• Journal of the Korean Crystal Growth and Crystal Technology
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• v.16 no.4
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• pp.133-140
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• 2006

The growth characteristics and properties of large size $SrAlF_5$ single crystals are described and compared with those of $BaMgF_4$. Transmission spectra in the vacuum ultraviolet wavelength region indicate a high transparency of $SrAlF_5$ (about 90% without considering surface reflection loses) down to 150 nm, on contrast to the optical loses observed for $BaMgF_4$. The ferroelectric character of $SrAlF_5$ is evidenced by the reversal of the spontaneous polarization in a hysteresis loop. The higher potential of $SrAlF_5$ in comparison with $BaMgF_4$ for the realization of all-solid-state lasers in the ultraviolet wavelength region by the quasi-phase matching (QPM) technique is pointed out. $SrAlF_5$, besides a higher grade of transparency, shows a nonlinear effective coefficient similar to that of quartz and uniaxial nature, on contrast to the one order smaller nonlinear coefficient and biaxial character of $BaMgF_4$. The refractive index of $SrAlF_5$ from the ultraviolet to the near-infrared wavelength region is measured by the minimum deviation method. The Sellmeier and Cauchy coefficients are obtained from the fits to the curves of the ordinary and extraordinary refractive indices, and the grating period for the first order QPM is estimated as a function of the wavelength. The poling periodicity for 193 nm SHG from 386 nm is $4{\mu}m$.

• Korean Journal of Optics and Photonics
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• v.15 no.6
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• pp.490-494
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• 2004

Bragg gratings were fabricated in Ge-doped silica planar lightwave circuits (PLC) for different writing conditions to study the growth characteristics. The refractive index modulation of the gratings grew in the PLC with total fluence F according to the power law $\Delta$n=A $F^{B}$. The characteristics of the PLC gratings formed for external cavity lasers match closely to those predicted by the power law. The oscillation spectra of the FP-LD with a Bragg grating grown in the PLC waveguide were also presented.d.

• Journal of Astronomy and Space Sciences
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• v.30 no.4
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• pp.307-314
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• 2013

Infrared optical systems are operated at low temperature and vacuum (LT-V) condition, whereas the assembly and alignment are performed at room temperature and non-vacuum (RT-NV) condition. The differences in temperature and pressure between assembly/alignment environments and operation environment change the physical characteristics of optical and opto-mechanical parts (e.g., thickness, height, length, curvature, and refractive index), and the resultant optical performance changes accordingly. In this study, using input relay optics (IO), among the components of the Immersion GRating INfrared Spectrograph (IGRINS) which is an infrared spectrograph, a simulation based on the physical information of this optical system and an actual experiment were performed; and optical performances in the RT-NV, RT-V, and LT-V environments were predicted with an accuracy of $0.014{\pm}0.007{\lambda}$ rms WFE, by developing an adaptive fitting line. The developed adaptive fitting line can quantitatively control assembly and alignment processes below ${\lambda}/70$ rms WFE. Therefore, it is expected that the subsequent processes of assembly, alignment, and performance analysis could not be repeated.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.11
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• pp.75-82
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• 2004

A metrological atomic force microscope (M-AFM) was developed fur the length measurements of nanometer range, through the modification of a commercial AFM. To eliminate nonlinearity and crosstalk of the PZT tube scanner of the commercial AFM, a two-axis flexure hinge scanner employing built-in capacitive sensors is used for X-Y motion instead of PZT tube scanner. Then two-dimensional displacement of the scanner is measured using two-axis heterodyne laser interferometer to ensure the meter-traceability. Through the measurements of several specimens, we could verify the elimination of nonlinearity and crosstalk. The uncertainty of length measurements was estimated according to the Guide to the Expression of Uncertainty in Measurement. Among several sources of uncertainty, the primary one is the drift of laser interferometer output, which occurs mainly from the variation of refractive index of air and the thermal stability. The Abbe error, which is proportional to the measured length, is another primary uncertainty source coming from the parasitic motion of the scanner. The expanded uncertainty (k =2) of length measurements using the M-AFM is √(4.26)$^2$+(2.84${\times}$10$^{-4}$ ${\times}$L)$^2$(nm), where f is the measured length in nm. We also measured the pitch of one-dimensional grating and compared the results with those obtained by optical diffractometry. The relative difference between these results is less than 0.01 %.

• Korean Journal of Optics and Photonics
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• v.25 no.1
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• pp.38-43
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• 2014

An external cavity laser supporting two wavelengths is demonstrated by incorporating polymer waveguide Bragg reflectors and a superluminescent light-emitting diode. An oversized rib waveguide structure and Bragg gratings are designed by using the effective-index and transmission-matrix methods. Bragg gratings with different periods are inscribed on a polymer waveguide through double-exposure laser interferometry. In order to tune the cavity loss affected by the reflectivity of Bragg gratings, a Bragg reflectors with varying length is incorporated. Two-wavelength-mode lasing is achieved for the device consisting of 2-mm long, 537-nm period gratings and 2.2-mm long, 540-nm period gratings; the lasing wavelengths are 1554 nm and 1564 nm, with an output power close to 0 dBm, a 20-dB bandwidth of 0.2 nm, and a side-mode suppression ratio of 45 dB.