Generation of Testability on High Density /Speed ATM MCM and Its Library Build-up using BCB Thin Film Substrate (고속/고집적 ATM Switching MCM 구현을 위한 설계 Library 구축 밀 시험성 확보)
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- Journal of the Microelectronics and Packaging Society
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- v.6 no.2
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- pp.37-43
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- 1999