• 제목/요약/키워드: J value

검색결과 3,229건 처리시간 0.032초

바인더 첨가에 따른 $Al_{18}B_4O_{33}/AC4CH$의 파괴인성에 관한 연구 (A Study on Fracture Toughness Properties of $Al_{18}B_4O_{33}/AC4CH$ by Binder Additives)

  • 신동인;정재욱;박원조;허선철;김형진
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2003년도 춘계학술대회
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    • pp.61-66
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    • 2003
  • In this paper, the effect of binder additive on the fracture toughness was metal matrix composite produced by squeeze casting method. In this study using the matrix is AC4CH and reinforcement used Aluminum borate whisker. Each MMC was produced by add inanimate binder ($SiO_2,\;Al2O_3,\;TiO_2$) to whiskers for increase the binding together of whiskers. Fracture toughness test were carry out in accordance with the ASTM E-399 standard test method, W=25mm, b=12.5mm CT(half size) specimen. However Base metal AC4CH was not meet the qualification of $P_m/P_Q<1.1$, so that test were performed $J_{IC}$ test. $K_{J_{IC}}$ value was measuring by $J_{IC}$ value change into $K_{IC}$. $J_{IC}$ test was carry out in accordance with the ASTM 1820.

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22.9kV CN/CV 전력 케이블의 상시 허용전류에 관한 연구 (A study on the continuous permissible current rating in 22.9kV CN/CV underground distribution power cables)

  • 김정배;김정태;구자윤;선종호;류희석;조연옥
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1990년도 하계학술대회 논문집
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    • pp.304-307
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    • 1990
  • Referring to the calculation of the continuous permissible current rating in 22.9kV CN/CV underground distribution power cables, the current and temperature have been fully discussed and analyzed based on their three different values: one is the actually measured value throughout our test and the other two are calculated in connection with different specifications IEC-287 and JCS-168-D respectively. For this purpose, our test has been carried out with real cables which have been under stress either with induced current or with rating voltage. In the former, the calculated current of IEC-287 shows closer value to the measured one than that of JCS-168-D does. In the latter, there has been little difference on the temperature comparing with that measured without voltage application. Therefore, we think that it is preferable to choose the IEC-287 specification for the calculation of the continuous permissible current rating in the commercially power cables.

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35톤급 FRP선박 외판재의 충격파괴거동에 관한 연구 (A Study on the Impact Fracture Behavior of Side Plate of 35 Ton Class FRP Ship)

  • 김형진;이진정;고성위;김재동
    • 동력기계공학회지
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    • 제9권4호
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    • pp.137-142
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    • 2005
  • The effects of temperature and initial crack length on impact fracture behavior of side plate material of 35 ton class FRP ship, which are composed by glass fiber and unsaturated polyester resin, were investigated. Impact fracture toughness of GF/PE composites displayed maximum value when the temperature of specimen is room temperature and $50^{\circ}C$, and with decrease in temperature of specimen, impact fracture toughness decreased. Impact fracture energy of GF/EP composites decreased with increase in initial crack length of specimen, and this value decreased rapidly when the temperature of specimen is lowest, $-25^{\circ}C$,. It is believed that sensitivity of notch on impact fracture energy were increased with decrease in temperature of specimen. As the GF/EP composites exposed in low temperature, impact fracture toughness of composites decreased gradually owing to the decrease of interface bonding strength caused by difference of thermal expansion coefficient between the glass fiber/polyester resin. Further, decrease of interface bonding strength of composites with decrease in specimen temperature was ascertained by SEM photograph of impact fracture surface.

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WPC제조시 coupling agent가 기계적 물성에 미치는 영향에 관한 연구 (A study on the Effect of Coupling Agents on the Mechanical Properties of WPC)

  • 신경섭;황택성
    • 한국재료학회지
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    • 제8권12호
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    • pp.1077-1081
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    • 1998
  • 목분 충진제의 함량을 달리 하여 PE수지를 매트릭스로 하여 Wood Plastic Composites (WPC)를 제조하였다. 또한 매트릭스와 충진제간의 결합력을 증가시키기 위하여 커플링제를 사용하였으며, 보강재의 보강률과 커플링제 처리가 복합재의 기계적 물성에 미치는 영향과 계면현상을 관찰하였다. 커플링제로 MA를 사용하였을 경우에 tensile strength는 3wt%의 농도에서 25.91MPa의 최대값을 나타내었으며. MAOMS커플링제의 경우, 3wt%의 처리 농도에서 22.48MPa로 MA로 처리한 것보다 낮았다. 충격강도는 MA의 경우에는 3wt%일 때 44.38J/m의 최대값을 나타냈으며, MAOMS의 처리에서는 36.09J/m로 MA처리한 것보다 낮게 나타났다.

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염료감응형 태양전지를 위한 고분자 전해질막에서의 이온농도의 효과 (Effect of Salt Concentration on Electrolyte Membranes for Dye Sensitized Solar Cells)

  • 권소영;윤미혜;조두현;정유영;구자경
    • 멤브레인
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    • 제21권3호
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    • pp.213-221
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    • 2011
  • 염료감응형 태양전지를 위한 겔 고분자 전해질막을 제조하였다. 고분자물질로는 Poly(ethylene oxide) (PEO)를 사용하였으며, 가소제로서 poly(ethylene glycol) (PEG)을 첨가하였고, 전해질염 및 $I^-/I_3^-$의 공급원으로서 KI 및 $I_2$를 첨가하여 고분자 전해질막을 제조하였으며, 이와 같은 고분자 전해질막을 바탕으로 염료감응형 태양전지를 제조하였다. 고분자 전해질 내의 가소제로서의 PEG는 95%의 함량으로 주입되었으며, 전해질 내의 EO 1 mole 당 KI mole 수([KI]/[EO] 비)가 0.022, 0.044, 0.066 및 0.088이 되도록 KI가 주입되었다. 이러한 방식으로 제조된 겔 전해질막은 상온에서 왁스(wax) 형태를 보였다. 낮은 KI 함량의 영역에서는 KI 함량이 증가하면서 전해질막을 통한 이온전도도가 증가하였으며, [KI]/[EO]비가 0.066인 때에 이온전도도는 최대값을 보인 후 0.088로 증가하면서 이온전도도는 감소하였다. 염료감응형 태양전지에 있어서는 고분자 전해질막 내의 KI 함량이 증가하면서 $V_{OC}$는 지속적으로 감소하였다. 반면, $J_{SC}$의 경우 낮은 KI 함량의 범위에서는 KI 함량이 증가하면서 $J_{SC}$는 증가하였으며 [KI]/[EO]비가 0.044인 때에 $J_{SC}$가 최대값을 보인 후 그 이상의 높은 범위에서는 KI함량의 증가에 따라 $J_{SC}$는 감소하였다.

RECURRENCE RELATIONS FOR QUOTIENT MOMENTS OF THE PARETO DISTRIBUTION BY RECORD VALUES

  • Lee, Min-Young;Chang, Se-Kyung
    • 한국수학교육학회지시리즈B:순수및응용수학
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    • 제11권1호
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    • pp.97-102
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    • 2004
  • In this paper we establish some recurrence relations satisfied by quotient moments of upper record values from the Pareto distribution. Let {$X_n,n\qeq1$}be a sequence of independent and identically distributed random variables with a common continuous distribution function(cdf) F($chi$) and probability density function(pdf) f($chi$). Let $Y_n\;=\;mas{X_1,X_2,...,X_n}$ for $ngeq1$. We say $X_{j}$ is an upper record value of {$X_{n},n\geq1$}, if $Y_{j}$$Y_{j-1}$,j>1. The indices at which the upper record values occur are given by the record times ${u( n)}n,\geq1$, where u(n) = min{j|j >u(n-l), $X_{j}$$X_{u(n-1)}$,n\qeq2$ and u(l) = 1. Suppose $X{\epsilon}PAR(\frac{1}{\beta},\frac{1}{\beta}$ then E$(\frac{{X^\tau}}_{u(m)}}{{X^{s+1}}_{u(n)})\;=\;\frac{1}{s}E$ E$(\frac{{X^\tau}}_{u(m)}{{X^s}_{u(n-1)}})$ - $\frac{(1+\betas)}{s}E(\frac{{X^\tau}_{u(m)}}{{X^s}_{u(n)}}$ and E$(\frac{{X^{\tau+1}}_{u(m)}}{{X^s}_{u(n)}})$ = $\frac{1}{(r+1)\beta}$ [E$(\frac{{X^{\tau+1}}}_u(m)}{{X^s}_{u(n-1)}})$ - E$(\frac{{X^{\tau+1}}_u(m)}}{{X^s}_{u(n-1)}})$ - (r+1)E$(\frac{{X^\tau}_{u(m)}}{{X^s}_{u(n)}})$]

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Features and Properties of $YBa_2$$Cu_3$$O_{7-x}$ Films Grown on SrTi$O_3$ by High Frequency PLD

  • Shi, D.Q.;Ko, R.K.;Song, K.J.;Chung, J.K.;Choi, S.J.;Park, Y.M.;Shin, K.C.;Yoo, S.I.;Park, C.
    • Progress in Superconductivity
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    • 제5권1호
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    • pp.75-79
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    • 2003
  • YBCO films were deposited with various thicknesses from 100nm to 1.6$\mu\textrm{m}$ on single crystal $SrTiO_3$ substrates by pulsed laser deposition (PLD). The effects of different deposition conditions, especially different deposition rates by means of changing the pulsed laser frequency up to 200Hz, on the J$_{c}$ value were studied. For YBCO film with the thickness of 200nm, the $J_{c}$ value of $2.1MA/\textrm{cm}^2$ has been achieved under the high deposition rate of 3.2nm/s (190nm/min). The $J_{c}$ can be maintained greater than $1M/\textrm{cm}^2$ with the thickness less than 1$\mu\textrm{m}$. The X-ray analysis was used to examine the texture, crystallization and surface quality. The SEM was employed to analyze the surface of YBCO, and it was shown the surface of YBCO film became rougher with increasing the thickness. There were many large singular outgrowths and networks of outgrowths on the surface of YBCO films which lowered the density of thick YBCO film. The outgrowth network was probably the a-axis YBCO corresponding to XRD $\theta$-2$\theta$scan and $\chi$-scan which were used to characterize a-axis orientation of YBCO film. The reason for J$_{c}$ declining with increasing the thickness was studied and discussed.sed.

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The effect of erbium-doped: yttrium, aluminium and garnet laser irradiation on the surface microstructure and roughness of double acid-etched implants

  • Kim, Ji-Hyun;Herr, Yeek;Chung, Jong-Hyuk;Shin, Seung-Il;Kwon, Young-Hyuk
    • Journal of Periodontal and Implant Science
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    • 제41권5호
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    • pp.234-241
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    • 2011
  • Purpose: One of the most frequent complications related to dental implants is peri-implantitis, and the characteristics of implant surfaces are closely related to the progression and resolution of inflammation. Therefore, a technical modality that can effectively detoxify the implant surface without modification to the surface is needed. The purpose of this study was to evaluate the effect of erbium-doped: yttrium, aluminium and garnet (Er:YAG) laser irradiation on the microstructural changes in double acid-etched implant surfaces according to the laser energy and the application duration. Methods: The implant surface was irradiated using an Er:YAG laser with different application energy levels (100 mJ/pulse, 140 mJ/pulse, and 180 mJ/pulse) and time periods (1 minute, 1.5 minutes, and 2 minutes). We then examined the change in surface roughness value and microstructure. Results: In a scanning electron microscopy evaluation, the double acid-etched implant surface was not altered by Er:YAG laser irradiation under the condition of 100 mJ/pulse at 10 Hz for any of the irradiation times. However, we investigated the reduced sharpness of the specific ridge microstructure that resulted under the 140 mJ/pulse and 180 mJ/pulse conditions. The reduction in sharpness became more severe as laser energy and application duration increased. In the roughness measurement, the double acid-etched implants showed a low roughness value on the valley area before the laser irradiation. Under all experimental conditions, Er:YAG laser irradiation led to a minor decrease in surface roughness, which was not statistically significant. Conclusions: The recommended application settings for Er:YAG laser irradiation on double acid-etched implant surface is less than a 100 mJ/pulse at 10 Hz, and for less than two minutes in order to detoxify the implant surface without causing surface modification.

RECURRENCE RELATION FOR QUOTIENTS OF THE POWER DISTRIBUTION BY RECORD VALUES

  • Lee, Min-Young;Chang, Se-Kyung
    • Korean Journal of Mathematics
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    • 제12권1호
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    • pp.15-22
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    • 2004
  • In this paper we establish some recurrence relations satisfied by quotient moments of upper record values from the power distribution. Let {$X_n$, $n{\geq}1$} be a sequence of independent an identically distributed random variables with a common continuous distribution function(cdf) $F(x)$ and probability density function(pdf) $f(x)$. Let $Y_n=max\{X_1,X_2,{\cdots},X_n\}$ for $n{\geq}1$. We say $X_j$ is an upper record value of {$X_n$, $n{\geq}1$}, if $Y_j$ > $Y_{j-1}$, $j$ > 1. The indices at which the upper record values occur are given by the record times {$u(n)$}, $n{\geq}1$, where $u(n)=min\{j{\mid}j>u(n-1),X_j>X_{u(n-1)},n{\geq}2\}$ and $u(1)=1$. Suppose $X{\in}POW(0,1,{\theta})$ then $$E\left(\frac{X^r_{u(m)}}{X^{s+1}_{u(n)}}\right)=\frac{\theta}{s}E\left(\frac{X^r_{u(m)}}{X^s_{u(n-1)}}\right)+\frac{(s-\theta)}{s}E\left(\frac{X^r_{u(m)}}{X^s_{u(n)}\right)\;and\;E\left(\frac{X^{r+1}_{u(m)}}{X^s_{u(n)}}\right)=\frac{\theta}{n+1}\left[E\left(\frac{X^{r+1}_{u(m-1)}}{X^s_{u(n+1)}}\right)-E\left(\frac{X^{r+1}_{u(m)}}{X^s_{u(n-1)}}\right)+\frac{r+1}{\theta}E\left(\frac{X^r_{u(m)}}{X^s_{u(n)}}\right)\right]$$.

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