• 제목/요약/키워드: InGaP

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InAs/GaAs 양자점 태양전지의 광학적 특성 평가: 접합계면전기장 및 AlGaAs 포텐셜 장벽효과

  • 김종수;한임식;이승현;손창원;이상조;;하재두;김진수;노삼규;이상준;최현광;임재영
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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    • pp.107-107
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    • 2012
  • 본 연구에서는 GaAs p-i-n 태양전지구조에 InAs 양자점을 삽입하여 계면의 전기장 변화를 Photoreflectance (PR) 방법으로 연구하였다. InAs/GaAs 양자점 태양전지구조는 n-GaAs 기판위에 p-i-n 구조의 태양전지를 분자선박막성장 장치를 이용하여 제작하였다. GaAs p-i-n 태양전지와 p-QD(i)-n 양자점 태양전지를 제작하여 계면전기장의 변화를 PR 신호에 나타난 Franz-Keldysh oscillation (FKO)으로부터 측정하였다. 기본적인 p-i-n 구조에서 두 가지 전기장성분을 검출 하였고 양자점 태양전지구조에서는 39 kV/cm 이상의 내부전기장이 존재함을 관측하였다. 이러한 내부전기장은 양자점 주변에 형성된 국소전기장의 효과로 추측하였다. 아울러 양자점을 AlGaAs 양자우물 구조에 삽입하여 케리어의 구속에 의한 FKO의 변화를 관측하였으며 양자점 태양전지의 구조적 변화에 따른 효율을 측정하여 비교 분석하였다.

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태양광 변환을 위한 p형 GaAs 광전극의 전기적 특성 (Electrical Properties of p-GaAs Photoelectrode for Solar Energy Conversion)

  • 윤기현;이정원;강동헌
    • 한국세라믹학회지
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    • 제32권11호
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    • pp.1262-1268
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    • 1995
  • Photoelectrochemical properties of p-GaAs electrode have been investigated. I-V characteristic shows that the cathodic photocurrent is observed at -0.7 V vs. SCE. The photoresponse at near 870~880nm wavelength indicates that the photogenerated carriers contibuted to the observed current. The maximum converson efficiency of 35% is obtained for a Xe lamp light source at 400nm. In C-V relation, capacitance peaks appeared at the frequencies of 100Hz and 300Hz due to the activation of the interfacial states which exist at the energy level corresponding to the one-third of the GaAs band gap. The difference of about 1.1V between flatband potential (Vfb) from the Mott-Schottky method and onset voltage from I-V curve is observed due to the trap of carriers at the interfacial states in the boundary between GaAs and electrolyte. In case of WO3 deposited p-GaAs electrode, higher positive onset current and photocurent density are obtained. This can be explained by the fact that carriers are generated by light penetrated into the WO3 thin flm as well as p-GaAs substrate and then move into the electrolyte effectively.

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선택적 LPE방법에 의한 GaAs가판 상의 InP이종접합 박막의 성장 (Growth of Heteroepitaxial InP/GaAs by selective liquid phase epitaxy)

  • 이병택;안주헌;김동근;안병찬;남산;조경익;박인식;장성주
    • 한국재료학회지
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    • 제4권6호
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    • pp.687-694
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    • 1994
  • 선택적 LPE방법을 이용하여 (111)B GaAs 기판 상에 InP연속 박막을 성장하고 그 특성을 평가하였다. 적정 LPE성장조건으로 성장온도 $660^{\circ}C$, 과냉도 $5^{\circ}C$, 냉각속도 $0.4^{\circ}C$/min였으며, 연구된 온도 범위에서 성장온도가 증가할수록 표면형상이 개선되었고 ELO의 넓이가 증가하였다. Seed방향이 <112>방향에서 110-160$\mu \textrm{m}$ 정도의 최대 ELO 넓이가 얻어졌으며 60-80$\mu \textrm{m}$정도의 마스크 간격에서 연속박막을 용이하게 성장할 수 있었다. LPE 성장초기에 기판 용해 현상이 발생하였으며 이에 따라 성장박막의 조성이 대략 $In_{0.85}Ga_{0.15}$As$_{0.01}P{0.99}$으로 변화하고 InP/GaAs계면 및 박막 표면형상이 거칠어졌으나 기판의 성장 부위가 제한됨에 따라 통상적인 LPE박막에 비교하여 매우 개선된 표면형상을 얻을 수 있었다. 두개의 성장융액을 이용하여 1차 박막성장 후 다시 InP 박막을 성장하는 2단성장 방법을 사용하여 순수한 InP/GaAs박막을 성장할 수 있었으며 단면 TEM분석 결과 SLPE성장박막으로 전파하는 활주전위는 산화막 마스크에 의해 효과적으로 차단됨을 알 수 있었다.

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장파장 응용을 위한 InP/InGaAs HBT의 광특성 (Characteristic of InP/InGaAs HBT for Long Wavelength Application)

  • 김강대;허영헌;박재홍;김용규;문태정;황성범;송정근
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2003년도 하계종합학술대회 논문집 II
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    • pp.1073-1076
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    • 2003
  • This paper shows the performance as a photodetector of InP/InGaAs HPT operated with a base bias and forntside optical injection through the emitter. InP/InGaAs HPT produced the high optical gain of about 16.2 where HPT is biased at Vc=1V, I$_{B}$=20$\mu$A with an input optical power of 2.4$\mu$W. And we examined that the optical gain of HPTs becomes larger when operating in 3-terminal configuration rather than 2-terminal with the floating base. The optical performance of InP/InGaAs HPT is an attractive to the PIN Photodetector for use in long wavelength optical receivers.s.

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GaN 기반 LED구조의 p-GaN층 성장온도에 따른 광학적, 결정학적 특성 평가 (Optical and microstructural behaviors in the GaN-based LEDs structures with the p-GaN layers grown at different growth temperatures)

  • 공보현;김동찬;김영이;한원석;안철현;최미경;조형균;이주영;김홍승
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.144-144
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    • 2008
  • Blue light emitting diode structures consisting of the InGaN/GaN multiple quantum wells were grown by metalorganic chemical vapor deposition at different growth temperatures for the p-GaN contact layers and the influence of growth temperature on the emission and microstructural properties was investigated. The I-V and electroluminescence measurements showed that the sample with a p-GaN layer grown at $1084^{\circ}C$ had a lower electrical turn-on voltage and series resistance, andenhanced output power despite the low photoluminescence intensity. Transmission electron microscopy (TEM) revealed that the intense electro luminescence was due to the formation of a p-GaN layer with an even distribution of Mg dopants, which was confirmed by TEM image contrast and strain evaluations. These results suggest that the growth temperature should be optimized carefully to ensurethe homogeneous distribution of Mg as well as the total Mg contents in the growth of the p-type layer.

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수광영역의 식각을 통한 단일확산 공정의 고속 평판형 InP/InGaAs 10Gb/s 광 검출기의 신뢰성 (High-Speed, High-Reliability Planar-Structure InP/InGaAs Avalanche Photodiodes for 10Gb/s Optical Receivers with Recess Etching)

  • 정지훈;권용환;현경숙;윤일구
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 하계학술대회 논문집 Vol.3 No.2
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    • pp.1022-1025
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    • 2002
  • This paper presents the reliability of planar InP/InGaAs avalanche photodiodes (APD's) with recess etching, which is very crucial for the commercial 10-Gb/s optical receiver application. A versatile design for the planar InP/InGaAs APD's and bias-temperature tests to evaluate long-term reliability at temperature from 200 to $250^{\circ}C$. The reliability is examined by accelerated life tests by monitoring dark current and breakdown voltage. The lifetime of the APD's is estimated by a degradation activation energy. Based on the test results, it is concluded that the planar InP/InGaAs APD's with recess etching shows the sufficient reliability for practical 10-Gb/s optical receivers.

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InP HEMT의 2DEG계산 (2DEG Calculation in InP HEMT)

  • 황광철;안형근;한득영
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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    • pp.316-318
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    • 2003
  • 양자우물 구조를 사용한 HEMT(High Electron Mobility Transistor)는 고속 스위칭 소자와 초고주파 통신용 소자 및 센서에에 우수한 동작특성을 갖고 있다. 본 논문에서는 AlInAs/InP HEMT의 heterostructure를 파동방정식과 Poisson 방정식을 self-consistent 한 방법으로 해석하였다. 파동방정식으로 junction의 전자농도를 계산하고, Poisson 방정식을 해석하여 potential profile에 의한 전자 농도가 heterostructure에서 self-consistent가 되도록 연산하였다. 끝으로 AlInAs/InP 구조에서 positively ionized donor, valance band에서의 hole, conduction band의 free electron과 구조내의 2DEG를 AlGaAs/GaAs 및 AlGaAs/InGaAs/GaAs와 비교하였다.

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First-principle Study for AlxGa1-xP and Mn-doped AlGaP2 Electronic Properties

  • Kang, Byung-Sub;Song, Kie-Moon
    • Journal of Magnetics
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    • 제20권4호
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    • pp.331-335
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    • 2015
  • The ferromagnetic and electronic structure for the $Al_xGa_{1-x}P$ and Mn-doped $AlGaP_2$ was studied by using the self-consistent full-potential linear muffin-tin orbital method. The lattice parameters of un-doped $Al_xGa_{1-x}P$ (x = 0.25, 0.5, and 0.75) were optimized. The band-structure and the density of states of Mn-doped $AlGaP_2$ with or without the vacancy were investigated in detail. The P-3p states at the Fermi level dominate rather than the other states. Thus a strong interaction between the Mn-3d and P-3p states is formed. The ferromagnetic ordering of dopant Mn with high magnetic moment is induced due to the (Mn-3d)-(P-3p)-(Mn-3d) hybridization, which is attributed by the partially filled P-3p bands. The holes are mediated with keeping their 3d-characters, therefore the ferromagnetic state is stabilized by this double-exchange mechanism.

Simple Autocorrelation Measurement by Using a GaP Photoconductive Detector

  • Shin, Seong-Il;Lim, Yong-Sik
    • Journal of the Optical Society of Korea
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    • 제20권3호
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    • pp.435-440
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    • 2016
  • We developed a simple and real-time readout autocorrelator for several tens and sub-10fs pulses, based on the two photon absorption phenomena of a commercial GaP photodetector including a transimpedance amplifier. With a suitable gain adjustment, we demonstrated that the interferometric autocorrelation for sub-nJ pulses delivered as a high output voltage as to resolve all fringes in an autocorrelation trace with features of low noise and a low offset voltage. By fitting the measured quadratic power dependence of output voltages, we obtained the quantum efficiency of TPA for the GaP detector comparable with those of a GaAsP diode and an SHG with a thin BBO crystal. The autocorrelator of a TPA based GaP photodetector is highly suitable for sensitively measuring a few cycle pulses with a broad spectral distribution from 600 nm to 1100 nm.