• 제목/요약/키워드: Industrial technology leakage

검색결과 192건 처리시간 0.03초

Development of an automated system for water-hydraulic and leakage test of pressure vessels

  • Kim, Dong-Soo;Lee, Won-Hee
    • International Journal of Precision Engineering and Manufacturing
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    • 제5권1호
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    • pp.55-59
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    • 2004
  • This study developed a fully automated test system for pressure vessels, containing such as oxygen, nitrogen, which is widely used in many industries. The pressure vessel test has three major parts including weight measurement test, water-hydraulic test and leakage test followed by cleaning and drying. The control system for these tests consists of three parts: a PLC, a monitoring system and a database management system. The PLC oversees overall control of test machines, while the monitoring system measures and displays weight, pressure, flow etc. for every situations, and the database management system stores test data. These three modules are designed to communicate with one another at 1 Hz frequency alerting problematic situations to the operator. The system has gone through actual field tests for verification of performances.

Simple Technique Reducing Leakage Current for H-Bridge Converter in Transformerless Photovoltaic Generation

  • Kot, Radoslaw;Stynski, Sebastian;Stepien, Krzysztof;Zaleski, Jaroslaw;Malinowski, Mariusz
    • Journal of Power Electronics
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    • 제16권1호
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    • pp.153-162
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    • 2016
  • Given their structural arrangement, photovoltaic (PV) modules exhibit parasitic capacitance, which creates a path for high-frequency current during zero-state switching of the converter in transformerless systems. This current has to be limited to ensure safety and electromagnetic compatibility. Many solutions that can minimize or completely avoid this phenomenon, are available. However, most of these solutions are patented because they rely on specific and often complex converter topologies. This study aims to solve this problem by introducing a solution based on a classic converter topology with an appropriate modulation technique and passive filtering. A 5.5 kW single-phase residential PV system that consists of DC-DC boost stage and DC-AC H-bridge converter is considered. Control schemes for both converter stages are presented. An overview of existing modulation techniques for H-bridge converter is provided, and a modification of hybrid modulation is proposed. A system prototype is built for the experimental verification. As shown in the study, with simple filtering and proper selection of switching states, achieving low leakage current level is possible while maintaining high converter efficiency and required energy quality.

국내 포털 기사자료 분석을 통한 산업기술유출 사례와 산업보안 강화 방안 연구 (A Study on Industrial Technology Leakage and Effective Industrial Security Measures through analysis of domestic portal article data)

  • 양현정;이창무
    • 융합보안논문지
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    • 제17권2호
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    • pp.3-13
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    • 2017
  • 지식정보화 사회가 도래하면서 많은 국내기업이 핵심기술 및 지식재산 확보를 위해 기술개발에 많은 투자를 하고 있다. 하지만 적극적인 기술개발 투자에 비해 기업이 보유한 기술을 보호하기 위한 보안투자가 미흡한 결과 다수의 기업 및 연구소에서 기술 유출 사건이 급격하게 증가하고 있다. 이러한 기술유출의 증가는 단순히 기업에 피해뿐만 아니라 국가 경제에도 직 간접적인 악영향을 미치고 있는 실정이다. 산업기술유출은 주로 전 현직 직원에 의해 이뤄지고 있지만, 이를 중점적으로 비교 분석한 연구는 많지 않다. 따라서 본 연구는 2014년부터 2016년 동안 발생한 산업기술유출 사례를 기술유출 피해기업의 유형, 회사 내 기술유출 주체자의 직위, 기술유출의 공범여부, 기술유출에 사용된 도구, 기술유출의 동기로 유형화하여 산업기술유출 실태를 파악하였다. 이러한 유형별 분석을 통해 산업기술유출의 패턴과 특징에 대해 조사하고 산업기술유출 방지를 위한 산업보안 증진방안을 모색하였다.

IEC60947-2에 따른 누전차단기의 순시단락시험 과도현상에 대한 연구 (The Transient Analysis of Instant Short-Circuit Test Equipment For Earth Leakage Circuit Breaker)

  • 류행수;김명석;한규환
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2003년도 하계학술대회 논문집 A
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    • pp.357-359
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    • 2003
  • This paper is for the transient analysis of instant short-circuit test equipment according to the test of tripping limits and characteristics under IEC 60947-2. The in-rush current is harmful to almost equipments and the exact testing is not made because of it. LGIS has a instant short-circuit test equipment, but it is not suitable for carrying out instant short-circuit test on ELB(Earth Leakage Circuit breaker) by reason of that. Now, I am going to show a solution for that problem. After applying this method, manufacturer is going to acquire the exact testing result according to the IEC standard. Moreover, Testing laboratory will be trusted by clients.

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Impact of Plasma Induced Degradation on Low Temperature Poly-Si CMOS TFTs during Etching Process

  • Chang, Jiun-Jye;Chen, Chih-Chiang;Chuang, Ching-Sang;Yeh, Yung-Hui
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2002년도 International Meeting on Information Display
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    • pp.519-522
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    • 2002
  • In this paper, we analyze the impact of plasma etching process induced device degradation on low temperature poly-Si TFTs. The results indicate the relationship between device degradation and PPID effect during plasma fabrication. The dual-gate structure, which is used to suppress leakage current, is also discussed in this research.

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작업 강도가 방진 마스크의 밀착도와 감성품질에 미치는 영향 (Effect of Work Intensity on Fit Factor and Affecive Quality of Dustproof Mask)

  • 이진실;조선희;윤정민;김민선;박재규;최재호
    • 품질경영학회지
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    • 제46권2호
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    • pp.301-310
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    • 2018
  • Purpose: The purpose of this study is to investigate the effect of work intensity on fit factor and affective quality of the dustproof Background: Among the victims who suffer pneumoconiosis due to the inhalation of toxic substances or the lack of oxygen during the work, the proportion of the victims is larger than the other causes. Wearing a respirator may prevent pneumoconiosis, but it can be hazardous to workers because of the leakage through filters, cartridges, exhaust valves, broken parts, and face-to-face contact. Despite leakage through the contact area between the mask and the face has various causes such as the wearer's activity, sweat accumulation, facial shape, etc., There is a lack of relevant research and regulation compared to developed countries that have already institutionalized the law 30 years ago and give the right to sell through a test Method: The work intensity was adjusted by walking or running at 6km/h and 11km/h on the treadmill, and tasks were defined with reference to the test procedure and the exercise sequence applied in the face leakage test of the dustproof mask. And fit factor was measured objectively using 'Respirator Fit Tester 8038' which measures fit factor calculated by dividing the number of dust present outside the mask by inside the mask. In addition, affective quality was classified by the ease of use, ease of breathing, and ease of wearing, and was measured using the 5-point likert scale questionnaire. Results: There was a significant difference in fit factor, ease of breathing, and wearing convenience according to work intensity and no significant difference in ease of use(${\alpha}=0.01$). And when the work intensity was high, fit factor, ease of breathing, and wearing convenience were all lower than when the work intensity was low. Conclusion: In Korea, it is necessary to consider consideration of the work intensity when testing the leakage rate of the face part for safety certification of the respiratory protective equipment, When developing a mask, it should be possible to maintain high adhesion even under intense, active situation and high temperature conditions by selecting materials, improving the wearing style, and expanding the adjustable range.

The Simplified LDD Process of LTPS TFT on PI Substrate

  • Hu, Guo-Ren;Kung, Bo-Cheng;He, King-Yuan;Cheng, Chi-Hong;Huang, Yeh-Shih;Liu, Chan-Jui;Tsai, Cheng-Ju;Huang, Jung-Jie
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.641-644
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    • 2008
  • Traditional LTPS TFT needs additional LDD process to decrease leakage current. However the fabrication process is no suitable for PI substrate. Additional laser multi-irradiation will damage the poly-Si to cause the TFT electrical degrade. Therefore we propose the simplified process to activate the $N^+$ and $N^-$ at the same time.

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광반응사출성형 시 캐비티 엣지에서 발생하는 미세누출현상에 관한 해석적 연구 (A numerical study on micro leakage behaviors at cavity edge during photo reaction injection molding)

  • 라문우
    • Design & Manufacturing
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    • 제10권3호
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    • pp.8-13
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    • 2016
  • Despite technological advance, there have been several troubles in photo reaction injection molding (photo RIM) to produce ultra thin light guide panels (LGPs). In this study, micro leakage problem at cavity edge during photo RIM was investigated numerically. In order to obtain optimal processing conditions, we regulated inlet pressure of injected resin at the cavity edge and figured out micro leakage behaviors. At low inlet pressure (less than 100 Pa), though the micro leakage problem was not occurred, another problem, short shot due to not enough driving force, was appeared More than 1,000 Pa of the inlet pressure, injected resin was rapidly leaked through the micro gap at the cavity edge. Finally, we obtained optimal inlet pressure around 600 ~ 1,000 Pa. At this region, injected resin fully filled the cavity without micro leakage behavior. Based on the present study, further comparative investigations with experimental photo RIM should be performed to find optimal processing conditions for produce ultra thin LGPs.

PSCAD/EMTDC를 이용한 ESS의 누설전류 모델링에 관한 연구 (A Study on Modeling of Leakage Current in ESS Using PSCAD/EMTDC)

  • 김지명;태동현;이일무;임건표;노대석
    • 한국산학기술학회논문지
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    • 제22권2호
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    • pp.810-818
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    • 2021
  • ESS의 누설전류는 PCS(Power Control System)측 누설전류와 계통불평형 전류로 인한 누설전류로 구분되는데, PCS측의 누설전류는 정상 상태 운전 시, IGBT(Insulated Gate Bipolar Transistor) 스위칭의 전압 변화량과 IGBT와 방열판 사이에 존재하는 기생 커패시턴스에 의해 발생한다. 또한, 계통불평형 전류에 의한 누설전류는 불평형 부하로 인해 발생한 불평형 전류가 Yg-∆ 결선방식의 3각 철심이 적용된 태양광전원 연계형 변압기의 중성선을 통해 ESS로 유입된다. 따라서, 본 논문에서는 방열판 유도공식을 통해 산정한 기생 커패시턴스에 의하여 PCS측의 누설전류 발생 메커니즘을 제시하고 또한, 계통불평형에 의한 ESS측의 누설전류 발생 메커니즘을 제안한다. 이를 바탕으로, 배전계통 상용해석 프로그램인 PSCAD/EMTDC를 이용하여 배터리부, PCS부, AC전원부로 이루어진 PCS측의 누설전류 발생 메커니즘과 배전 계통부, 불평형 부하부, ESS부로 이루어진 계통불평형에 의한 ESS측의 누설전류 발생 메커니즘을 모델링하고, 누설전류의 특성을 평가한다. 상기의 모델링을 바탕으로 시뮬레이션을 수행한 결과, 외함의 저항과 접지저항의 크기에 따라 PCS측의 누설전류는 7[mA]에서 34[mA]로, 계통불평형에 의한 배터리 외함으로 흐르는 누설전류는 3.96[mA]에서 10.76[mA]로 증가하여 배터리측에 큰 영향을 미침을 알 수 있었다.

보안교육과 보안관리 역량의 상관관계 분석: 인가된 내부자 기밀유출사례를 중심으로 (An Analysis of Relationship between Industry Security Education and Capability: Case Centric on Insider Leakage)

  • 이치석;김양훈
    • 한국전자거래학회지
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    • 제20권2호
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    • pp.27-36
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    • 2015
  • 국가 상대로 한 국가기밀유출과 더불어 최근 산업 기술유출은 점점 늘어가고 유출의 범위가 기술유출 중심에서 정보통신, 전기전자, 방위산업, 전략물자 불법수출, 외국의 경제 질서교란, 지식재산침해 등 신 경제안보 분야로 다양화되는 추세로 유출 피해는 유출된 기업에 피해를 줄 뿐만 아니라 국가의 이익과 국내 산업 전반에 영향을 끼칠 수 있다. 국가정보원 산업기밀 보호센터 통계에 따르면, 기술유출의 주된 원인은 해킹과 악성코드와 같이 외부에 의한 것뿐 아니라 전 현직직원 등 내부유출이 약 80%를 차지하며, 협력업체 의한 기술유출이 뒤를 이어 금전유혹과 개인의 이익으로 인한 기술유출이 계속해서 꾸준히 증가하고 있다. 그러나 그간의 연구들은 핵심자산 유출을 방지하기 위하여 기업의 보안역량을 측정하거나, 관리를 위한 측정지표를 개발하는 연구가 주를 이루고 있었으며, 가장 핵심이 되는 기업구성원들의 보안활동에 대한 기초연구가 미흡한 상황이다. 따라서, 본 연구에서는 보안 활동에 가장 기초가 되는 보안교육이 기업의 보안역량에 미치는 영향에 대해 분석하였다. 그 결과, 보안교육은 보안역량에 양(+)의 상관관계를 나타내는 것으로 분석되었다.