• 2006

It is bringing out the importance of automated LCD testing equipment that satisfy a definite quality, confidence and testing speed, as LCD enterprises are recently expanding the production and facility investment in proportion to the sudden increase of LCD demand. So far, LCD inspection is however conducted by manual, or the confidence of existing testing equipment falls short of LCD enterprises's standard. It is therefore important to develop the testing equipment that determines the quality of product for production of an excellent LCD.

• Applied Microscopy
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• v.39 no.4
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• pp.349-354
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• 2009

In this paper we have constructed three dimensional images and examined structural failure on thin film transistor (TFT) liquid crystal display (LCD) by using dual-beam focused ion beam (FIB) and IMOD software. Specimen was sectioned with dual-beam focused ion beam. Series of two dimensional images were obtained by scanning electron microscopy. Three dimensional reconstruction was constructed from them by using IMOD software. The short defect between Gate layer and Data layer was found from the result of three dimensional reconstruction. That phenomena made the function of the gate lost and data signal supplied to the electrode though the Drain continuously. That signal made continuous line defect. The result of the three dimensional reconstruction, serial section, SEM imaging by using the FIB will be the foundation of the next advanced study.

• The KIPS Transactions:PartA
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• v.11A no.4
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• pp.235-242
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• 2004

When manufacturing information and communication device that consists of lots of part, it is important to improve the quality of the produced system by inspecting the system accurately and exclude the defected part. In case of LCD which is recently in a great demand, the inspection process of the nut which bonds the back frame to protect the LCD panel has to be done by human labor. It highly required an automatic inspection system which can inspect the nut without wasting human resources. In this paper, we describe the process of developing a system which automatically inspect the status of nuts inserted during the manufacturing of LCD. The nut inspection vision system developed measures the number of nut's spiral, the distance between pitches, the width of a pitch, and the inside diameter of nut. We have adopted lens with high magnifying power and calibration tool and intended to produce automatic lighting for maintaining a stable environment for a high precision system. We also developed the algorithms for analyzing the nut. We apply the system to real factory field and verify that it is better than the man power in terms of error rate.

• Journal of Korean Institute of Industrial Engineers
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• v.42 no.5
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• pp.327-336
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• 2016

Prediction of customer failure rates plays an important role for establishing appropriate management policies and improving the profitability for industries. For these reasons, many LCD (Liquid crystal display) manufacturing industries have attempted to construct prediction models for customer failure rates. However, most traditional models are based on the parametric approaches requiring the assumption that the data follow a certain probability distribution. To address the limitation posed by the distributional assumption underpinning traditional models, we propose using parameter-free data mining models for predicting customer failure rates. In addition, we use various information associated with product attributes and field return for more comprehensive analysis. The effectiveness and applicability of the proposed method were demonstrated with a real dataset from one of the leading LCD companies in South Korea.

• Proceedings of the Korean Society of Computer Information Conference
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• 2018.07a
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• pp.325-326
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• 2018

본 논문에서는 PCB 공정상의 육안검사를 통한 불량 분류 방식에서 CNN을 이용한 PCB 불량 분류 방식을 제안한다. 이 방식은 육안검사의 문제점인 작업자의 숙련도에 따른 검사 효율을 자동화 검사 시스템에 의해 해결하며, 불량 위치와 종류를 결과 이미지에 표시한다. 또한 이미지 분류 결과를 모니터링할 수 있도록 시리얼 통신을 통하여 Darknet 프레임워크와 LCD를 연동하였다. 적은 량의 데이터 셋으로도 좋은 결과를 냈으며, 다양한 데이터 셋을 이용해 훈련할 시 전반적인 PCB 불량의 분류가 가능할 것으로 예상된다.